NanoOptics Lab hosts first seminar about new research opportunities
Title: New Research Directions in the NanoOptics Lab
Presenter: Dr. Vildana Hodzic, NanoOptics Lab Director
Opportunities, challenges, and frontiers of nanoscale measurements using probe nano lab Ntegra Spectra will be presented. Ntegra Spectra combines the full power of scanning probe microscopy, confocal Raman and fluorescence microscopy and scanning near-field optical microscopy (SNOM) in one platform. It supports most of the existing AFM modes providing comprehensive information about physical properties of the sample with nanometer scale resolution: local stiffness, elasticity, conductivity, capacitance, magnetization, surface potential and work function, friction, piezoresponse etc. In addition to surface metrology, the AFM can be used to locally modify the sample. Simultaneously with AFM, confocal Fluorescence and Raman measurements provide information about sample chemical composition, crystal structure and its orientation, presence of impurities and defects, macromolecular conformation, and so on. Additionally, Rayleigh imaging and SNOM can be used to get local optical properties of the sample.
The ultimate goal of integrating AFM with Raman/fluorescence spectroscopy is to break the diffraction limit by using a special AFM probe and to reach resolutions of just a few tens of nanometers. This can be achieved in the Tip-Enhanced Raman (TERS) microscopy experiments. Examples of lateral resolution of Raman (TERS) maps less than 15 nm will be shown.