Faculty Directory

Education and Experience



Honors and Awards



Media Presentations and Interviews



Patents



Professional Service and Societies



Publications



Teaching and Advising

Competitive product development Product characterization and qualification Supply chain creation and management Prognostics and health management Product reliability, risk assessment and mitigation

Courses taught:

ENME 101                            Computer Engineering: F86

ENME 300                            Material Science: F83,

ENME 321                            Heat Transfer: F88, S93

ENME 360                            Vibrations: S84

ENME 404                            Engr. Design: F83

ENME 480                            Engr. Experimentation: F83, S84, F84, S85, F85, S86, F86, F87, S88, F88, S89, F89, S90, F90, S91, S92, F92, F94, S95

ENME 489                            Special Projects: S84, SU84, F84, S85, SU85, F85

ENME 489/808                    Product Reliability - Concepts, Processes, Tests, and Applications: S86, S88, S89, S90, S96, F97, S00, S02, S03, S05, S07, S08

ENME 601                            Microprocessors: S85, F85, S87

ENME 612                            Advanced Electronics Packaging: F91, S93, S94,

ENME 690                            Mechanical Fundamentals of Electronic Systems: F02, F03, F05

ENME 695                            Design for Reliability: S03, S06, S07, S09, S10, S11, S12, S13, S14, S15, S17, S18

ENME 737                            Prognostic & Health Management: F06, F07, F09, F10, F11, F12, F13, F14, F16, F17

ENME 808A                         Batteries- Operation, Modeling, and Reliability: F18

ENME 808X                         Extreme Temperature Electronics: F92, F96

ENME 808X                         Plastic Encapsulated Microelectronics: S95, S97, F98, F02

ENME 808X                         Materials in Electronics: F99

Advising: Other than Research

1.   Established co-op program at the University for local UMD high school students to gain direct experience in engineering disciplines involved in the electro-technology industry. Generally, 2 to 4 high school students participate during the summer.

2.   From 1993-1996, advised undergraduate scholars in cooperation with the University of Maryland Research Experiences for Undergraduates office and the office of Graduate Minority Affairs. Students come from Lehigh, Cornell, South Carolina State University, the University of Maryland, and other schools, and represent electrical, chemical, mechanical, and industrial engineering disciplines. The eight-week program included an educational introduction to electronic packaging and individual research projects, with hands-on experience in experimental and analytical techniques. Since 1996, this has been expanded to include foreign visitors as well.

3.   Advisor: Int’l Society of Hybrid Microelectronic (1989-1999)

4.   Advisor: Pi Tau Sigma: (1988)

Other work

Reviewer: Division of Research VPR: W.M. Keck Foundation Research Program Proposals: June 2018

Thesis Committees

Served on the PhD Dissertation Examination Committee for Ms. Areen Abdallah Allataifeh, United Arab Emirates University, Feb. 2019.

Served as reviewer for concept papers on behalf of Division of Research at WM Keck Foundation competition, June 2018

Served on George K. Winstead (Co-Advisor along with Dr. David C. Jenn) in MS Thesis, Naval Postgraduate School, Monterey, California, USA, Sep. 2017.

Served as external examiner for Ph.D student, Mohamed Halick Mohamed Sathik of Nanyang Technological University (NTU), Singapore in Jun 2017

Opponent of Veli Lumme on thesis committee, Tampere University of Technology, Finland, Dec. 2012.

Served on Prof. Lauri Sydanheimo’s student thesis committee, Dept. of Electronics, Tampere University of Technology,      Finland, Nov. 2010.

Served on Mr. Chandradip Patel qualifying exam committee, Oct 2010.

Served on Suzanne Zhang (co-advisor at Beihang University, China), Sep. 2010.

Served on 48 MS thesis and 18 Ph.D. dissertation advisory committees in the Mechanical Engineering Department

Served on 13 UMD Ph.D. dissertation advisory committees outside of Mechanical Engineering

Served on Ph.D. thesis committees at Johns Hopkins University and Polytechnic University in Hong Kong

Books Authored/Edited

1. Hazelwood, D. A., Sanchez, M. C., Anand, D. K., Pecht, M., The True Cost of Waste: Current Issues in Electronic Waste, CALCE EPSC Press, College Park, MD, 2018.
2. Kapur, K., Pecht, M., Reliability Engineering (in Chinese), National Defense Industry Press, 2018.
3. Pecht, M., and M. Kang, Prognostics and Health Management of Electronics: Fundamentals, Machine Learning, and the Internet of Things, Wiley, New York, NY, 2018.
4. Varde, P.V., and M. Pecht, Risk-Based Engineering, Springer Singapore, 2018.
5. Anand, D., D. Hazelwood, M. Pecht, and M. Kapilashrami, Engineering for Social Change: Engineering Is Not Just Engineering, CALCE EPSC Press, University of Maryland, College Park, MD, 2016.
6. Chung, H. S., H. Wang, F. Blaabjerg, and M. Pecht, Reliability of Power Electronic Converter Systems, The Institution of Engineering and Technology, London, United Kingdom, 2015. 
7. Fries, A., W. P. Cherry, R. G. Easterling, E. A. Elsayed, A. V. Huzurbazar, P. A. Jacobs, W. Q. Meeker JR, G. Nagappan, M. Pecht, A. Sen, and S. V. Wiel, Reliability Growth: Enhancing Defense System Reliability, The National Academies Press, Washington, DC, 2015.
8. Kapur, K., and M. Pecht, Reliability Engineering, John Wiley, Hoboken, NJ, 2014.
9. Dai, J., M. Ohadi, D. Das, and M. Pecht, Optimum Cooling of Data Centers: Application of Risk Assessment & Mitigation Techniques, Springer Science, 2013.
10. Chauhan, P., A. Choubey, Z. Zhong, and M. Pecht, Copper Wire Bonding, Springer-Verlag, New York, NY, 2013.
11. Pecht, M., R. Kaczmarek, X. Song, D. Hazelwood, R. Kavetsky, and D. Anand, Rare Earth Materials: Insights and Concerns, CALCE EPSC Press, University of Maryland, College Park, MD, 2012.
12. Bartels, B., U. Ermel, P. Sandborn, and M. Pecht, Strategies to the Prediction, Mitigation, and Management of Product Obsolescence, John Wiley, Hoboken, NJ, 2012.
13. Pecht, M., K. C. Kapur, R. Kang, and S. Zhang, Foundations of Reliability Engineering (in Chinese), Publishing House of Electronics Industry, China, 2011.
14. Short, J. M., R. A. Kavetsky, M. Pecht, and D. K. Anand, Energetics Science & Technology in China, CALCE EPSC Press, University of Maryland, College Park, MD, 2010.
15. Pecht, M. and R. Kang, Diagnostics, Prognostics and System’s Health Management (in Chinese), City Univ. of Hong Kong, 2010.
16. Pecht, M., China’s Electronics Industry – The Definitive Guide for Companies and Policy Makers with Interests in China, William Andrew Publishing, Norwich, NY, 2006; updated in 2010 with Len Zuga as co-author.
17. Ardebili, H., Zhang, J., Pecht, M.G., “Encapsulation Technologies for Electronic Applications”, Materials and Processes for Electronic Applications Series, California, USA, 2009
18. Ardebili, H. and M. Pecht, Encapsulation Technologies for Electronic Applications, Materials and Processes for Electronic Applications Series, Elsevier Press, New York, NY, 2009.
19. Pecht, M., Product Reliability, Maintainability, and Supportability Handbook, 2^nd ed., CRC Press, Boca Raton, FL, 2009; 1^st ed., 1995.
20. Pecht, M., Prognostics and Health Management of Electronics, John Wiley, New York, NY, 2008.
21. Ganesan S. and M. Pecht, Lead-Free Electronics, John Wiley, New York, NY, 2006.
22. Das, D., M. Pecht, and N. Pendse, Rating and Uprating of Electronic Products, CALCE EPSC Press, University of Maryland, College Park, MD, 2004.
23. Pecht, M., Parts Selection and Management, John Wiley, New York, NY, 2004.
24. Liu, W. and M. Pecht, IC Component Sockets, John Wiley, Hoboken, NJ, 2004.
25. Lee, S. B., M. Lee, and M. Pecht, Korean Electronics Industry, CALCE EPSC Press, University of Maryland, College Park, MD, 2004; update of Pecht M., J. Bernstein, M. Peckerar, and D. Searls, The Korean Electronics Industry, CRC Press, Boca Raton, FL, 1997.
26. Castelli, C., C. Nash, C. Ditlow, and M. Pecht, Sudden Acceleration – The Myth of Driver Error, CALCE Press, University of Maryland, College Park, MD, 2003.
27. Pecht, M., E. Bumiller, J. Pecht, and D. Douthit, Contamination of Electronic Assemblies, CRC Press, Boca Raton, FL, 2002.
28. Pecht, M., R. Solomon, P. Sandborn, C. Wilkinson, and D. Das, Life Cycle Forecasting, Mitigation Assessment and Obsolescence Strategies, CALCE EPSC Press, University of Maryland, College Park, MD, 2002.
29. Sharma, R., S. Parthasarathy, D. Bansal, and M. Pecht, Indian Electronics Industry, CALCE EPSC Press, University of Maryland, College Park, MD, 2002.
30. Nakayama, W., W. Boulton, and M. Pecht, The Japanese Electronics Industry, CRC Press, Boca Raton, FL, 1999. 
31. Pecht, M., R. Radojcic, and G. Rao, Guidebook for Managing Silicon Chip Reliability, CRC Press, Boca Raton, FL, 1999.
32. Pecht, M., R. Agarwal, P. McCluskey, T. Dishongh, S. Javadpour, and R. Mahajan, Electronic Packaging Materials and their Properties, CRC Press, Boca Raton, FL, 1999.
33. Lall, P., Pecht, M., and E. Hakim, The Influence of Temperature on Microelectronic Device Reliability, CRC Press, Boca Raton, FL, 1997.
34. Lee, C. and M. Pecht, The Taiwan Electronics Industry, CRC Press, Boca Raton, FL, 1997.
35. Pecht, M., Beane, D., and A. Shukla, The Singapore and Malaysia’s Electronics Industries, CRC Press, Boca Raton, FL, 1997.
36. Hannemann, R., Kraus, A., and M. Pecht, Semiconductor Packaging – A Multidisciplinary Approach, John Wiley, New York, NY, 1997.
37. Wong, Y. and M. Pecht, Advanced Routing of Electronic Modules, CRC Press, Boca Raton, FL, 1995.
38. Pecht, J. and M. Pecht, Long-term Non-operating Reliability of Electronic Products, CRC Press, Boca Raton, FL, 1995.
39. Pecht, M., Nguyen, L., and E. Hakim, Plastic Encapsulated Microelectronics: Materials, Processes, Quality, Reliability, and Applications, John Wiley, New York, NY, 1995.
40. Pecht M., Integrated Circuit, Hybrid and Multichip Module Package Design Guidelines, John Wiley, New York, NY, 1994.
41. Pecht, M., Dasgupta, A., Evans, J., and J. Evans, Quality Conformance and Qualification of Electronic Packages, John Wiley, New York, NY, 1994.
42. Pecht, M., Placement and Routing of Electronic Modules, Marcel Dekker, New York, NY, 1993.
43. Pecht, M., Soldering Processes and Equipment, John Wiley, New York, NY, 1993.
44. Pecht, M., Handbook of Electronic Package Design, Marcel Dekker, New York, NY, 1991.

Chapters in Books and Handbooks

1. Campbell, P., Pecht, M., “Intellectual Property Protections in China,” in Intellectual Property Law of China-New Exploration of Intellectual Property with Chinese Characteristics, Xiahong Chen (Ed.), Encyclopedia of China Publishing House, China, 2018.
2. Su, Y., X. Song, T. Syrus, P. S. Chauhan, and M. Pecht, “Plastic Packaging of Microelectronic Devices,” in Reference Module in Materials Science and Materials Engineering, S. Hashmi (Ed.), Elsevier, Oxford, UK, 2016.
3. Yan, S., X. Song, J. A. Scalise, and M. G. Pecht, “Electronic Packages: Quality and Reliability,” in Reference Module in Materials Science and Materials Engineering, S. Hashmi (Ed.), Elsevier, Oxford, UK, 2016.
4. Hendricks, C., E. George, M. Osterman, and M. Pecht, “Physics-of-failure (PoF) Methodology for Electronics Reliability,” in Reliability Characterisation of Electrical and Electronic Systems,  J. Swingler (Ed.), Woodhead Publishing, Cambridge, UK, pp. 27–42, 2015.
5. Dai, J., M. M. Ohadi, and M. Pecht, “Energy Efficiency and Reliability Risk Mitigation of Data Centers through Prognostics and Health Management” in Cooling of Microelectronic and Nanoelectronic Equipment, M. Iyengar, K. Geisler, and B. Sammakia (Eds.), World Scientific, Singapore, pp. 357–375, 2014.
6. Campbell, P., and M. Pecht, “The Emperor’s New Clothes: Intellectual Property Protections in China,” in Foreign Scholars Discuss Chinese Law (Series): Intellectual Property Law China, X. Chen (Ed.), Encyclopedia of China Publishing House, pp. 236–272, 2014.
7. Cheng, S., and M. Pecht, “Applications of Sensor Systems in Prognostics and Health Management,” Chapter 16 in Novel Advances in Microsystems Technologies and Their Applications, L. Francis and K. Iniewski (Eds.), CRC Press, Boca Raton, FL, pp. 377–392, 2014.
8. Haddad, G., P. Sandborn, and M. Pecht, “Using Real Options to Valuate Decisions for Systems with Prognostic Capabalities,” Chapter 3 in Integrated Vehicle Health Management: Business Case Theory and Practice, I. Jennions (Ed.), SAE International, Warrendale, PA, pp. 23–38, 2013.
9. Mathew, S., and M. Pecht, “IVHM System Design,” Chapter 9 in Integrated Vehicle Health Management: The Technology, I. Jennions (Ed.), SAE International, Warrendale, PA,  pp. 157–176, 2013.
10. Foote, P., C. Dibsdale, K. Jackson, R. Kumar, S. Raveendran, M. Azarian, and M. Pecht, “Prognostics and Health Management for Wind Turbines,” Chapter 10 in Integrated Vehicle Health Management: The Technology, I. Jennions (Ed.), SAE International, Warrendale, PA, pp. 177–233, 2013.
11. Pecht, M., and M.-H. Chang, “Failure Mechanisms and Reliability Issues in LEDs,” Chapter 3 in Solid State Lighting Reliability: Components to Systems, Springer Science, pp. 43–110, 2013.
12. Pecht, M., “Prognostics and Health Management,” Chapter 14 in Solid State Lighting Reliability: Components to Systems, Springer Science, pp. 373–394, 2013.
13. Pecht, M., D. Das, and M.-H. Chang, “Introduction to LED Thermal Management and Reliability,” Chapter 1 in Thermal Management for LED Applications, Springer Science + Business Media, pp. 3–14, 2013.
14. Cheng, S., and M. Pecht, “Applications of Sensor Systems in Prognostics and Health Management,” Chapter 17 in Novel Advances in Microsystems Technologies and their Applications, L. Francis and K. Iniewski (Eds.), Taylor & Francis Books, pp. 397–412, 2013.
15. Sood, B., and M. Pecht, “Printed Circuit Board Laminates,” in Encyclopedia of Composites, L. Nicolais and A. Borzacchiello (Eds.), John Wiley, pp. 2391–2401, 2012.
16. Yang, D., Y. C. Chan, and M. Pecht, “Electromigration in Flip-chip Solder Joints,” in Electromigration in Thin Films and Electronic Devices, C.-U. Kim (Ed.), Woodhead Publishing, 2012.
17. Pecht, M., in Diagnostics and Prognostics of Engineering Systems: Methods and Techniques, IGI Global, 2012.
18. Haddad, G., P. A. Sandborn, T. Jazouli, M. Pecht, B. Foucher, and V. Rouet, “Guaranteeing High Availability of Wind Turbines,” in Advances in Safety, Reliability and Risk Management, G. Berenguer and G. Soares (Eds.), CRC Press, pp. 461–469, 2012.
19. Rouet V., A. Delye, N. Vichare, M. Pecht, and B. Foucher, “Embedded Remaining Life Prognostics and Diagnostics of Electronics,” Smart Systems Integration and Reliability, Honorary Vol., B. Michel and K. Lang (Eds.), Goldenbogen, pp. 606–613, 2010.
20. Stellrecht, E., B. T. Han, and M. Pecht, “Characterization of Hygroscopic Deformations by Moire Interferometry,” Chapter 5 in Moisture Sensitivity of Plastic Packages of IC Devices, part of the series of Micro- and Opto-Electronic Materials, Structures, and Systems, X. J. Fan and E. Suhir (Eds.), Springer Science + Business Media, New York, NY, pp. 113–130, 2010.
21. Pecht, M., “Reliability, Maintainability, and Availability,” Chapter 8 in Handbook of Systems Engineering and Management, 2^nd ed., John Wiley, pp. 361–395, 2009.
22. Rouet, V., A. Delye, N. Vichare, M. Pecht, and B. Foucher, “Embedded Remaining Life Prognostics and Diagnostics of Electronics,” in Micro Nano Reliability Handbook, 2008.
23. Vichare, N., B. Tuchband, and M. Pecht, “Prognostic Health Management,” Chapter 67 in Handbook of Performability Engineering, Springer, pp. 1107–1122, 2008.
24. Das, D., and M. Pecht, “Electronic Hardware Reliability,” Chapter 20 in RF and Microwave Handbook, RF and Microwave Applications and Systems, 2^nd ed., CRC Press, Boca Raton, FL, pp. 20-1–20-24, 2008.
25. Wang, W., Y. C. Chan, and M. Pecht, “Anisotropic Conductive Adhesives for Flip-chip Interconnections,” in Electrically Conductive Adhesives, R. Gomatam and K. L. Mittal (Eds.), VSP, Leiden, The Netherlands, pp. 57–78, 2008.
26. Pecht, M., “Prognostics and Health Management of Electronics,” Chapter 150 in Encyclopedia of Structural Health Monitoring, Other Applications, C. Boller, F. K. Chang, and Y. Fujino (Eds.), John Wiley, 2008.
27. Pecht, M., and Y. C. Chan, “Health Monitoring, Diagnostics, and Prognostics of Avionic Systems,” Encyclopedia of Structural Health Monitoring, Aerospace Applications, C. Boller, F. K. Chang, and Y. Fujino (Eds.), John Wiley, 2008.
28. Pecht, M., “Lead-free Legislations, Exemptions, and Compliance,” Chapter 4 in Green Manufacturing Book Series: RoHS & WEEE - Status, Compliance, Issues and Implications, Y. C. Chan (Ed.), pp. 65–105, Oct. 2006.
29. Middendorf, A., W. Grimm, O. Neb, N. Vichare, and M. Pecht, “Reliability of Electronic Systems as an Indispensable Condition for Sustainable Development,” in  The World of Electronic Packaging and System Integration, ddp goldenbogen, Dresden, Germany, pp. 367–374, 2004.
30. Liu C., M. Pecht, and Scalise J. A., “Electronic Packages: Quality and Reliability,” in Encyclopedia of Materials: Science and Technology, Elsevier, pp. 2644–2654, 2001.
31. Syrus T., and M. Pecht, “Plastic Packaging of Microelectronic Devices,” in Encyclopedia of Materials: Science and Technology, Elsevier, pp. 5610–5616, 2001.
32. Pecht, M., P. McCluskey, and J. Y. Evans, “Failures in Electronic Assemblies and Devices,” Chapter 8 in Product Integrity and Reliability in Design, Evans, J. W., and J. Y. Evans (Eds.), Springer-Verlag London Limited, pp. 204–232, 2001.
33. Pecht, M., and I. Bordelon, “Electronic Hardware Reliability,” in Electronic Systems Maintenance Handbook, J. C. Whitaker (Ed.), CRC Press, Boca Raton, FL, pp. 2.1–2.12, Dec. 2001.
34. Pecht, M., and P. McCluskey, “Failure Analysis of Assemblies and Devices,” Chapter 13 in Product Integrity and Reliability in Design, J. W. Evans, and J. Y. Evans (Eds.), Springer-Verlag London, pp. 338–369, 2001.
35. Vichare, N., P. Zhao, D. Das, and M. Pecht, “Electronic Hardware Reliability,” Chapter 4 in Avionics: Elements, Software and Functions, Taylor & Francis, CRC, Routledge, FL, pp. 4-1–4-22, 2006; update of Ramakrishnan, A., T. Syrus, and M. Pecht, “Electronic Hardware Reliability,” in Avionics Handbook, CRC Press, Boca Raton, FL, pp. 22.1–22.21, Dec. 2000.
36. Ramakrishnan, A., T. Syrus, and M. Pecht, “Electronic Hardware Reliability,” in RF and Microwave Handbook, J. M. Golio (Ed.), CRC Press, Boca Raton, FL, pp. 3.102–3.121, Dec. 2000.
37. M. Pecht, “Reliability, Maintainability, and Availability,” in Handbook of Systems Engineering and Management, John Wiley, New York, NY, pp. 303–326, April 1999.
38. Pecht, M., and A. Prabhu, “Packaging (Electronic Materials),” in The Concise Encyclopedia of Chemical Technology, 4^th ed., Vol. 17, Wiley Interscience, New York, NY, pp. 1440–1441, 1999.
39. Pecht et al. “Engineering Design,” in The CRC Handbook of Mechanical Engineering, F. Kreith (Ed.), CRC Press, Boca Raton, FL, pp. 11.22–11.36, 1997.
40. Pecht, M., and L. Nguyen, “Plastic Packaging,” Vol. 2, in Microelectronics Packaging Handbook, Semiconductor Packaging, 2nd ed., R. Tummala, E. Rymaszewski, and A. Klopfenstein (Eds.), Chapman & Hall, New York, NY, pp. 394–508, 1997.
41. M. Pecht, “Plastic Encapsulated Microcircuits,” in Reliability, Maintainability, and Supportability Guidebook - Third Edition SAE Int’l RMS Committee (G-11), Society of Automotive Engineers, 1997.
42. Pecht, M., P. Lall, and E. Hakim, “Temperature as a Reliability Factor,” in Thermal Management of Electronic System II, E. Beyne, C. Lasance, and J. Berghmans (Eds.), Kluwer Academic Publishers, pp. 1–20, 1997.
43. Pecht, M., and I. Bordelon, “Electronic Hardware Reliability,” Chapter 137, Section XXI in The Electronics Handbook, J. C. Whitaker (Ed.), CRC Press, Boca Raton, FL, pp. 2160–2170, 1996.
44. Pecht, M., D. Burkus, and S. Bhagath, “Electronics Assembly,” Chapter 22 in Handbook of Manufacturing Engineering, Marcel Dekker, New York, NY, pp. 1027–1092, 1996.
45. Pecht, M., and A. Prabhu, “Electronic Materials,” in Encyclopedia of Chemical Technology, 4th ed., Vol. 17, pp. 1024–1048, J. Kroschwitz (Ed.), John Wiley, New York, NY, 1995.
46. Pecht, M., and P. Lall, “Temperature Dependencies on Electromigration,” Chapter 3 in Electromigration and Electronic Device Degradation, A. Christou (Ed.), Wiley Interscience, New York, NY, pp. 79–104, 1994.
47. Pecht, M., and P. Lall, “Mechanics of Wirebond Interconnects,” Chapter 22 in Thermal Stress and Strain in Microelectronics Packaging, J. Lau (Ed.), Van Nostrand Reinhold, New York, NY, pp. 729–802, 1993.
48. Pecht, M., P. Lall, G. Ballou, C. Sankaran, and N. Angelopoulos, “Passive Components,” in The Electrical Engineering Handbook, 2nd ed., R. Dorf (Ed.), CRC Press, Boca Raton, FL, pp. 5–44, 1997.  Update of Pecht, M. and P. Lall, “Resistors,” Section 1.1, in The Electrical Engineering Handbook, R. Dorf (Ed.), CRC Press, Boca Raton, FL, pp. 5–15, 1993.
49. Pecht, M. and P. Lall, “Resistors,” Section 1.1, pp. 5–15, in The Electrical Engineering Handbook, R. Dorf (Ed.), CRC Press, Boca Raton, FL, 1993.
50. Shan, X., and M. Pecht, “Corrosion in Microelectronics Packages,” Chapter 23 in Thermal Stress and Strain in Microelectronics Packaging, J. Lau (Ed.), Van Nostrand Reinhold, New York, NY, pp. 803–849, 1993.
51. Pecht, M., P. Lall, and E. Hakim, “Temperature Dependence of Integrated Circuit Failure Mechanisms,” Chapter 2 in Advances in Thermal Modeling III, A. Bar-Cohen and A. Kraus (Eds.), IEEE Press, New York, NY, pp. 61–152, 1992.
52. Pecht, M., and P. Lall, “General Reliability Considerations as Applied to MMICs,” Chapter 2 in Reliability of Gallium Arsenide MMICs, A. Christou (Ed.), John Wiley, New York, NY, pp. 41–58, 1992.
53. Christou, A., A. Dasgupta, M. Pecht, and D. Barker, “Reliability Considerations for MMIC Packages,” Chapter 11 in Reliability of Gallium Arsenide MMICs, A. Christou (Ed.), John Wiley, New York, NY, pp. 411–434, 1992.

Articles

1. Wu, Z., S. Yu, X. Zhu, Y. Ji, and M. Pecht, “A Weighted Deep Domain Adaptation Method for Industrial Fault Prognostics According to Prior Distribution of Complex Working Conditions,” IEEE Access, Vol. 7, No. 1, pp. 139802–139814, Dec 2019. DOI: https://doi.org/10.1109/ACCESS.2019.2943076
2. Li, J., L. Wang, C. Lyu, D. Wang, and M. Pecht, “Parameter Updating Method of a Simplified First Principles-Thermal Coupling Model for Lithium-ion Batteries,” Applied Energy, Vol. 256, 113924, Dec 2019. DOI: https://doi.org/10.1016/j.apenergy.2019.113924
3. Zhao, M., S. Zhong, X. Fu, B. Tang, and M. Pecht, “Deep Residual Shrinkage Networks for Fault Diagnosis,” IEEE Transactions on Industrial Informatics, Sept 2019. DOI: https://doi.org/10.1109/TII.2019.2943898
4. H. Liu, Y. Wang, F. Li, X. Wang, C. Liu, and M. G. Pecht, “Perceptual Vibration Hashing by Sub-band Coding: An Edge Computing Method for Condition Monitoring,” IEEE Access, Vol. 7, No. 1, pp. 129644–129658, Dec 2019. DOI: https://doi.org/10.1109/ACCESS.2019.2940381
5. Zhang, Y., R. Xiong, H. He, X. Qu, and M. Pecht. “State of Charge-dependent Aging Mechanisms in Graphite/Li(NiCoAl)O₂ Cells: Capacity Loss Modeling and Remaining Useful Life Prediction,” Applied Energy, Vol. 255, 113818, Dec 2019. DOI: https://doi.org/10.1016/j.apenergy.2019.113818
6. Diao, W., M. Pecht, and T. Liu. “Management of Imbalances in Parallel-connected Lithium-ion Battery Packs,” Journal of Energy Storage, Vol. 24, 100781, May 2019. DOI: https://doi.org/10.1016/j.est.2019.100781
7. Dong, T., T. Liu, and M. Pecht. “A Compliant Electrode Developed by Plasticized Polyvinyl Chloride Filled with Multi-Walled Carbon Nanotubes for Sensing and Actuating,” Sensors & Actuators: A. Physical, Vol. 296, pp. 383–391, Sept. 2019.
8. Huang, C.-M., J. A. Romero, M. Osterman, D. Das, and M. Pecht. “Life Cycle Trends of Electronic Materials, Processes and Components,” Microelectronics Reliability, Vol. 99, pp. 272–276, Aug 2019.
9. Artificial Intelligence Roundtable Discussion and Memorandum of Understanding (MOU) Signing Ceremony. Held at Lawrence Livermore National Laboratory with the U.S. Department of Energy and UCSF. Aug. 26, 2019.
10. Diao, W., S. Saxena, B. Han, and M. Pecht. “Algorithm to Determine Knee Point on Capacity Fade Curves of Lithium ion Batteries,” Energies, Vol. 12, pp. 2910–2919, July 2019.
11. Patel, N., R. G. Utter, D. Das, and M. Pecht. “Surface Degradation of Strontium-based Perovskite Electrodes of Solid Oxide Fuel Cells,” Journal of Power Sources, Vol. 438, 227040, Oct. 2019.
12. Woo, S., M. Pecht, and D. L. O’Neal. “Reliability Design and Case Study of the Domestic Compressor Subjected to Repetitive Internal Stresses,” Reliability Engineering and System Safety, Vol. 193, 106604, Jan. 2020. DOI: https://doi.org/10.1016/j.ress.2019.106604
13. Lyu, C., J. Li, L. Zhang, L. Wang, D. Wang, and M. Pecht. “State of Charge Estimation Based on a Thermal Coupling Simplified First-Principles Model for Lithium-ion Batteries,” Journal of Energy Storage, Vol. 25, Oct. 2019. DOI: https://doi.org/10.1016/j.est.2019.100838.
14. Kaushik, L., M. H. Azarian, and M. Pecht. “Effect of Different Lubricant Films on Contact Resistance of Stationary Separable Gold-Plated Electrical Contacts,” Journal of Materials Science: Materials in Electronics, July 2019. DOI: https://doi.org/10.1007/s10854-019-01806-y
15. Su, Y., X. R. Liang, H. Wang, J. J. Wang, and M. Pecht. “A Maintenance and Troubleshooting Method Based on Integrated Information and System Principles,” IEEE Access, Vol. 7, pp. 70513–70524, May 2019.
16. Wu, Y., Y. Wang, W. K. C. Yung, and M. Pecht. “Ultrasonic Health Monitoring of Lithium-Ion Batteries,” Electronics, Vol. 8, pp. 751–767, 2019. DOI: https://doi.org/10.3390/electronics8070751 Published as part of the Special Issue Advanced Battery Technologies: New Applications and Management Systems
17. Diao, W., S. Saxena, and M. Pecht. “Accelerated cycle life testing and capacity degradation modeling of LiCoO₂-graphite cells,” Journal of Power Sources, Vol. 435, 226830, Sept 2019. DOI: https://doi.org/10.1016/j.jpowsour.2019.226830
18. Kohani, M., D. Pommerenke, L. Kinslow, A. Bhandare, L. Guan, J. Zhou, C. Spencer, and M. G. Pecht. “Electrostatic Charging of a Human Body Caused by Activities and Material Combinations in Hospitals,” Transactions on Electromagnetic Compatibility, May 2019. DOI: https://doi.org/10.1109/TEMC.2019.2914114
19. Sun, Y., L. Kong, H. A. Khan, and M. Pecht. “Li-ion Battery Reliability–A Case Study of the Apple iPhone,” IEEE Access, Vol. 7, pp. 71131–71141, May 2019. DOI: https://doi.org/10.1109/ACCESS.2019.2918401
20. Su, Y., X. Liang, C. Gu, V. Khemani, and M. Pecht. “A Multivalued Test and Diagnostic Strategy Optimization Method for Aircraft System Fault Diagnosis,” IEEE International Conference on Prognostics and Health Management (ICPHM), Burlingame, CA, USA, June 17–19, 2019.
21. Kong, L., X. Hu, G. Gui, Y. Su and M. Pecht. “Computed Tomography Analysis of Li-ion Battery Case Ruptures,” 1^st International Symposium on Lithium Battery Fire Safety, Heifei, China, July 18–20, 2019.
22. Lee, J., D. Kwon, and M. G. Pecht. “Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management,” IEEE Transactions on Industrial Electronics, Vol. 66, No. 9, pp. 7310–7315, Sept 2019.
23. Dinmohammadi, F., D. Flynn, C. Bailey, M. Pecht, C. Yin, P. Rajaguru, and V. Robu. “Predicting Damage and Life Expectancy of Subsea Power Cables in Offshore Renewable Energy Applications,” IEEE Access, Vol. 7, pp. 54658–54669, May 2019.
24. Zhao, M., M. Kang, B. Tang, and M. Pecht. “Multiple Wavelet Coefficients Fusion in Deep Residual Networks for Fault Diagnosis,” IEEE Transactions on Industrial Electronics, Vol. 66, No. 6, pp. 4696–4706, June 2019.
25. Saxena, S., Y. Xing, D. Kwon, and M. Pecht. “Accelerated Degradation Model for C-rate loading of Lithium-ion Batteries,” International Journal of Electrical Power & Energy Systems, Vol. 107, pp. 438–445, May 2019.
26. Yao, X.-Y., S. Saxena, L. Su, and M. Pecht. “The Explosive Nature of Tab Burrs in Li-ion Batteries,” IEEE Access, Vol. 7, pp. 45978–45982, Apr 3, 2019.
27. Xiong, R., Y. Zhang, J. Wang, H. He, S. Peng, M. Pecht. “Lithium-ion battery health prognosis based on a real battery management system used in electric vehicles.” IEEE Transactions on Vehicular Technology. Vol. 68, No. 5, pp. 4110–4121, 2019, May 2019. DOI: https://doi.org/10.1109/TVT.2018.2864688
28. Al-Zoghbi, L., D. Das, P. Rundle, and M. Pecht. “Breaking the Trust: How Companies Are Failing Their Customers,” IEEE Access, Vol. 7, pp. 52522–52531, Apr 2019.
29. Yu, Q., R. Xiong, C. Li, and M. Pecht. “Water-resistant Smartphone Technologies,” IEEE Access, Vol. 7, pp. 42757–42773, March 19, 2019.
30. Yao, X.-Y., and M. Pecht. “Effect of Metal Foams on the Dynamic Response Time of a Magnetorheological Damper,” International Journal of Applied Electromagnetic Mechanics, March 2019. DOI: https://doi.org/10.3233/JAE-190022
31. Wenliao, D., M. Kang, and M. Pecht. “Fault Diagnosis Using Adaptive Multifractal Detrended Fluctuation Analysis.” IEEE Transactions on Industrial Electronics, Mar 2019. DOI: https://doi.org/10.1109/TIE.2019.2892667
32. Xiong, R., Y. Zhang, H. He, and M. Pecht. “Validation and Verification of a Hybrid Method for Remaining Useful Life Prediction of Lithium-ion Batteries,” Journal of Cleaner Production, Vol. 212, pp. 240–249, Mar 2019.
33. Ning, Y., M. Azarian, and M. Pecht. “Development of a Microvia Fatigue Life Model Using a Response Surface Method,” IEEE Transactions on Device and Materials Reliability, Vol.  19, No. 1, pp. 176–188, Mar 2019.
34. Sood, B., J. Shue, J. Leitner, K. Daniluk, and L. Sindjui. “A Study on Effects of Copper Wrap Specifications on Printed Circuit Board Reliability.” IEEE Transactions on Reliability. Vol. 68, No. 1, pp. 248–266, Mar 2019.
35. Yao, X.-Y., M. Pecht. “Tab Design and Failures in Cylindrical Li-ion Batteries,” IEEE Access, Vol. 7, pp. 24082–24095, Feb 2019.
36. Valentine, N., M. Azarian, and M. Pecht. “Metallized Film Capacitors Used for EMI Filtering: A Reliability Review,” Microelectronics Reliability, Vol. 92, pp. 123–135, Jan 2019.
37. Elburn, E., B. Sood, D. Das, M. Pecht. “Utilization of Data and Models for COTS Part Reliability,” 2019 Annual Reliability and Maintainability Symposium (RAMS) Assessment, 28–31 Jan 2019.
38. Zhang, Y., W. Shangguan, B. Cai, H. Wang, and M. Pecht. “Methods for Fault Diagnosis of High-Speed Railways: A Review,” Journal of Risk and Reliability, Jan 2019. DOI: https://doi.org/10.1177/1748006X18823932
39. Jia, Z., Z. Liu, C. Vong, and M. Pecht. “A Rotating Machinery Fault Diagnosis Method Based on Feature Learning of Thermal Images,” IEEE Access, Vol. 7, pp. 12348–12359, Jan 2019.
40. Su, L., X. Yu, K. Li, X. Yao, and M. Pecht. “Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound,” IEEE Access, Vol. 7, pp. 11515–11525, Jan 2019.
41. Dalvand, S., M. Kang, F. Dalvand, and M. Pecht. “Detection of Generalized-Roughness and Single-Point Bearing Faults Using Linear Prediction-Based Current Noise Cancellation,” IEEE Transactions on Industrial Electronics, Vol. 65, No. 12, pp. 9728–9738, Dec 2018.
42. Patel, N., S. Bishop, R. Utter, D. Das, and M. Pecht. “Failure Modes, Mechanisms, Effects, and Criticality Analysis of Ceramic Anodes of Solid Oxide Fuel Cells.” Electronics. Vol. 7, No. 11, pp. 323-339, Nov 2018.
43. Sun, Y., S. Saxena, and M. Pecht. “Derating Guidelines for Lithium-ion Batteries,” Energies, Vol. 11, No. 12, pp. 3295–3314, Dec 2018.
44. Wang, K., H. Guo, A. Xu, N. Jameson, B. Yan, and M. Pecht. “Creating Self-aware Low-Voltage Electromagnetic Coils for Incipient Insulation Degradation Monitoring for Smart Manufacturing,” IEEE Access, Vol. 6, pp. 69860–69868, Nov 2018.
45. Zhao, J., Z. Sun, M. Pecht, and S. Zhou. “Analysis and Experiments on Transmission Characteristics of LCCL Mobile Wireless Power Transfer System,” IEICE Electronics Express, Vol. 15, No. 23, p. 20180964, Nov 2018.
46. Diao, W., Y. Xing, S. Saxena, and M. Pecht. “Evaluation of Present Accelerated Temperature Testing and Modeling of Batteries.” Applied Sciences. Vol. 8, No. 10, pp. 1786–1796, Oct 2018.
47. Kohani, M., A. Bhandare, L. Guan, D. Pommerenke, and M. Pecht. “Evaluating Characteristics of Electrostatic Discharge (ESD) Events in Wearable Medical Devices:  Comparison with the IEC 61000-4-2 Standard,” IEEE Transactions on Electromagnetic Compatibility, Vol. 60, No. 5, pp. 1304–1312, Oct 2018.
48. Du, X., Z. Yang, C. Chen, X. Li, and M. Pecht. “Reliability Analysis of Repairable Systems Based on a Two-Segment Bathtub-Shaped Failure Intensity Function,” IEEE Access, Vol. 6, pp. 52374–52384, Sept 2018.
49. Wu, L., M. Kang, J. Tian, J. Gao, and M. Pecht. “Unsupervised Locality-Preserving Robust Latent Low-Rank Recovery-Based Subspace Clustering for Fault Diagnosis,” IEEE Access, Vol. 6, pp. 52345–52354, Sept 2018.
50. Shu, L., M. Mukherjee, M. Pecht, N. Crespi, and S. N. Han. “Challenges and Research Issues of Data Management in IoT for Large-Scale Petrochemical Plants,” IEEE Systems Journal, Vol. 12, No. 3, pp. 2509–2523, Sept 2018.
51. Kirschbaum, L., F. Dinmohammadi, D. Flynn, and M. Pecht. “Failure Analysis Informing Embedded Health Monitoring of Electromagnetic Relays.” ICSRS 2018. Spain, Sept 2018.
52. He, W., M. Pecht, D. Flynn, and F. Dinmohammadi, “A Physics-based Electrochemical Model for Lithium-ion Battery State-of-Charge Estimation Solved by an Optimised Projection-based Method and Moving-Window Filtering,” Energies, Vol. 11, No. 8, pp. 2120-2143, Aug 2018.
53. Liu, J., J. Liu, D. Yu, M. Kang, J. Liu, W. Yan, Z. Wang, M. Pecht. “Fault Detection for Gas Turbine Hot Components Based on Convolutional Neural Network,” Energies, Vol. 11, No. 8, pp. 2149-2167 Aug 2018.
54. Romero, J., M. Azarian, C. Morillo, and M. Pecht. “Effects of Moisture and Temperature on Membrane Switch Laptop Keyboards,” IEEE Transactions on Device and Materials Reliability, Vol. 18, No. 4, pp. 535–545, Aug 2018.
55. Kong, L., C. Li, J. Jiang, and M. Pecht. “Li-ion Battery Fire Hazards and Safety Strategies,” Energies, Vol. 11, No. 9, pp. 2191–2202, Aug 2018. Highlighted in August 2018 Battery Engineering literature review and featured in the '10 Ionizing Papers’ blog
56. Ye, X., C. Chen, M. Kang, G. Zhai, and M. Pecht. “A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests,” IEEE Access, Vol. 6, pp. 42566–42577, July 2018.
57. Zhang, Y., R. Xiong, H. He, and M. Pecht. “Long Short-term Memory Recurrent Neural Network for Remaining Useful Life Prediction of Lithium-ion Batteries,” IEEE Transactions on Vehicular Technology, Vol. 67, pp. 5695-5705, July 2018.
58. Pecht, M. “When E-cigarettes Go Boom,” Spectrum IEEE.org, Jul 2018.
59. Sun, Y., T. Sun, C. Yu, and M. Pecht. “Computing Lifetime Distributions and Reliability for Systems with Outsourced Components: A Case Study,” IEEE Access, Vol. 6, pp. 31359-31366, June 2018.
60. Wu, Y., S. Saxena, Y. Xing, Y. Wang, C. Li, W. Yung, and M. Pecht. “Analysis of Manufacturing-Induced Defects and Structural Deformations in Lithium-ion Batteries Using X-ray Computed Tomography,” Energies, Vol. 11, No. 4, pp. 925–947, Apr 2018.
61. Manoharan, S., C. Patel, P. McCluskey, and M. Pecht. “Effective Decapsulation of Copper Wire-bonded Microelectronic Devices for Reliability Assessment,” Microelectronics Reliability, Vol. 84, pp. 197–207, May 2018.
62. Zou, C., L. Zhang, X. Hu, Z. Wang, T. Wik, and M. Pecht. “A Review of Fractional-order Techniques Applied to Lithium-ion Batteries, Lead-acid Batteries, and Supercapacitors,” Journal of Power Sources, Vol. 390, pp. 286–296, June 2018.
63. Kang, M., M. Zhao, B. Tang, and M. Pecht. “Deep Residual Networks with Dynamically Weighted Wavelet Coefficients for Fault Diagnosis of Planetary Gearboxes.” IEEE Transactions on Industrial Electronics, Vol. 65, No. 5, pp. 4290–4300, May 2018.
64. Saxena, S., L. Kong, and M. Pecht. “Exploding E-cigarettes: A Battery Safety Issue,” IEEE Access, Vol. 6, pp. 21442–21466, May 2018.
65. Pecht, M., F. Dagorn, and D. Das. “Managing Electronics Part Changes in the Supply Chain,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 8, No. 5, pp. 883–895, Apr 2018.  Listed in IEEE top 5 most popular articles in 2018.
66. Saxena, S., Y. Xing, and M. Pecht. “A Unique Failure Mechanism in the Nexus 6P Lithium-ion Battery,” Energies, Vol. 11, No. 4, pp. 841–854, Apr 2018.
67. Liu, Z., Z. Jia, C. Vong, J. Han, C. Yan, and M. Pecht. “A Patent Analysis of Prognostics and Health Management (PHM) Innovations for Electrical Systems,” IEEE Access, Vol. 6, pp. 18088–18107, Mar 2018.
68. Sood, B., and M. Pecht. “The Effect of Epoxy/Glass Interfaces on CAF Failures in Printed Circuit Boards.” Microelectronics Reliability, Vol. 82, pp. 235–243, Mar 2018.
69. Zhang, Y., R. Xiong, H. He, and M. Pecht. “Lithium-ion Battery Remaining Useful Life Prediction with Box-Cox Transformation and Monte Carlo Simulation,” IEEE Transactions on Industrial Electronics, Vol. 66, No. 2, pp. 1585–1597, Feb 2018.
70. Alagarsamy, K., M. Kohani, A. Fortier, K. Alagarsamy, M. Kohani, and M. Pecht. “Risk of Tin Whiskers in Medical Device,” Journal of Biomedical Engineering and Research, Vol. 2, Feb 2018.
71. Motabar, P., H. Gonzalez, P. Rundle, and M. Pecht. “How Poor Reliability Affects Warranties: An Analysis of General Motors’ Powertrain Warranty Reduction,” IEEE Access, Vol. 6, pp. 15065–15074, Feb 2018.
72. Xiong, R., Y. Zhang, H. He, X. Zhou, and M. Pecht. “A Double-scale, Particle-filtering, Energy State Prediction Algorithm for Lithium-ion Batteries,” IEEE Transactions on Industrial Electronics, Vol. 65, No. 2, pp. 1526–1538, Feb 2018.
73. S. Peng, X. Zhua, Y. Xing, H. Shi, X. Caid, M. Pecht. “An adaptive state of charge estimation approach for lithium-ion series connected battery system,” Journal of Power Sources, Vol. 392, pp. 48–59, 2018.
74. Diao, W., J. Jiang, C. Zhang, H. Liang, and M. Pecht. “Energy State of Health Estimation for Battery Packs Based on the Degradation and Inconsistency,” Energy Procedia, Vol. 142, pp. 3578–3583, Dec 2017.
75. Zhang, Z.-X., X.-S. Si, C.-H. Hu, and M. G. Pecht. “A Prognostic Model for Stochastic Degrading Systems with State Recovery: Application to Li-ion Batteries,” IEEE Transactions on Reliability, Vol. 66, No. 4, pp. 1293–1308, Aug 2017.
76. Fortier, A., M. Tsao, N. Williard, L. Yinjiao Xing, and M. Pecht. “Preliminary Study on Integration of Fiber Optic Bragg Grating Sensors in Li-ion Batteries and In Situ Strain and Temperature Monitoring of Battery Cells,” Energies, Vol. 10, No. 7, pp. 838–849, June 2017.
77. Fan, J., M. G. Mohamed, C. Qian, X. Fan, G. Zhang, and M. Pecht. “Color Shift Failure Prediction for Phosphor-converted White LEDs by Modeling Features of Spectral Power Distribution with a Nonlinear Filter,” MDPI Materials, Vol. 10, No. 10, pp. 819–835, July 2017.
78. Huang, S. C., K. H. Tseng, J. W. Liang, C. L. Chang, and M. Pecht. “An Online SOC and SOH Estimation Model for Lithium-ion Batteries,” Energies, Vol. 10, No. 4, pp. 512–530, April 2017.
79. Saxena, S., G. Sanchez, and M. Pecht. “Batteries in Portable Electronic Devices: A User's Perspective.” IEEE Industrial Electronics Magazine, Vol. 11, No. 2, pp. 35-44, June 2017.
80. Dalvand, F., S. Dalvand, F. Sharafi, and M. Pecht. “Current Noise Cancellation for Bearing Fault Diagnosis Using Time-Shifting,” IEEE Transactions on Industrial Electronics, Vol. 64, No. 10, pp 8138–8147, April 2017.
81. Vasan, A., and M. Pecht. “Electronic Circuit Health Estimation Through Kernel Learning,” IEEE Transactions on Industrial Electronics, Vol. 65, No. 2, pp. 1585–1594, 2017. 
82. Su, X., S. Wang, M. Pecht, L. Zhao, and Z. Ye. “Interacting Multiple Model Particle Filter for Prognostics of Lithium-ion Batteries,” Microelectronics Reliability, Vol. 70, pp. 59–60, 2017.
83. Sun, B., X. Jiang, K.-C. Yung, J. Fan, and M. Pecht. “A Review of Prognostic Techniques for High-Power White LEDs,” IEEE Transactions on Power Electronics, Vol. 32, No. 8, pp. 6338–6362, Aug 2017.
84. Jameson, J., M. Azarian, and M. Pecht, “Thermal Degradation of Polyimide Insulation and its Effect on Electromagnetic Coil Impedance,” Proceedings of MFPT 2017 Conference, Virginia Beach, VA, 2017.
85. Li, N. M., D. Das, and M. Pecht. “Shelf Life Evaluation Method for Electronic and other Components using a Physics of Failure (PoF) Approach,” Proceedings of MFPT 2017 Conference, Virginia Beach, VA, 2017.
86. Liu, J., M. Kang, J. Liu, Z. Wang, D. Yu, and M. Pecht. “A Comparative Study on Anomaly Detection of the Combustion System in Gas Turbine,” Proceedings of MFPT 2017 Conference, Virginia Beach, VA, 2017.
87. Li, J., L. Wang, C. Lyu, and M. Pecht. “State of Charge Estimation Based on a Simplified Electrochemical Model for a Single LiCoO2 Battery and Battery Pack,” Energy, Vol. 133, pp. 572–583, 2017.
88. Shah, R., M. Azarian, and M. Pecht. “Fault Detection in Bearings Using Autocorrelation,” Proceedings of MFPT 2017, Virginia Beach, VA, 2017.
89. Cheng, X., L. Yao, and M. Pecht. “Lithium-ion Battery State-of-Charge Estimation Based on Deconstructed Equivalent Circuit at Different Open-Circuit Voltage Relaxation Times,” Journal of Zhejiang University-Science A, Vol. 18, No. 4, pp. 256–267, April 2017.
90. Pandian, G., D. Das, M. Osterman, and M. Pecht. “Risk Assessment of Transition to Lead-free Electronics Assembly,” Proceedings of MFPT 2017, Virginia Beach, VA, 2017.
91. Chang, M.-H., M. Kang, and M. Pecht. “Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model,” IEEE Transactions on Industrial Electronics, Vol. 64, No. 7, pp. 5667–5677, July 2017.
92. Yang, Q., R. Bi, K. Yung, and M. Pecht. “Electrochemically Reduced Graphene Oxides/Nanostructured Iron Oxides as Binder-free Electrodes for Supercapacitors,” Electrochimica Acta, Vol. 231, pp. 125–134, 2017.
93. Shrivastava, A., M. H. Azarian, and M. Pecht. “Failure of Polymer Aluminum Electrolytic Capacitors Under Elevated Temperature Humidity Environments,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 7, No. 5, pp. 745–750, May 2017.
94. Liu, Z., T. Liu, J. Han, S. Bu, X. Tang, and M. Pecht. “Signal Model-Based Fault Coding for Diagnostics and Prognostics of Analog Electronic Circuits,” IEEE Transactions on Industrial Electronics, Vol. 64, No. 1, pp. 605–614, 2017.
95. Diao, W., N. Xue, V. Bhattacharjee, J. Jiang, O. Karabasoglu, and M. Pecht. “Active Battery Cell Equalization Based on Residual Available Energy Maximization,” Applied Energy, Vol. 210(C), pp. 690–698, 2018.
96. Formica, T., H. Khan, and M. Pecht. “The Effect of Inverter Failures on the Return on Investment of Solar Photovoltaic Systems,” IEEE Access, Vol. 5, pp. 21336–21343, 2017.
97. Pecht, M., S. Mathew, L. Gullo, J. Jameson, and A. Vasan. “IEEE Standard Framework for Prognostics and Health Management of Electronic Systems,” IEEE Standard Framework for Prognostics and Health Management of Electronic. Systems Print: ISBN 978-1-5044-4320-3.
98. Vasan, A., A. Kleyner, and M. Pecht. “A New Application for Failure Prognostics – Reduction of Automotive Electronics Reliability Test Duration.” Annual Conference of the Prognostics and Health Management Society, Vol. 8, No. 36, pp. 1–9, 2017.
99. Cornelius, B., S. Treivish, Y. Rosenthal, and M. Pecht. “The Phenomenon of Tin Pest: A Review,” Microelectronics Reliability, Vol. 79, pp. 175–192, Dec 2017.
100. Pandian, G., D. Das, Chuan Li, E. Zio, and M. Pecht. “A Critique of Reliability Prediction Techniques for Avionics Applications,” Chinese Journal of Aeronautics, Vol. 31, No. 1, pp. 10–20, Jan 2018.
101. Kohani, M., and M. Pecht. “Malfunctions of Medical Devices Due to Electrostatic Occurrences: An Analysis of 10 Years of FDA's Reports,” IEEE Access, Vol. 6, pp. 5805–5811, 2017.
102. Cheng, X., and M. Pecht. “In Situ Measurements of Stresses on Li-ion Battery Electrodes: A Review,” Energies, Vol. 10, No. 5, pp. 591–610, 2017.
103. Cripps, E., and M. Pecht. “A Bayesian Nonlinear Random Effects Model for Identification of Defective Batteries from Lot Samples,” Journal of Power Sources, Vol. 342, pp. 342–350, 2017.
104. Jameson, N., M. Azarian, and M. Pecht, “Impedance-Based Condition Monitoring for Insulation Systems Used in Low-Voltage Electromagnetic Coils,” IEEE Transactions on Industrial Electronics, Vol. 64, pp. 3748–3757, 2017.
105. Liu, Z., G. Sun, S. Bu, J. Han, X. Tang, and M. Pecht. “Particle Learning Framework for Estimating the Remaining Useful Life of Lithium-Ion Batteries,” IEEE Transactions on Instrumentation and Measurement, Vol. 66, No. 2, pp. 280–293, 2017.
106. Chang, M., M. Kang, and M. Pecht. “Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure with RVM Regression Model,” IEEE Transactions on Industrial Electronics, Vol. 64, No. 7, pp. 5667–5677, 2017.
107. Padmanabhan, S., and M. Pecht. “An Isolated/Non-isolated Novel Multilevel Inverter Configuration for a Dual Three-Phase Symmetrical/Asymmetrical Star-winding Converter,” Engineering Science and Technology, an International Journal, Vol. 19, No. 4, pp. 1763–1770, Dec 2016.
108. Sanjeevikumar, P., S. Mahajan, F. Blaabjerg, M. Pecht, L. Martirano, and M. Manganelli, “Dual Six-Phase Multilevel AC Drive with Single Carrier Optimized Five-Level PWM for Star-Winding Configuration,” Lecture Notes in Electrical Engineering, Springer Journal Publications, Vol. 442, pp. 733–740, Dec 2016. (Won the best paper award)
109. Sanjeevikumar, P., S. Mahajan, P. Dhond, F. Blaabjerg, and M. Pecht, “Non-isolated Sextuple Output Hybrid Triad Converter Configurations for High Step-up Renewable Energy Applications,” Lecture Notes in Electrical Engineering, Springer Journal Publications, Vol. 436, pp. 1–12, Dec 2016. (Won the best paper award)
110. Formica, T., and M. Pecht. “Return on Investment Analysis and Simulation of a 9.12kW (kW) Solar Photovoltaic System,” Solar Energy, Vol. 144, pp. 629–634, 2017.
111. Fortier, A., and M. Pecht. “A Perspective of the IPC Report on Lead-free Electronics in Military/aerospace Applications,” Microelectronics Reliability, Vol. 69, pp. 66–70, 2017.
112. Venkitusamy, K., S. Padmanaban, M. Pecht, A. Awasthi, and R. Selvamuthukumaran. “A Modified Boost Rectifier for Elimination of Circulating Current in Power Factor Correction Applications,” Microelectronics Reliability, Vol. 69, pp. 29–35, 2017.
113. Kwon, D., M. Hodkiewicz, J. Fan, T. Shibutani, and M. Pecht. “IoT-Based Prognostics and Systems Health Management for Industrial Applications,”  IEEE Access, Vol. 4, pp. 3659–3670, 2016.
114. Yung, K.-Ch., Q. Yang, J. Fan, and M. Pecht. “Study of Electrochemical Performance of Li-ion Batteries Based on Simultaneous Measurement of a Three-electrode System,” 2016 3rd Asia Pacific World Congress on Computer Science and Engineering (APWC on CSE), pp. 226–231, Dec. 2016
115. Padmanaban, S., and M.  Pecht, “An Isolated/Non-Isolated Novel Multilevel Inverter Configuration for a Dual Three-Phase Symmetrical/Asymmetrical Star-Winding Converter,” Engineering Science and Technology, Vol. 19, No. 4, pp. 1763–1770, 2016.
116. Cheng, X., L. Yao, Y. Xing, and M. Pecht. “Novel Parametric Circuit Modeling for Li-Ion Batteries,” Energies, Vol. 9, No. 7, pp. 539–554, 2016.
117. Sun, B., X. Jiang, K. Yung, J. Fan, and M. Pecht. “A Review of Prognostic Techniques for High-Power White LEDs,” IEEE Transactions on Power Electronics, Vol. 32, No. 8, pp. 6338–6362, 2017.
118. Pecht, M., T. Shibutani, and L. Wu. “A Reliability Assessment Guide for the Transition Planning to Lead-Free Electronics for Companies Whose Products Are RoHS Exempted or Excluded,” Microelectronics Reliability, Vol. 62, pp. 113–123, 2016.
119. Mukherjee, S., P. Chauhan, M. Osterman, A. Dasgupta, and M. Pecht. “Mechanistic Prediction of the Effect of Microstructural Coarsening on Creep Response of SnAgCu Solder Joints,” Journal of Electronic Materials, Vol. 45, No. 7, pp. 3712–3725, 2016.
120. Zheng, F., Y. Xing, J. Jiang, B. Sun, J. Kim, and M. Pecht. “Influence of Different Open Circuit Voltage Tests on State of Charge Online Estimation for Lithium-Ion Batteries,” Applied Energy, Vol. 183, pp. 513–525, 2016.
121. Pearl, A., M. Osterman, and M. Pecht. “Evaluation of ENEPIG and Immersion Silver Surface Finishes Under Drop Loading,” Journal of Electronic Materials, Vol. 45, pp. 391–402, 2016.
122. George, E., and M. Pecht. “RoHS Compliance in Safety and Reliability Critical Electronics,” Microelectronics Reliability, Vol. 65, pp. 1–7, Oct. 2016.
123. Kirillov, S., A. Kirillov, V. Iakimkin, A. Khodos, and M. Pecht. “PHM Applications in Medicine and Medical Implantable Devices,” 2016 IEEE PHM Conference, Chengdu, China, October 19–21, 2016. 
124. Mohammed, A., and M. Pecht. “A Stretchable and Screen-Printable Conductive Ink for Stretchable Electronics.” Applied Physics Letters, Vol. 109, 184101, 2016. 
125. Zheng, F., J. Jiang, B. Sun, W. Zhang, and M. Pecht. “Temperature Dependent Power Capability Estimation of Lithium-ion Batteries for Hybrid Electric Vehicles,” Energy, Vol. 113, pp. 64–75, 2016.
126. Pecht, M., T. Shibutani, M. Kang, M. Hodkiewicz, and E. Cripps. “A Fusion Prognostics-based Qualification Test Methodology for Microelectronic Products,” Microelectronics Reliability, Vol. 63, pp. 320–324, Aug 2016.
127. Woo, S., and Pecht, M. “Reliability Design of Residential-Sized Refrigerators Subjected to Repetitive Random Vibration Loads during Transportation,” Athens: ATINER'S Conference Paper Series, No: TRA2016-1981. (2016).
128. Kang, M., J. Kim, I. K. Jeong, J. M. Kim, and M. Pecht. “A Massively Parallel Approach to Real-Time Bearing Fault Detection Using Sub-band Analysis on an FPGA-Based Multicore System,” IEEE Transactions on Industrial Electronics, Vol. 63, pp. 6325–6335, Oct 2016.
129. Saxena, S., C. Hendricks, and M. Pecht. “Cycle Life Testing and Modeling of Graphite/LiCoO₂ Cells under Different State of Charge Ranges,” Journal of Power Sources, Vol. 327, pp. 394–400, Sep 2016.
130. Kang, M., G. R. Ramaswami, M. Hodkiewicz, E. Cripps,  J. Kim  and M. Pecht. “A Sequential k-Nearest Neighbor Classification Approach for Data-Driven Fault Diagnosis Using Distance- and Density-Based Affinity Measures”, Lecture Notes in Computer Science, pp. 253–261, 2016.
131. Pandian, G. P., G. K. Ramaswami, M. Hodkiewicz, E. Cripps, and M. Pecht. “Long-term Reliability of Lead-free Electronic Systems,” 23^rd International Symposium on The Physical and Failure Analysis of Integrated Circuits, Singapore, July 20, 2016.
132. Monoharan, S., G. K. Ramaswami, F. P. McCluskey, and M. Pecht. “Failure Mechanism in Encapsulated Copper Wire-bonded Devices,” 23^rd International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, July 20, 2016.
133. Li, N., X. Yu, and M. Pecht. “Position and Enforcement Practice of the People's Republic of China's Pharmaceutical Data Exclusivity Protection,” Drug Design, Development and Therapy, Vol. 10, pp. 2015–2020, June 2016.
134. Jameson, N. J., K. Wang, C. Morillo, M. H. Azarian, and M. Pecht. “Health Monitoring of Solenoid Valve Electromagnetic Coil Insulation under Thermal Deterioration,” Proceedings of MFPT 2016/ISA's 62nd IIS, Dayton, OH, May 24–26, 2016. Won Best Student Paper Award of Conference (2016).
135. Williard, N., C. Hendricks, B. Sood, J. S. Chung, and M. Pecht. “Evaluation of Batteries for Safe Air Transport,” Energies, Vol. 9, No. 5, pp. 340–353, May 2016.
136. Wong, E. H., W. D. van Driel, A. Dasgupta, and M. Pecht, “Creep Fatigue Models of Solder Joints: A Critical Review,” Microelectronics Reliability, Vol. 59, pp. 1–12, April 2016.
137. Kang, M., J.-M. Kim, R. Peng, X. Ma, and M. Pecht. “DWPT-Based Sub-Band Analysis for Fault Detection of Rolling Element Bearings,” Scientific Journal of Information Engineering, Vol. 6, pp. 1–7, April 2016.
138. Yoon, J. R., E. Baek, H.-K. Kim, M. Pecht, and S. H. Lee. “Critical Dual Roles of Carbon Coating in H₂Ti₁₂O₂₅ for Cylindrical Hybrid Supercapacitors,” Carbon, Vol. 101, pp. 9–15, May 2016.
139. Kang, M., R. Islam, J. Kim, J. Kim, and M. Pecht. “A Hybrid Feature Selection Scheme for Reducing Diagnostic Performance Deterioration Caused by Outliers in Data-Driven Diagnostics,” IEEE Transactions on Industrial Electronics, vol. 63, no. 5, pp. 3299–3310, 2016.
140. Tian, J., C. Morillo, M. H. Azarian, and M. Pecht. “Motor Bearing Fault Detection Using Spectral Kurtosis-based Feature Extraction Coupled with k-Nearest Neighbor Distance Analysis,” IEEE Trans. Ind. Electron., Vol. 63, pp. 1793–1803, March 2016. 
141. Lee, J.-H., H.-K. Kim, E. Baek, M. Pecht, S.-H. Lee, and Y.-H.  Lee. “Improved Performance of Cylindrical Hybrid Supercapacitor using Activated Carbon/ Niobium Doped Hydrogen Titanate,” Journal of Power Sources, Vol. 301, pp. 348–354, Jan 2016.
142. Wan, Y., H. Huang, D. Das, and M. Pecht. “Thermal Reliability Prediction and Analysis for High-density Electronic Systems Based on the Markov Process,” Microelectronics Reliability, Vol. 56, pp. 182–188, Jan 2016.
143. Pearl, A., M. Osterman, and M. Pecht. “Evaluation of ENEPIG and Immersion Silver Surface Finishes Under Drop Loading,” Journal of Electronic Materials, Vol. 45, pp. 391–402, Jan 2016.
144. Charbaji, A.,  M. Osterman, and M. Pecht. “Influence of Varying H2S Concentrations and Humidity Levels on ImAg and OSP Surface Finishes,” International Journal of Mechanical Engineering and Technology, Vol. 6, No. 12, pp. 18–29, Dec 2015.
145. Kohani, M. and M. Pecht. “New Minimum Relative Humidity Requirements Are Expected to Lead to More Medical Device Failures,” J. Medical Systems, Vol. 40, No. 3, pp. 1–6, Dec. 2015.
146. Ning, Y., M. Azarian, and M. Pecht, “Effects of Voiding on Thermo-mechanical Reliability of Copper-filled Microvias: Modeling and Simulation,” IEEE Transactions on Device and Materials Reliability, Vol. 15, pp. 500–510, Dec. 2015.
147. Williard, N., D. Baek, J. Park, B. Choi, M. Osterman, and M. Pecht. “A Life Model for Supercapacitors,” IEEE Transactions on Device and Materials Reliability, Vol. 15, pp. 519–528, Dec. 2015.
148. Tessa, L. L., B. P. Sood, and M. G. Pecht. “Field Reliability Estimation for Cochlear Implants,” in IEEE Transactions on Biomedical Engineering, Vol. 62, No. 8, pp. 2062–2069, Aug. 2015.
149. Fan, J., C. Qian, K.-C. Yung; X. Fan, G. Zhang, and M. Pecht. “Optimal Design of Life Testing for High Brightness White LEDs Using the Six Sigma DMAIC Approach,” IEEE Transactions on Device and Materials Reliability, Vol. 15, No. 99, pp. 576–587, Dec. 2015.
150. Fan, J., C. Qian, X. Fan, G. Zhang, and M. Pecht. “In-situ Monitoring and Anomaly Detection for LED Packages Using a Mahalanobis Distance Approach,” First International Conference on Reliability System Engineering & Prognostics and System Health Management Conference-Beijing (2015 ICRSE & PHM-Beijing), Beijing, China, Oct. 23, 2015. (Won best paper award)
151. Hendricks, C., N. Williard, S. Mathew, and M. Pecht. “A Failure Modes, Mechanisms, and Effects Analysis (FMMEA) of Lithium-ion Batteries,” Journal of Power Sources, Vol. 297, pp. 113–120, 2015.
152. Jameson, N., X. Song, and M. Pecht. “Conflict Minerals in Electronic Systems: An Overview and Critique of Legal Initiatives,” Science Engineering Ethics, Vol. 22, No. 5, pp. 1375–1389, Sep. 2015.
153. Oh, H., S. Choi, K. Kim, B. D. Youn, and M. Pecht, “An Empirical Model to Describe Performance Degradation for Warranty Abuse Detection in Portable Electronics,” Reliability Engineering & System Safety, Vol. 142, pp. 92–99, Oct. 2015.
154. Wang, K., J. Tian, M. Pecht, and A. Xu, “A Prognostics and Health Management Method for Instrumentation System Remanufacturing,” 2015 IEEE Conference on Technologies for Sustainability, Ogden, UT, June 30-August 1, 2015.
155. Leng, F., C. M. Tan, and M. Pecht. “Effect of Temperature on the Aging Rate of Li-ion Battery Operating Above Room Temperature,” Scientific Reports, Vol. 5, Art. No. 12967, Aug. 6, 2015.
156. Wan, Y., H. Huang, and M. Pecht. “Thermal Fatigue Reliability Analysis and Structural Optimization Based on a Robust Method for Microelectronics FBGA Packages,” IEEE Transactions on Device and Materials Reliability, Vol. 15, No. 2, pp. 206–213, June 2015.
157. Menon, S., X. Jin, T. W. S. Chow, and M. Pecht. “Evaluating Covariance in Prognostic and System Health Management Applications,” Mechanical Systems and Signal Processing, Vols. 58–59, pp. 206–217, June 2015.
158. Menon, S., E. George, M. Osterman, and M. Pecht. “High Lead (Over 85 %) Solder in the Electronics Industry: RoHS Exemptions and Alternatives,” Journal of Materials Science: Materials in Electronics, Vol. 26, No. 6, pp. 4021–4030, June 2015.
159. Patil, N., D. Das, and M. Pecht. “Anomaly Detection for IGBTs Using Mahalanobis Distance,” Microelectronics Reliability, Vol. 55, No. 7, pp. 1054–1059, June 2015.
160. Ma, P., S. Wang, L. Zhao, M. Pecht, X. Su, and Z. Ye. “An Improved Exponential Model for Predicting the Remaining Useful Life of Lithium-ion Batteries,” IEEE Conference on Prognostics and Health Management (PHM), 2015, pp. 1–6, 22–25 June 2015.
161. Guo, J., Z. Li, and M. Pecht. “A Bayesian Approach for Li-ion Battery Capacity Fade Modeling and Cycles to Failure Prognostics,” Journal of Power Sources, Vol. 281, pp. 173–184, May 2015.
162. Wang, K., J. Tian, M. Pecht, and A. Xu, “A Prognostics and Health Management Based Method for Refurbishment Decision Making for Electromechanical Systems,” Proceedings of the 15th IFAC Symposium on Information Control Problems in Manufacturing, Ottawa, Canada, pp. 481–486, May 11–13, 2015. 
163. Hendricks, C., W. He, M. Osterman, M. Hurley, S. Fagan, S. Field, W. Hardman, V. Manivannan, and M. Pecht. “An Approach for Assessing Battery State of Health with Limited Data,” The Aircraft Airworthiness and Sustainment Conference, Baltimore, MD, April 2, 2015.
164. Fan, J., K.-C. Yung, and M. Pecht. “Predicting Long-term Lumen Maintenance Life of LED Light Sources Using a Particle Filter-based Prognostic Approach,” Expert Systems with Applications, Vol. 42, No. 5, pp. 2411–2420, April 2015.
165. Chang, M.-H., P. Sandborn, M. Pecht, W. K. C. Yung, and W. Wang. “A Return on Investment Analysis of Applying Health Monitoring to LED Lighting Systems,” Microelectronics Reliability, Vol. 55, Nos. 3–4, pp. 527–537, Feb. 2015.
166. George, E., M. Osterman, and M. Pecht. “An Evaluation of Dwell Time and Mean Cyclic Temperature Parameters in the Engelmaier Model,” Microelectronics Reliability, Vol. 55, Nos. 3–4, pp. 582–587, Feb. 2015.
167. Jameson, N. J., M. H. Azarian, and M. Pecht, “Fault Diagnostic Opportunities for Solenoid Operated Valves Using Physics-of-Failure Analysis,” Reliability Digest, Feb. 2015.
168. Oh, H., M. Azarian, C. Morillo, M. Pecht, and E. Rhem. “Failure Mechanisms of Ball Bearings Under Lightly Loaded, Non-accelerated Usage Conditions,” Tribology International, Vol. 81, pp. 291–299, Jan. 2015.
169. Niu, G., Y. Zhao, M. Defoort, and M. Pecht. “Fault Diagnosis of Locomotive Electro-pneumatic Brake Through Uncertain Bond Graph Modeling and Robust Online Monitoring,” Mechanical Systems and Signal Processing, Vols. 50–51, pp. 676–692, Jan. 2015.
170. Kwon, D., M. H. Azarian, and M. Pecht. “Remaining Life Prediction of Solder Joints Using RF Impedance Analysis and Gaussian Process Regression,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 5, No. 11, pp. 1602–1609, 2015.
171. Vasan, A., B. Sood, and M. Pecht. “Carbon Footprinting of Electronic Products,” Applied Energy, Vol. 136, pp. 636–648, Dec. 2014.
172. Bai, G., P. Wang, C. Hu, and M. Pecht. “A Generic Model-free Approach for Lithium-ion Battery Health Management,” Applied Energy, Vol. 135, pp. 247–260, Dec. 2014.
173. Zhang, W., S. Liu, B. Sun, Y. Liu, and M. Pecht. “A Cloud Model-based Method for the Analysis of Accelerated Life Test Data,” Microelectronics Reliability, Vol. 55, No. 1, pp. 123–128, Nov. 2014.
174. He, W., N. Williard, C. Chen, and M. Pecht. “State of Charge Estimation for Li-ion Batteries Using Neural Network Modeling and Unscented Kalman Filter-based Error Cancellation,” International Journal of Electrical Power and Energy Systems, Vol. 62, pp. 783–791, Nov. 2014.
175. Ratzker, M., A. Pearl, M. Osterman, M. Pecht, and G. Milad. “Review of Capabilities of the ENEPIG Surface Finish”, Electronic Materials, Vol. 43, No. 11, pp. 3885–3897, Nov. 2014.
176. He, Xiaofei., M. H. Azarian and M. Pecht. “Analysis of the Kinetics of Electrochemical Migration on Printed Circuit Boards Using Nernst-Planck Transport Equation,” Electrochimica Acta, Vol. 142, pp. 1–10, Oct. 2014.
177. Chauhan, P., S. Mathew, M. Osterman, and M. Pecht. “In-situ Interconnect Failure Prediction Using Canaries,” IEEE Transactions on Device and Materials Reliability, Vol. 14, No. 3, pp. 826–832, Sept. 2014.
178. Chang, M.-H., C. Chen, D. Das, and M. Pecht. “Anomaly Detection of Light-Emitting Diodes Using the Similarity-based Metric Test,” IEEE Transactions on Industrial Informatics, Vol. 10, No. 3, pp. 1852–1863, Aug. 2014.
179. R. Bakhshi, M. Azarian, and M. Pecht. “Effects of Voiding on the Degradation of Microvias in High Density Interconnect Printed Circuit Boards Under Thermomechanical Stresses” IEEE Transactions On Components, Packaging And Manufacturing Technology, Vol. 4, No. 8, pp. 1374–1379, Aug. 2014.
180. George, E., and M. Pecht, “A Lead-free Transition Plan for Safety and Reliability Critical Products,” International Conference on Challenges in IT, Engineering and Technology (ICCIET) Phuket, Thailand, July 17–18, 2014.
181. Varde, P. V., J. Tian, and M. Pecht. “Prognostics and Health Management based Refurbishment for Life Extension of Electronic Systems,” IEEE ICIA & ICAL 2014, Hailar, China, July 26-28, 2014
182. Tian, J., M. H. Azarian, and M. Pecht. “Rolling Element Bearing Fault Detection Using Density-based Clustering,” IEEE Conference on Prognostics and Health Management (PHM), Spokane, WA, June 22–25, 2014.
183. Shrivastava, A., M. H. Azarian, C. Morillo, B. Sood, and M. Pecht. “Detection and Reliability Risks of Counterfeit Electrolytic Capacitors”, IEEE Transactions on Reliability, Vol. 63, No. 2, pp. 468–479, June 2014.
184. Fritzler, T., M. Azarian, and M. Pecht. “Scintillation Conditioning of Tantalum Capacitors with Manganese Dioxide Cathodes,” IEEE Transactions on Device and Materials Reliability, Vol. 14, No. 2, pp. 630–638, June 2014.
185. Pecht, M., and Anwar Mohammed. “Intermittent Failures in Hardware and Software,” International Journal of Electrical Engineering and Technology (IJEET), Vol. 5, No. 5, pp. 57–73, May 2014.
186. Haddad, G., P. A. Sandborn, and M. G. Pecht, “Using Maintenance Options to Maximize the Benefits of Prognostics for Wind Farms,” Wind Energy, Vol. 17, pp. 775–791, May 2014.
187. Leng, F., C. M. Tan, M. Pecht, and J. Y. Zhang. “The Effect of Temperature on the Electrochemistry in Lithium-ion Batteries,” 3^rd International Symposium on Next-Generation Electronics, Taoyuan, Taiwan, May 7–10, 2014.
188. Jin, X., M. Zhao, T. Chao, and M. Pecht. “Motor Bearing Fault Diagnosis Using Trace Ratio Linear Discriminant Analysis,” IEEE Transactions on Industrial Electronics, Vol. 61, No. 5, pp. 2441–2451, May 2014.
189. Kirillov, A., S. Kirillov, and M. Pecht. “The Problem of PHM Cloud Cluster in the Context of Development of Self-maintenance and Self-recovery Engineering Systems.” Engineering Asset Management - Systems, Professional Practices and Certification. Lecture Notes in Mechanical Engineering. DOI: https://doi.org/10.1007/978-3-319-09507-3_128.
190. Peter, A., M. H. Azarian, M. Pecht., “Step Stress Testing of Electric Double Layer Capacitors,” International Capacitor and Resistor Technology Symposium, Santa Clara, CA, April 2014.
191. Sun, J., H. Zuo, W. Wang, and M. Pecht. “Prognostics Uncertainty Reduction by Fusing On-line Monitoring Data Based on a State-space-based Degradation model,” Mechanical Systems and Signal Processing, Vol. 45, No. 2, pp. 396–407, April 2014.
192. Ning, Y., M. Azarian, and M. Pecht. “Simulation of the Influence of Manufacturing Quality on Thermomechanical  Stresses of Microvias,” IPC EXPO 2014, Mar. 23–27, 2014.
193. Chai, F., M. Osterman, and M. Pecht. “Strain-range-based Solder Life Predictions Under Temperature Cycling with Varying Amplitude and Mean,” IEEE Transactions on Device and Materials Reliability, Vol. 14, No. 1, pp. 351–57, Mar. 2014.
194. Fan, J., K.-C. Yung, and M. Pecht. “Prognostics of Chromaticity State for Phosphor-converted White Light Emitting Diodes Using an Unscented Kalman Filter Approach,” IEEE Transactions on Device and Materials Reliability, Vol. 14, No. 1, pp. 564–573, Mar. 2014.
195. Bakhshi, R., S. Kunche, and M. Pecht. “Intermittent Failures in Hardware and Software,” Journal of Electronic Packaging, Vol. 136, No. 1, pp. 1–5, Mar. 2014.
196. Shrivastava, A., S. Bangerth, M. Azarian, C. Morillo, M. Pecht, M. Levin, L. Steinhardt, and A. Callini, “Detection of Capacitor Electrolyte Residues with FTIR in Failure Analysis,” Journal of Materials Science: Materials in Electronics, Vol. 25, No. 2, pp. 635–644, Feb. 2014.
197. Shrivastava, A., and M. Pecht. “Counterfeit Capacitors in the Supply Chain,” Journal of Materials Science: Materials in Electronics, Vol. 25, No. 2, pp. 645–652, Feb. 2014.
198. Xing, Y., W. He, and M. Pecht. “State of Charge Estimation of Lithium-ion Batteries Using the Open-circuit Voltage at Various Ambient Temperatures,” Applied Energy, Vol. 113, pp. 106–115, Jan. 2014. Won the 2015 Applied Energy Award - highly cited research papers.
199. George, E., and M. Pecht. “Tin Whisker Analysis of an Automotive Engine Control Unit,” Microelectronics Reliability, Vol. 54, No. 1, pp. 214–219, Jan. 2014.
200. Pecht, M. “The Counterfeit Electronics Problem,” Open Journal of Social Sciences, Vol. 1, No. 7, pp. 12–16, Dec. 2013.
201. He, W., N. Williard, C. Chen, and M. Pecht. “Health Management of Batteries Based on Differential Evolution,” 7^th International Conference on Software, Knowledge, Information Management, and Applications (SKIMA 2013), Chiang Mai, Thailand, Dec. 18–20, 2013.
202. Ye, Z. S., Y. Wang, K. L. Tsui, and M. Pecht. “Degradation Data Analysis Using Wiener Processes with Measurement Errors,” IEEE Transactions on Reliability, Vol. 62, No. 4, pp. 772–780, Dec. 2013.
203. Patil, N., D. Das, E. Scanff, and M. Pecht. “Long Term Storage Reliability of Antifuse Field Programmable Gate Arrays,” Microelectronics Reliability, Vol. 53, No. 12, pp. 2052–2056, Dec. 2013.
204. Datong, L., Y. Luo, Y. Peng, J. Liu, L. Guo, and M. Pecht. “Lithium-ion Battery Remaining Useful Life Estimation Based on Fusion Nonlinear Degradation AR Model and RPF Algorithm,” Neural Computing and Applications, Vol. 25, Nos. 3–4, pp. 557–573, Nov. 2013.
205. Dai, J., D. Das, M. Ohadi, and M. Pecht. “Reliability Risk Mitigation of Free Air Cooling Through Prognostics and Health Management,” Applied Energy, Vol. 111, pp. 104–112, Nov. 2013.
206. Vasan, A., B. Long, and M. Pecht. “Diagnostics and Prognostics Method for Analog Electronic Circuits,” IEEE Transactions on Industrial Electronics, Vol. 60, No. 11, pp. 5277–5291, Nov. 2013.
207. Wang, D., Q. Miao, and M. Pecht. “Prognostics of Lithium-ion Batteries Based on Relevance Vectors and a Conditional Three-Parameter Capacity Degradation Model,” Journal of Power Sources, Vol. 239, pp. 253–264, Oct. 2013.
208. Sood, B., M. Osterman, and M. Pecht. “Health Monitoring of Lithium-ion Batteries,” IEEE Symposium on Product Compliance Engineering (ISPCE), Austin, TX, pp. 1–6, Oct. 7–9 2013.
209. George, E., M. Osterman, M. Pecht, R. Coyle, R. Parker, and E. Benedetto. “Thermal Cycling Reliability of Alternative Low-Silver Tin-based Solders,” 46th International Symposium on Microelectronics, Orlando, FL, Sept. 29–Oct. 3, 2013.
210. Menon, S., A. Pearl, M. Osterman, and M. Pecht. “Effect of ENEPIG Surface Finish on the Vibration Reliability of Solder Interconnects,” 46^th International Symposium on Microelectronics, Orlando, FL, Sept 30–Oct. 3, 2013
211. Jin, X., T. W. S. Chow, and M. Pecht. “Online Anomaly Detection of Brushless DC Motor Using Current Monitoring Technique,” Prognostics and System Health Management Conference (PHM-2013), Milan, Italy, Sept. 8–11, 2013.
212. Krillov, A., S. Krillov, and M. Pecht. “Remote Calculating PHM Cluster: The First Results,” Prognostics and System Health Management Conference (PHM-2013), Milan, Italy, Sept. 8–11, 2013.
213. Raveendran, R. K. S., M. Azarian, N. H. Kim, and M. Pecht. “Effect of Multiple Faults and Fault Severity on Gearbox Fault Detection in a Wind Turbine Using Electrical Current Signals,” Prognostics and System Health Management Conference (PHM-2013), Milan, Italy, Sept. 8–11, 2013.
214. Williard, N., W. He, C. Hendricks, and M. Pecht. “Lessons Learned from the 787 Dreamliner on Lithium-ion Battery Reliability,” Energies, Vol. 6, No. 9, pp. 4682–4695, Sept. 2013.
215. Song, X., M. H. Chang, and M. Pecht, “Rare-Earth Elements in Lighting and Optical Applications and Their Recycling,” Journal of the Minerals, Metals & Materials Society (JOM), Vol. 65, No. 10, pp. 1276–1282, Aug. 2013.
216. Chauhan, P., Z. W. Zhong, and M. Pecht. “Copper Wire Bonding Concerns and Best Practices,” Journal of Electronic Materials, Vol. 42, No. 8, pp. 2415–2434, Aug. 2013.
217. Tamilselvan, P., P. Wang, and M. Pecht. “A Multi-attribute Classification Fusion System for Insulated Gate Bipolar Transistor Diagnostics,” Microelectronics Reliability, Vol. 53, No. 8, pp. 1117–1129, Aug. 2013.
218. Srivinas, V., S. Menon, M. Osterman, and M. Pecht. “Modeling the Rate Dependent Durability of Reduced-Ag SAC Interconnects for Area Array Packages Under Torsion Loads,” Journal of Electronic Materials, Vol. 42, No. 8, pp. 2606–2614, July 2013.
219. Chauhan, P., S. Mukherjee, M. Osterman, A. Dasgupta, and M. Pecht. “Effect of Isothermal Aging on Microstructure and Creep Properties of SAC305 Solder: A Micromechanics Approach,” International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK2013), Burlingame, CA, July 16–18, 2013.
220. Tian, J., M. Pecht, L. Yang, and Q. Miao. “A K-Means Clustering Based Method in Rolling Element Bearing Fault Detection,” International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE2013) & International Conference on Materials and Reliability (ICMR 2013), Sichuan, China, July 15–18, 2013.
221. Vasan, A., M. Pecht, and B. Long. “Health Assessment of Electronic Systems,” International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE2013) & International Conference on Materials and Reliability (ICMR 2013), Sichaun, China, July 15–18, 2013.
222. Pecht, M. “Battery Reliability of Electric Vehicles,” Mathematical Methods in Reliability Conference (MMR 2013), Stellenbosch, South Africa, July 1–4, 2013.
223. Vasan, A., C. Chen, and M. Pecht. “Circuit-centric Approach for Electronic System-level Prognostics,” IEEE Conference on Prognostics and Health Management (PHM), Gaithersburg, MD, June 24–27, 2013.
224. Sreenilayam-Raveendram, R.-K., M. Azarian, and M. Pecht. “Detection of Under-lubricated Ball Bearings Using Vibration Signals,” IEEE Conference on Prognostics and Health Management (PHM), Gaithersburg, MD, June 24–27, 2013.
225. Tian, J., C. Morillo, and M. Pecht. “Rolling Element Bearing Fault Diagnosis Using Simulated Annealing Optimized Spectral Kurtosis,” IEEE Conference on Prognostics and Health Management (PHM), Gaithersburg, MD, pp. 1–5, June 24–27 2013.
226. Kumar, R., M. Azarian, E. Rhem, and M. Pecht. “Classification of Lubricant Level in Ball Bearings Using Vibration Signals,” IEEE Conference on Prognostics and Health Management (PHM), Gaithersburg, MD, Jun. 24–27, 2013.
227. Liu, D., P. J. Yue, Z. J. Bao, Y. Peng, and M. Pecht. “Prognostics for State-of-Health Lithium-ion Battery Based on Combination Gaussian Process Functional Regression,” Microelectronics Reliability, Vol. 53, No. 6, pp. 832–839, June 2013. {Top 5 most highly cited articles in Microelectronics Reliability for each year 2014, 2015, 2016}.
228. He, W., N. Williard, C. Chen, and M. Pecht. “State of Change Estimation for Electric Vehicle Batteries Using Unscented Kalman Filtering,” Microelectronics Reliability, Vol. 53, No. 6, pp. 840–847, June 2013.
229. Chen, Y., Q. Miao, B. Zheng, S. Wu, and M. Pecht, “Quantitative Analysis of Lithium-ion Battery Capacity Prediction via Adaptive Bathtub-shaped Function,” Energies, Vol. 6, No. 6, pp. 3082–3096, June 2013.
230. Miao, Q., L. Xie, H. Cui, W. Liang, and M. Pecht, “Remaining Useful Life Prediction of Lithium-ion Battery with Unscented Particle Filter Technique,” Microelectronics Reliability, Vol. 53, No. 6, pp. 805–810, June 2013.
231. Xing, Y., E. W. M. Ma, K.-L. Tsui, and M. Pecht, “An Ensemble Model for Predicting the Remaining Useful Performance of Lithium-ion Batteries,” Microelectronics Reliability, Vol. 53, No. 6, pp. 811–820, June 2013.
232. Alam, M., M. Azarian, and M. Pecht, “Modeling the Electrical Conduction in Epoxy-BaTiO₃ Nanocomposites,” Journal of Electronic Materials, Vol. 42, No. 6, pp. 1101–1107, Jun. 2013.
233. Raveendran, R. K. S., M. Azarian, N. H. Kim, and M. Pecht, “Effect of Multiple Faults and Fault Severity on Gearbox Fault Detection in a Wind Turbine Using Electrical Current Signals,” Chemical Engineering Transactions, Vol. 33, pp. 79–84, 2013.
234. Choi, S., B. D. Youn, and M. Pecht, “A Liquid Contact Indicator Model for Warranty Abuse Detection in Portable Electronics,” Proceedings of the 2013 IEEE International Conference on Prognostics and Health Management (PHM), Gaithersburg, MD, pp. 1–8, June 2013. 
235. Ye, H., S. Xue, and M. Pecht, “Effects of Thermal Cycling on Rare Earth (Pr)-induced Sn Whisker/Hillock Growth,” Materials Letters, Vol. 98, No. 1, pp. 78–81, May 2013.
236. Kumar, R., M. Azarian, C. Morillo, M. Pecht, K. Kida, E. Santos, T. Honda, and H. Koike, “Comparative Evaluation of Metal and Polymer Ball Bearings,” Wear, Vol. 302, Nos. 1–2, pp. 1499–1505, Apr.–May 2013.
237. Cong, F., J. Chen, G. Dong, and M. Pecht, “Vibration model of rolling element bearings in a rotor-bearing system for fault diagnosis,” Journal of Sound and Vibration, Vol. 332, No. 8, pp. 2081–2097, Apr. 2013.
238. Chauhan, P., M. L. Wu, M. Osterman, and M. Pecht, “Evolution of Bulk and Interfacial Microstructure of SAC305 and SN100C Solders on ENIG/Cu Pads Under Isothermal Aging,” International Conference on Electronics Packaging (ICEP), Osaka, Japan, Apr. 10–12, 2013.
239. Moriyama, M., M. Azarian, and M. Pecht, “Failure Mode Analysis of Electrical Double Layer Capacitors,” International Conference on Electronics Packaging (ICEP), Osaka, Japan, Apr. 10–12, 2013.
240. Roller, J., B. Sood, and M. Pecht, “Reliability of Electroless Nickel Immersion Gold Finishes,” International Conference on Electronics Packaging (ICEP), Osaka, Japan, Apr. 10–12, 2013.
241. Yin, L., S. Wei, Z. Xu, Y. Geng, D. Das, and M. Pecht, “The Effect of Joint Size on the Creep Properties of Microscale Lead-free Solder Joints at Elevated Temperatures,” Journal of Materials Science: Materials in Electronics, Vol. 24, No. 4, pp. 1369–1374, Apr. 2013. (see “Erratum,” Vol. 24, No. 7, July 2013).
242. Oh, Hyunseok, M. H. Azarian, and D. Das, “A Critique of the IPC-9591 Standard: Performance Parameters for Air Moving Devices,” IEEE Transactions on Device and Materials Reliability, Vol. 13, No. 1, pp. 146–155, Mar. 2013.
243. Wang, Y., Q. Miao, E. W. M. Ma, K.-L. Tsui, and M. Pecht, “Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance,” IEEE Transactions on Reliability, Vol. 62, No. 1, pp. 136–145, Mar. 2013.
244. Williard, N., W. He, M. Osterman, and M. Pecht, “Comparative Analysis of Features for Determining State of Health in Lithium-ion Batteries,” International Journal of the PHM Society, Special Issue: Battery Management, Vol. 4, No. 1, pp. 1–7, Mar. 2013.
245. Challa, V., P. Rundle, and M. Pecht, “Challenges in the Qualification of Electronic Components and Systems,” IEEE Transactions on Device and Materials Reliability, Vol. 13, No. 1, pp. 26–35, Mar. 2013.
246. Kunche, S., C. Chen, and M. Pecht, “Optimized Diagnostic Model Combination for Improving Diagnostic Accuracy,” IEEE Aerospace Conference, Big Sky, MT, Mar. 2–9, 2013.
247. Dorj, E., C. Chen, and M. Pecht, “A Bayesian Hidden Markov Model-based Approach for Anomaly Detection in Electronic Systems,” IEEE Aerospace Conference, Big Sky, MT, Mar. 2–9, 2013.
248. Song, B., M. Azarian, and M. Pecht, “Effect of Temperature and Relative Humidity on the Impedance Degradation of Dust-contaminated Electronics,” Journal of the Electrochemical Society, Vol. 160, pp. C97–C105, 2013.
249. Miao, Q., C. Tang, W. Liang, and M. Pecht, “Health Assessment of Cooling Fan Bearing Using Wavelet-based Filtering,” Sensors, Vol. 13, pp. 274–291, 2013.
250. Vasan, A., D. Mahadeo, R. Doraiswami, Y. Huang, and M. Pecht, “Point-of-Care Biosensor System,” Frontiers in Bioscience, Scholar, Vol. 5S, pp. 39–71, Jan. 2013.
251. Li, B., X. P. Zhang, Y. Yang, L. M. Yin, and M. Pecht, “Size and Constraint Effects on Interfacial Fracture Behavior of Microscale Solder Interconnects,” Microelectronics Reliability, Vol. 53, No. 1, pp. 154–163, Jan. 2013.
252. Song, X., L. Zuga, and M. Pecht, “The National Computer Quality Supervising Center (NCTC): A Core Chinese Dual Use Technology Capability,” Second Line of Defense, Jan. 2013. http://www.sldinfo.com/the-national-computer-quality-supervising-center-...
253. Shi, H., C. Tian, M. Pecht, and T. Ueda, “Polymeric Reinforcement Approaches and Materials Selection to Improve Board-level Drop Reliability of SnAgCu Soldered Area Array Packages,” 14th Electronics Packaging Technology Conference, Singapore, Dec. 5–7, 2012.
254. Shi, H., C. Tian, M. Pecht, and T. Ueda, “Board-level Shear, Bend, Drop, and Thermal Cycling Reliability of Lead-free Chip Scale Packages with Partial Underfill: A Low-cost Alternative to Full Underfill,” 14th Electronics Packaging Technology Conference, Singapore, Dec. 5–7, 2012.
255. Dai, J., D. Das, and M. Pecht, “A Multiple Stage Approach to Mitigate the Risks of Telecommunication Equipment Under Free Air Cooling Conditions,” Energy Conversion and Management, Vol. 64, pp. 424–432, Dec. 2012.
256. Varde, P. V., and M. Pecht, “Role of Prognostics in Support of Integrated Risk-based Engineering: A Review in Respect of Nuclear Power Plant Safety,” International Journal of the PHM Society, Vol. 3, No. 1, pp. 1–23, 2012.
257. Haddad, G., P. Sandborn, and M. Pecht, “An Options Approach for Decision Support of Systems with Prognostic Capabilities,” IEEE Transactions on Reliability, Vol. 61, No. 4, pp. 872–883, Dec. 2012.
258. Xing, Y., E. Ma, and M. Pecht, “Model-based Prediction for Battery Remaining Useful Life,” APARM 2012, Nanjing, China, Nov. 1–3, 2012.
259. Dai, J., D. Das, and M. Pecht, “Prognostics-based Risk Mitigation for Telecom Equipment Under Free Air Cooling Conditions,” Applied Energy, Vol. 99, pp. 423–429, Nov. 2012.
260. A. Kirillov, S. Kirillov, M. Pecht. “The calculating PHM cluster: CH&P mathematical models and algorithms of early prognosis of failure.” Prognostics and System Health Management (PHM), 2012 IEEE Conference. July 2, 2012. DOI: 10.1109/PHM.2012.6228771.
261. Alam, M., M. Azarian, and M. Pecht, “Highly Accelerated Life Testing of Embedded Planar Capacitors with Epoxy-BaTiO₃ Nanocomposite Dielectric,” IEEE Transations on Components, Packaging and Manufacturing Technology, Vol. 2, No. 10, pp. 1580–1586, Oct. 2012.
262. George, E., M. Osterman, M. Pecht, and R. Coyle, “Effects of Extended Dwell Time on Thermal Fatigue Life of Ceramic Chip Resistors,” 45^th International Symposium on Microelectronics, San Diego, CA, Sep. 13, 2012.
263. Liu, D., Y. Luo, Y. Peng, X. Peng, and M. Pecht, “Lithium-ion Battery Remaining Useful Life Estimation Based on Nonlinear AR Model Combined with Degradation Feature,” Annual Conference of the Prognostics and Health Management Society, Vol. 3, pp. 1–7, Sep. 2012.
264. Pecht, M., and L. Zuga, “U.S. Intelligence Must Boost S&T Sources, Analysis as China Rises,” Aol Defense, Sep. 24, 2012. http://defense.aol.com/2012/09/24/us-intelligence-agencies-must-boost-sa...
265. Williard, N., W. He, C. Wang, and M. Pecht, “Reliability and Failure Analysis of Lithium Ion Batteries for Electronic Systems,” International Conference on Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), Guilin, China, Aug. 2012.
266. Jin, X., E. Ma, L. Cheng, and M. Pecht, “Health Monitoring of Cooling Fans Based on Mahalanobis Distance with mRMR Feature Selection,” IEEE Transactions on Instrumentation and Measurement, Vol. 61, No. 8, pp. 2222–2229, Aug. 2012.
267. Stradley, J., and M. Pecht, “The Electronics Counterfeiting Problem,” Circuit World, Vol. 38, No. 3, pp. 163–168, Aug. 2012.
268. Cheng, S., and M. Pecht, “Using Cross-validation for Model Parameter Selection of Sequential Probability Ratio Test,” Expert Systems with Applications, Vol. 39, pp. 8467–8473, July 2012.
269. Han, S., M. Osterman, S. Meschter, and M. Pecht, “Evaluation of Effectiveness of Conformal Coatings as Tin Whisker Mitigation,” Journal of Electronic Materials, Vol. 14, No. 9, pp. 2508–2518, July 2012.
270. Cheng, S., K. Tom, and M. Pecht, “Failure Causes of a Polymer Resettable Circuit Protection Device,” Journal of Electronic Materials, Vol. 41, No. 9, pp. 2419–2430, Jun. 2012.
271. Alam, M., M. Azarian, M. Osterman, and M. Pecht, “Accelerated Temperature and Voltage Stress Tests of Embedded Planar Capacitors with Epoxy BaTiO₃ Composite Dielectric,” Journal of Electronic Packaging, Vol. 134, No. 2, pp. 021009-1–021009-8, Jun. 2012.
272. Sun, B., S. Zeng, R. Kang, and M. Pecht, “Benefits and Challenges of System Prognostics,” IEEE Transactions on Reliability, Vol. 61, No. 2, pp. 323–335, Jun. 2012.
273. Wang, W., M. Pecht, and Y. Liu, “Cost Optimization for Canary-Equipped Electronic Systems in Terms of Inventory Control and Maintenance Decisions,” IEEE Trans. on Reliability, Vol. 61, No. 2, pp. 466–478, Jun. 2012.
274. Wang, W., M.J. Carr, T.W.S. Chow, and M. Pecht, “A Two-Level Inspection Model with Technological Insertions,” IEEE Trans. on Reliability, Vol. 61, No. 2, pp. 479–490, Jun. 2012.
275. Wang, W., S. Luo, and M. Pecht, “Economic Design of the Mean Prognostic Distance for Canary-Equipped Electronic Systems,” Microelectronics Reliability, Vol. 52, No. 6, pp. 1086–1091, Jun. 2012.
276. Cheng, S., K. Tom, and M. Pecht, “Anomaly Detection of Polymer Resettable Circuit Protection Devices,” IEEE Trans. on Device and Materials Reliability, Vol. 12, No. 2, pp. 420–427, Jun. 2012.
277. Chai, F., M. Osterman, and M. Pecht, “Reliability of Gull-Wing and Leadless Packages Subjected to Temperature Cycling after Rework,” IEEE Trans. on Device and Materials Reliability, Vol. 12, No. 2, pp. 510–517, Jun. 2012.
278. Pecht, M., “Nvidia’s GPU Failures: A Case for Prognostics and Health Management,” Microelectronics Reliability, Vol. 52, No. 6, pp. 953–957, Jun. 2012.
279. Fan, J., K-C Yung, and M. Pecht, “Lifetime Estimation of High-Power White LED using Degradation-Data-Driven Method,” IEEE Trans. on Device and Materials Reliability, Vol. 12, No. 2, pp. 470–477, Jun. 2012.
280. Huang, Y., A.S.S. Vasan, R. Doraiswami, M. Osterman, and M. Pecht, “MEMS Reliability Review,” IEEE Trans. on Device and Materials Reliability, Vol. 12, No. 2, pp. 482–493, Jun. 2012.
281. Mathew, S., M. Osterman, and M. Pecht, “A Canary Device Based Approach for Prognosis of Ball Grid Array Packages,” 2012 IEEE Conf. on Prognostics and Health Management, Denver, CO, Jun. 18–21, 2012.
282. Kumar, R., M. Azarian, M. Pecht, and N.H. Kim, “Gear Fault Diagnosis using Electrical Signals and its Application to Wind Power Systems,” 2012 IEEE Conf. on Prognostics and Health Management, Denver, CO, Jun. 18–21, 2012.
283. Sutrisno, E., H. Oh, A.S.S. Vasan, and M. Pecht, “Estimation of Remaining Useful Life of Ball Bearings using Data Driven Methodologies,” 2012 IEEE Conf. on Prognostics and Health Management, Denver, CO, Jun. 18–21, 2012.
284. Pecht, M. and L. Zuga, “U.S. Companies- Not China- Pose the Real Counterfeit Parts Problem,” Aol Defense,  Jun. 1, 2012. http://defense.aol.com/2012/06/01/u-s-companies-not-china-pose-the-real-...
285. Sutrisno, E., Q. Fan, D. Das, and M. Pecht, “Anomaly Detection for Insulated Gate Bipolar Transistor (IGBT) under Power Cycling using Principal Component Analysis and K-Nearest Neighbor Algorithm,” Journal of the Washington Academy of Sciences, Vol. 98, No. 1, pp. 1–8, May 2012.
286. Alam, M., L. Zuga, and M. Pecht, “Economics of Rare Earth Elements in Ceramic Capacitors,” Ceramics International, Vol. 38, pp. 6091–6098, May 2012.
287. Fortier, A. and M. Pecht, “Comparative Study of Metal Films and their Affinity for Tin Whisker Growth,” IEEE Transactions on Components, Packaging and Manufacturing Tech., Vol. 2, No. 5, pp. 739–747, May 2012.
288. Huang, Y., M. Osterman, M. Pecht, “A Novel Electrostatic Radio Frequency Micro Electromechanical Systems with Prognostics Function,” 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC), pp. 121–126, May 29– Jun 3, 2012
289. Wang, Y., E. W. M. Ma, K. L. Tsui, and M. Pecht, “A Fusion Approach for Anomaly Detection in Hard Disk Drives,” Proc. of IEEE 2012 Prognostics and System Health Management Conference, Beijing, May 23–25, 2012.
290. Long, B., H. Wang, Q. Miao, and M. Pecht, “A Prognostics and Health Management Strategy for Complex Electronic Systems,” Proc. of IEEE 2012 Prognostics and System Health Management Conference, Beijing, May 23–25, 2012.
291. Jin, X., E. W. M. Ma, T. W. S. Chow, and M. Pecht, “An Investigation into Fan Reliability,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
292. Xie, L., Q. Miao, Y. Chen, W. Liang, and M. Pecht, “Fan Bearing Fault Diagnosis Based on Continuous Wavelet Transform and Autocorrelation,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM–2012 Beijing), Beijing, May 23–25, 2012.
293. Ma, E. W. M., T. W. S. Chow, and M. Pecht, “Evaluating Nominal Parameters in Fault Diagnosis,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
294. Xing, Y., E. W. M. Ma, K. L. Tsui, and M. Pecht, “A Case Study on Battery Life Prediction using Particle Filtering,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
295. He, W., N. Williard, C. Chen, and M. Pecht, “State of Charge Estimation for Electric Vehicle Batteries under an Adaptive Filtering Framework,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
296. Cui, H. J., Q. Miao, W. Liang, Z. Wang, and M. Pecht, “Application of Unscented Particle Filter in Remaining Useful Life Prediction of Lithium-ion Batteries,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
297. Chen, C. and M. Pecht, “Prognostics of Lithium-Ion Batteries Using Model-Based and Data-Driven Methods,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
298. Chauhan, P., M. Osterman, M. Pecht, and Q. Yu, “Use of Temperature as a Health Monitoring Tool for Solder Interconnect Degradation in Electronics,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
299. Rundle, P., Y. Ning, and M. Pecht, “Health Monitoring Based Reliability,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012
300. Lau, B. C. P., E. W. M. Ma, and M. Pecht, “Review of Offshore Wind Turbine Failures and Fault Prognostic Methods,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
301. Fan, J., K. C. Yung, and M. Pecht, “Comparison of Statistical Models for the Lumen Lifetime Distribution of High Power White LEDs,” Proc. of IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing, May 23–25, 2012.
302. Chang, M. H., D. Das, P. V. Varde, and M. Pecht, “Light Emitting Diodes Reliability Review,” Microelectronics Reliability, Vol. 52, No. 5, pp. 762–782, May 2012.
303. DiMaio, F., J. Hu, P. Tse, K. Tsui, E. Zio, and M. Pecht, “Ensemble-Approaches for Clustering Health Status of Oil Sand Pumps,” Expert Systems with Applications, Vol. 39, No. 5, pp. 4847–4859, April 2012.
304. Pecht, M., and L. Zuga, “Counterfeit Electronics and the China Connection,” SMT Magazine, pp. 38–44, April 2012.
305. Alam, M., M. Azarian, and M. Pecht, “Embedded Capacitors in Printed Wiring Board: A Technological Review,” Journal of Electronic Materials, Vol. 41, No. 6, pp. 2286–2303, April 2012.
306. Sun, J., H. Zuo, W. Wang, and M. Pecht, “Application of a State Space Modeling Technique to System Prognostics based on a Health Index for Condition-based Maintenance,” Mechanical Systems and Signal Processing, Vol. 28, pp. 585–596, April 2012.
307. Wu, M. L., E. George, and M. Pecht, “Simulation Assisted Physics of Failure based Reliability Assessment,” ICEP-IAAC 2012 Conference, Tokyo, Japan, April 17–20, 2012.
308. Chauhan, P., M. Osterman, and M. Pecht, “Canary Approach for Monitoring BGA Interconnect Reliability under Temperature Cycling,” MFPT 2012: The Prognostics and Health Management Solutions Conference, Dayton, OH, April 24–26, 2012. (Won best student paper of conference award)
309. Kunche, S., C. Chen, and M. Pecht, “A Review of PHM System’s Architectural Frameworks,” MFPT 2012: The Prognostics and Health Management Solutions Conference, Dayton, OH, April 24–26, 2012.
310. Sutrisno, E., Q. Fan, D. Das, C. Chan, and M. Pecht, “Anomaly Detection for Insulated Gate Bipolar Transistor (IGBT) Under Power Cycling Using a K-Nearest Neighbor Technique,” MFPT 2012: The Prognostics and Health Management Solutions Conference, Dayton, OH, April 24–26, 2012.
311. Tian, J., C. Li, and M. Pecht, “Diagnosis of Rolling Element Bearing Fault in Bearing-Gearbox Union System using Wavelet Packet Correlation Analysis,” MFPT 2012: The Prognostics and Health Management Solutions Conference, Dayton, OH, April 24–26, 2012.
312. Williard, N., H. Wei, and M. Pecht, “Model Based Battery Management System for Condition Based Maintenance,” MFPT 2012: The Prognostics and Health Management Solutions Conference, Dayton, OH, April 24–26, 2012.
313. Campbell, P. E., and M. Pecht, “The Emperor’s New Clothes: Intellectual Property Protections in China,” Journal of Business & Technology Law, Vol. 7, No. 1, pp. 75–125, March 2012.
314. Dai, J., D. Das, M. Pecht, and M.M. Ohadi, “A Case Study on Impact of Free Air Cooling on Performance of Telecom Equipment,” Proc. of SemiTherm, San Jose, CA, March 18–22, 2012.
315. Ohadi, M. M., S. V. Dessiatoun, K. Choo, M. Pecht, and J. V. Lawler, “A Comparison Analysis of Air, Liquid, and Two-Phase Cooling of Data Centers,” Annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA, pp. 58–63, March 18–22, 2012.
316. Si, X.-S., W. Wang, C.-H. Hu, D.-H. Zhou, and M. Pecht, “              a Nonlinear Diffusion Degradation Process,” IEEE Transactions on Reliability, Vol. 61, No. 1, pp. 50–67, March 2012.
317. Elerath, J., and M. Pecht, “IEEE 1413: A Standard for Reliability Predictions,” IEEE Transactions on Reliability, Vol. 61, No. 1, pp. 125–129, March 2012.
318. Alam, M. A., M. H. Azarian, and M. Pecht, “Reliability of Embedded Planar Capacitors with Epoxy-BaTiO₃ Composite Dielectric During Temperature-Humidity-Bias Tests,” IEEE Transactions on Device and Materials Reliability, Vol. 12, No. 1, pp. 86–93, March 2012.
319. Sun, J., S. Cheng, and M. Pecht, “Prognostics of Multilayer Ceramic Capacitors Via the Parameter Residuals,” IEEE Transactions on Device and Materials Reliability, Vol. 12, No. 1, pp. 49–57, March 2012.
320. Patil, N., D. Das, and M. Pecht, “A Prognostic Approach for Non-punch through and Field Stop IGBTs,” Microelectronics Reliability, Vol. 52, No. 3, pp. 482–488, March 2012.
321. Song, B., M. H. Azarian, and M. Pecht, “Impact of Dust on Printed Circuit Assembly Reliability,” IPC APEX EXPO, San Diego, CA, February 29, 2012.
322. Kumar, S., N. M. Vichare, E. Dolev, and M. Pecht, “A Health Indicator Method for Degradation Detection of Electronic Products,” Microelectronics Reliability, Vol. 52, No. 2, pp. 439–445, Feb. 2012.
323. He, X., M. Azarian, M. Kostinovsky, and M. Pecht, “An Evaluation of the Insulation Resistance and Surface Contamination of Printed Circuit Board Assemblies,” Proc. of IPC Apex Expo Conf., San Diego, CA, Feb. 2012.
324. Alam, M. A., M. H. Azarian, and M. Pecht, “Effects of Moisture Absorption on the Electrical Parameters of Embedded Capacitors with Epoxy-BaTiO₃ Nanocomposite Dielectric,” Journal of Materials Science: Materials in Electronics, Vol. 23, No. 1, pp. 1504–1510, Jan. 2012.
325. Mathew, S., A. Alam, and M. Pecht, “Identification of Failure Mechanisms to Enhance Prognostic Outcomes,” Journal of Failure Analysis and Prevention, Vol. 12, No. 1, pp. 66–73, 2012; updated of Mathew, S., M. Alam, and M. Pecht, “Identification of Failure Mechanisms to Enhance Prognostic Outcomes,” MFPT: The Applied Systems Health Management Conf., Virginia Beach, VA, May 10–12, 2011.
326. Gray, K., and M. Pecht, “Long-term Thermal Overstressing of Computers,” IEEE Design & Test of Computers, Vol. 28, No. 6, pp. 58–64, Nov./Dec. 2011.
327. He, W., N. Williard, M. Osterman, and M. Pecht, “Prognostics of Lithium-ion Batteries Based on Dempster-Shafer Theory and the Bayesian Monte Carlo Method,” Journal of Power Sources, No. 196, pp. 10314–10321, Dec. 2011.
328. Woo, S. W., J. Park, and M. Pecht, “Reliability Design and Case Study of Refrigerator Parts Subjected to Repetitive Loads under Consumer Usage Conditions,” Engineering Failure Analysis, Vol. 18, No. 7, pp. 1818–1830, Oct. 2011.
329. Xing, Y., E. W. M. Ma, K. L. Tsui, and M. Pecht, “Battery Management Systems in Electric and Hybrid Vehicles,” Energies, Vol. 4, No. 11, pp. 1840–1857, Oct. 2011.
330. Haddad, G., P. Sandborn, and M. Pecht, “Determining a Dynamic Maintenance Threshold Using Real Options,” Proc. of WCEAM 2011, Cincinnati, OH, Oct. 3–5, 2011.
331. Vasan, A. S. S., B. Long, and M. Pecht, “Experimental Validation of LS-SVM Based Fault Identification in Analog Filter Circuits Using Frequency Features,” Proc. of WCEAM 2011, Cincinnati, OH, Oct. 3–5, 2011.
332. Menon, S., E. George, M. Osterman, and M. Pecht, “Physics of Failure Based Reliability Assessment of Electronic Hardware,” Proc. of WCEAM 2011, Cincinnati, OH, Oct. 2–5, 2011.
333. Azarian, M., M. Alam, and M. Pecht, “The Effect of Physical Dimensions of an Embedded Planar Capacitor on Reliability,” SMTA International, Fort Worth, TX, Oct. 2011.
334. Sood, B., D. Das, and M. Pecht, “Screening for Counterfeit Electronic Parts,” Journal of Material Sciences, Material Electronics, Vol. 22, (Failure Analysis in Electronics; an EDFAS Special Issue) pp. 1511–1522, Oct. 2011.
335. Sood, B., and M. Pecht, “Conductive Filament Formation in Printed Circuit Boards: Effects of Reflow Conditions and Flame Retardants,” Journal of Material Sciences, Material Electronics, Vol. 22, (Failure Analysis in Electronics; an EDFAS Special Issue) pp. 1602–1615, Oct. 2011.
336. Williard, N., B. Sood, M. Osterman, and M. Pecht, “Disassembly Methodology for Conducting Failure Analysis on Lithium-ion Batteries,” Journal of Material Sciences, Material Electronics, Vol. 22, (Failure Analysis in Electronics; an EDFAS Special Issue) pp. 1616–1630, Oct. 2011.
337. Kumar, R., M. Azarian, M. Pecht, and N.-H. Kim, “Gear Fault Diagnosis using Electrical Signals and its Application to Wind Power Systems,” AWEA Offshore Windpower Conference and Exhibition, Baltimore, MD, Oct. 11–13, 2011.
338. Kumar, R., M. Azarian, N.-H. Kim, and M. Pecht, “Identifying Failed Components from System-level Signals in a Wind Turbine,” AWEA Offshore Windpower Conference and Exhibition, Baltimore, MD, Oct. 11–13, 2011.
339. Haddad, G., P. A. Sandborn, T. Jazouli, M. Pecht, B. Foucher, and V. Rouet, “Guaranteeing High Availability of Wind Turbines,” 2011 ESREL Conference, Troyes, France, Sept. 18–22, 2011.
340. Long, B., S. Tian, Q. Miao, and M. Pecht, “Research on Features for Diagnostics of Filtered Analog Circuits Based on LS-SVM,” Proc. of Autotestcon 2011, Baltimore, MD, pp. 360–366, Sept. 12–15, 2011.
341. Vasan, A.,  and M. Pecht, “Investigation of Stochastic Differential Models and a Recursive Nonlinear Filtering Approach for Fusion-prognostics,” Annual Conference of the Prognostics and Health Management Society, 2011, Sept. 25–29, 2011
342. Zhang, S., R. Kang, and M. Pecht, “Corrosion of ImAg-Finished PCBs Subjected to Elemental Sulfur Environments,” IEEE Transactions on Device and Materials Reliability, Vol. 11, No. 3, pp. 391–400, Sept. 2011.
343. Fan, J., K.C. Yung, and M. Pecht, “Physics-of-Failure-Based Prognostics and Health Management for High-Power White Light-Emitting Diode Lighting,” IEEE Transactions on Device and Materials Reliability, Vol. 11, No. 3, pp. 407–416, Sept. 2011.
344. Alam, M., M. H. Azarian, M. Osterman, and M. Pecht, “Prognostics of Failures in Embedded Planar Capacitors using Model-based and Data-Driven Approaches,” Journal of Intelligent Material Systems and Structures, Vol. 22, pp. 1293–1304, Oct. 2011.
345. Zuga, L., M. Pecht, and P. Wang, “Prognostics and Health Management Based Health Care Robotics,” Proc. of the Association of Unmanned Systems Conference, Las Vegas, NV, Aug. 22, 2011.
346. Tiku, S., and M. Pecht, “Counterfeit Products: Strategies for Military Systems,” SMT Magazine, pp. 14–23, Aug. 2011.
347. Wang, W., Y. Liu, and M. Pecht, “A Theoretical Model to Minimize the Operational Cost for Canary-equipped Electronic System’s Health Management,” Intl. Symposium on System Informatics and Engineering (ISSIE 2011), July 11–13, 2011.
348. Shen, D., S. Zhang, and M. Pecht, “Design on Logic Processes of PHM for Avionics System,” Intl. Symposium on System Informatics and Engineering (ISSIE 2011), July 11–13, 2011.
349. Xing, Y., Q. Miao, K.-L. Tsui, and M. Pecht, “Research on Prognostics-based Reliability for Lithium-ion Batteries,” Intl. Symposium on System Informatics and Engineering (ISSIE 2011), July 11–13, 2011.
350. Wang, W., Y. Liu, and M. Pecht, “A Theoretical Model to Minimize the Operational Cost for Canary-equipped Electronic System’s Health Management,” Intl. Conference on Intelligence and Security Informatics (ISI), pp. 233–238, July 10–12, 2011.
351. Xing, Y., Q. Miao, K.-L. Tsui, and M. Pecht, “Prognostics and Health Monitoring for Lithium-ion Battery,” Intl. Conference on Intelligence and Security Informatics (ISI), pp. 242–247, July 10–12, 2011.
352. Khuu V., M. Osterman, A. Bar-Cohen, and M. Pecht, “Considerations in the Use of the Laser Flash Method for Thermal Measurements of Thermal Interface Materials,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 1, No. 7, pp. 1015–1028, July 2011.
353. Wang, W., and M. Pecht, “Economic Analysis of Canary-based Prognostics and Health Management,” IEEE Transactions on Industrial Electronics, Vol. 58, No. 7, pp. 3077–3089, July 2011.
354. Alam, M. A., D. Das, M. H. Azarian, B. Sood, and M. Pecht, “Influence of Molding Compound on Leakage Current in MOS Transistors,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 1, No. 7, pp. 1054–1063, July 2011.
355. Cheng, S., D. Das, and M. Pecht, “Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations,” Int’l Conf. on Biomedical Ontology, Buffalo, NY, pp. 340–345, July 26–30, 2011.
356. Sood, B., M. Osterman, and M. Pecht, “Tin Whisker Analysis of Toyota’s Electronic Throttle Controls,” Circuit World, Vol. 37, No. 3, pp. 4–9, 2011.
357. Chang, M., D. Das, and M. Pecht, “Junction Temperature Characterization of High Power Light Emitting Diodes,” 2011 IMAPS Mid-Atlantic Microelectronics Conf., Atlantic City, NJ, June 23–24, 2011.
358. Haddad, G., P. Sandborn, and M. Pecht, “Using Real Options to Manage Condition-based Maintenance Enabled by PHM,” Proc. of 2011 IEEE Int’l Conf. on Prognostics and Health Management, Denver, CO, June 20–23, 2011.
359. Miao, Q., M. H. Azarian, and M. Pecht, “Cooling Fan Bearing Fault Identification Using Vibration Measurement,” Proc. of 2011 IEEE Int’l Conf. on Prognostics and Health Management, Denver, CO, June 20–23, 2011.
360. Miao, Q., D. Wang, and M. Pecht, “Rolling Element Bearing Fault Feature Extraction using EMD-based Independent Component Analysis,” Proc. of 2011 IEEE Int’l Conf. on Prognostics and Health Management, Denver, CO, June 20–23, 2011.
361. He, W., N. Williard, M. Osterman, and M. Pecht, “Remaining Useful Performance Analysis of Batteries,” Proc. of 2011 IEEE Int’l Conf. on Prognostics and Health Management, Denver, CO, June 20–23, 2011.
362. Sotiris, V., E. Slud, and M. Pecht, “Reliability Inference in a First Hitting Time Model with Augmented Data,” Proc. of Int’l Conf. on Mathematical Methods in Reliability, Beijing, China, June 20–24, 2011.
363. He, X., M. Azarian, and M. Pecht, “Evaluation of Electrochemical Migration on Printed Circuit Boards with Lead-Free and Tin-Lead Solder,” Journal of Electronic Materials, Vol. 40, No. 9, pp. 1921–1936, June 2011.
364. Haddad, G., P. Sandborn, and M. Pecht, “Method for Valuating Options Arising in PHM,” Proc. of 2011 IEEE Int’l Conf. on Prognostics and Health Management, Denver, CO, June 21, 2011.
365. Pecht, M., “Remaining Useful Performance Analysis of Batteries,” Proc. of 2011 IEEE Int’l Conf. on Prognostics and Health Management, Denver, CO, June 21, 2011.
366. George, E., D. Das, M. Osterman, and M. Pecht, “Thermal Cycling Reliability of Lead-Free Solders (SAC305 and Sn3.5Ag) for High-Temperature Applications,” IEEE Transactions on Device and Materials Reliability, Vol. 11, No. 2, pp. 328–338, June 2011.
367. Vasan, A. S. S., R. Doraiswami, and M. Pecht, “Embedded 3D BioMEMS for plexed Label Free Detection,” Proc. of the 61st Electronic Components and Technology Conf. (ECTC), Orlando, FL, pp. 1412-1419, 2011.
368. Deng F., S. Zhang, R. Kang, and M. Pecht, “Investigation on the Failure Data of Commercial Aircrafts and Computer Motherboard,” Proc. of 9th Int’l Conf. on Reliability, Maintainability and Safety, Guiyang, China, June 14, 2011.
369. Mathew S., and M. Pecht, “Prognostics of Systems: Approaches and Applications,” 24th Int’l Conf. on Condition Monitoring and Diagnostics Engineering Management, Stavanger, Norway, May 30–June 1, 2011.
370. Azarian, M., R. S. R. Kumar, N. Patil, A. Shrivastava, and M. Pecht, “Applications of Health Monitoring to Wind Turbines,” 24th Int’l Congress on Condition Monitoring and Diagnostics Engineering Management, Stavanger, Norway, pp. 304-313, May 30–June 1, 2011.
371. Sun, J. H. Zuo, and M. Pecht, “Advances in Sequential Monte Carlo Methods for Joint State and Parameter Estimation Applied to Prognostics,” Prognostics and System Health Management Conference, Shenzhen, China, May 24–25, 2011.
372. Li, Y., M. Pecht, S. Zhang, and R. Kang, “Return on Investment of a LED Lighting System,” Prognostics and System Health Management Conference, Shenzhen, China, May 24–25, 2011.
373. Chauhan, P., M. Osterman, and M. Pecht, “Thermal Cycling Reliability of Sn96.5Ag3.0Cu0.5 Solder Assembled with ENIG and OSP Pad Finishes,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
374. Chai, F., M. Osterman, and M. Pecht, “CLCC Solder Joint Life Prediction under Complex Temperature Cycling Loading,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
375. He, W., N. Williard, M. Osterman, and M. Pecht, “Prognostics of Lithium-ion Batteries using Extended Kalman Filtering,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
376. Williard, N., W. He, M. Osterman, and M. Pecht, “Predicting Remaining Capacity of Batteries for UAVs and Electric Vehicle Applications,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
377. Han, S., C. Johnson, M. Osterman, and M. Pecht, “Effectiveness of Conformal Coatings on Surface Mount Components as Tin Whisker Mitigation,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
378. Oh, H., M. Azarian, and M. Pecht, “Estimation of Fan Bearing Degradation using Acoustic Emission Analysis and Mahalanobis Distance,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
379. Fritzler, T., M. Azarian, and M. Pecht, “Identification of Cracked MLCCs on Printed Circuit Board Assemblies using Time Domain Reflectometry,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
380. Han, S., M. Osterman, and M. Pecht, “Likelihood of Metal Vapor Arc by Tin Whiskers,” IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17–19, 2011.
381. Alam, M., M. Azarian, M. Osterman, and M. Pecht, “Early Detection of Avalanche Breakdown in Embedded Capacitors using SPRT,” MFPT: The Applied Systems Health Management Conf., Virginia Beach, VA, May 10–12, 2011.
382. Haddad, G., P. Sandborn, and M. Pecht, “A Real Options Optimization Model to Meet Availability Requirements for Offshore Wind Turbines,” MFPT: The Applied Systems Health Management Conf., Virginia Beach, VA, May 10–12, 2011.
383. Cheng, S., K. Tom, and M. Pecht, “Prognostics for Polymer Positive Temperature Coefficient Resettable Fuses,” MFPT: The Applied Systems Health Management Conf., Virginia Beach, VA, May 10–12, 2011.
384. Dai, J., D. Das, and M. Pecht, “Risks to Telecommunication Equipment under Free Air Cooling Conditions and their Mitigation,” MFPT: the Applied Systems Health Management Conf., Virginia Beach, VA, May 10–12, 2011.
385. Mathew, S., W. Wang, M. Osterman, and M. Pecht, “Assessment of Solder-Dipping as a Tin Whisker Mitigation Strategy,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 1, No. 5, pp. 957–963, May 2011.
386. Wang, W., M. Osterman, D. Das, and M. Pecht, “Solder Joint Reliability of SnAgCu Solder Refinished Components Under Temperature Cycling Test,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 1, No. 5, pp. 798–808, May 2011.
387. Alam, M., M. Azarian, M. Osterman, and M. Pecht, “Temperature and Voltage Aging Effects on Electrical Conduction Mechanism in Epoxy-BaTiO₃ Composite Dielectric used in Embedded Capacitors,” Microelectronics Reliability, Vol. 51, No. 5, pp. 946–952, May 2011.
388. Kwon, D., M. Azarian, and M. Pecht, “Nondestructive Sensing of Interconnect Failure Mechanisms Using Time-Domain Reflectometry,” IEEE Sensors Journal, Vol. 11, No. 5, pp. 1236–1241, May 2011.
389. Dai, J., D. Das, and M. Pecht, “Prognostics-based Health Management for Telecom Equipment under Free Air Cooling,” Eurocon 2011, Lisbon, Portugal, April 27–29, 2011.
390. Wang, W. and M. Pecht, “Software Reliability Analysis of Laptop Computers,” Proc. of 7th IMA Conf. for Modeling Industrial Maintenance and Reliability, Cambridge, UK, April 18–20, 2011.
391. Liu, Y., and M. Pecht, “Reduction of Motion Artifacts in Electrocardiogram Monitoring Using an Optical Sensor,” Biomedical Instrumentation & Technology, Vol. 45, No. 2, pp. 155–163, March/April 2011.
392. Sood, B., and M. Pecht, “Controlling Moisture in Printed Circuit Boards,” IPC APEX 2011, Las Vegas, NV, April 12–14, 2011.
393. He, X., M. Azarian, and M. Pecht, “Analysis of Electrochemical Migration Kinetics Using Electrochemical Impedance Spectroscopy,” Proc. of IPC Apex Expo Conf., Las Vegas, NV, April 12–14, 2011.
394. Alam, M., M. Azarian, M. Osterman, and M. Pecht, “Failure Mechanisms in Embedded Planar Capacitors During High Temperature Operating Life (HTOL) Testing,” IPC APEX 2011, Las Vegas, NV, April 12–14, 2011.
395. Woo, S., D. O’Neal, and M. Pecht, “Reliability Design of Residential Sized Refrigerators Subjected to Repetitive Random Vibration Loads during Rail Transport,” Engineering Failure Analysis, Vol. 18, pp. 1322–1332, March 2011.
396. Ma, L., B. Sood, and M. Pecht, “Effect of Moisture on Thermal Properties of Halogen-Free and Halogenated Printed-Circuit-Board Laminates,” IEEE Transactions on Device and Materials Reliability, Vol. 11, No. 1, pp. 66–75, March 2011.
397. Wen, Z., H. Zuo, and M. Pecht, “Electrostatic Monitoring of Gas Path Debris for Aero-engines,” IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 33–40, Mar. 2011.
398. Miao, Q., Cong. L., and M. Pecht, “Identification of Multiple Characteristic Components with High Accuracy and Resolution using the Zoom Interpolated Discrete Fourier Transform,” Measurement Science and Technology, Vol. 22, pp. 1–12, March 2011.
399. Ning, Y., P. Rundle, and M. Pecht, “Prognostics and Health Management’s Potential Benefits to Warranty,” 7th Annual Warranty Chain Management Conf., San Diego, CA, March 15–17, 2011.
400. Menon, S., C. Stecki, J. Song, and M. Pecht, “Optimization of PHM System for Electronic Assemblies Using Maintenance Aware Design Environment Software,” Proc. of 14th Australian Int’l Aerospace Congress, Melbourne, Australia, Feb. 28–March 3, 2011.
401. Miao, Q., L. Liu, Y. Feng, and M. Pecht, “Complex System Maintainability Verification with Limited Samples,” Microelectronics Reliability, Vol. 51, No. 2, pp. 294–299, Feb. 2011.
402. Niu, G., S. Singh, S.W. Holland, and M. Pecht, “Health Monitoring of Electronic Products Based on Mahalanobis Distance and Weibull Decision Metrics,” Microelectronics Reliability, Vol. 51, No. 2, pp. 279–284, Feb. 2011.
403. Wu, C., C. Yang, S. Lo, N. Vichare, E. Rhem, and M. Pecht, “Automatic Data Mining for Telemetry Database of Computer Systems,” Microelectronics Reliability, Vol. 51, No. 2, pp. 263–269, Feb. 2011.
404. Liu, S., Q. Yu, and M. Pecht, “Reliability Evaluation of Electronic Devices Considering the Actual Use Conditions,” Proc. of InterPACK2011, Feb. 2011.
405. Ma, L., B. Sood, M. Pecht and S. Bao, “Effect of Moisture on Coefficient of Thermal Expansion of Printed Circuit Board Laminates,” Materials Review, Vol. 24, No. 11, pp. 6–9, 2010 (in Chinese).
406. Ma, L., S. Bao, B. Sood, and M. Pecht, “Advances in Halogen-free Flame Retardants of Printed Circuit Boards,” Materials Review, Vol. 24, No. 12, pp. 50–54, 2010 (in Chinese).
407. Tiku, S., and M. Pecht, “Validation of Reliability Capability Evaluation Model Using a Quantitative Assessment Process,” International Journal for Quality and Reliability Management, Vol. 27, No. 8, pp. 938–952, 2010.
408. Vasan, A. S. S., R. Doraiswami, and M. Pecht, “Biocompatible Polymer Composite Material for Highly Sensitive Point of Care BioMEMS Microcantilever Sensors,” Proc. of the SMTA International, pp. 279–288, 2010.
409. Dasgupta, A., R. Doraiswami, M. Azarian, M. Osterman, S. Mathew, and M. Pecht, “The Use of Canaries for Adaptive Health Management of Electronic Systems,” ADAPTIVE 2010, IARIA Conf. Lisbon, Portugal, Nov. 21–26, 2010.
410. Woo, S. W., D. O’Neal, M. Pecht, and H. E. Kim, “Design for Reliability of Refrigerator Components Subject to Repetitive Loads in Use,” Proc. of the ASME 2010 Int’l Mechanical Engineering Congress (IMECE2010), #37134, Vancouver, BC, Canada, Nov. 12–18, 2010.
411. Williard, N., P. Chauhan, V. Srinivas, M. Osterman, M. Pecht, and R. Farrell, “Thermal Cycling Reliability of Package on Packages Assembled by One-Pass and Two-Pass Techniques,” Proc. of 2010 SMTA Int’l Conf. and Exhibition, Orlando, FL, Oct. 24–28, 2010.
412. Miao, Q., D. Wang, and M. Pecht, “A Probabilistic Description Scheme for Rotating Machinery Health Evaluation,” Journal of Mechanical Science and Technology, Vol. 24, No. 12, pp. 2421–2430, Sept. 2010.
413. Cheng, S., K. Tom, and M. Pecht, “Failure Precursors for Polymer Resettable Fuses,” IEEE Transactions on Device and Materials Reliability, Vol. 10, No. 3, pp. 374–380, Sept. 2010.
414. Pecht, M., “Prognostics and Health Management Applications to Electronic Systems,” Proc. of New Methods of Damage and Failure Analysis of Structural Parts Conf., Ostrava, Czech Republic, pp. 103–114, Sept. 6–10, 2010.
415. Chang, M. H., D. Das, S. W. Lee and M. Pecht, “Concerns with Interconnect Reliability Assessment of High Power Light Emitting Diodes (LEDs),” SMTA China South Technical Conference 2010, Shenzhen, China, pp. 63–69, Aug. 31–Sept. 2, 2010.
416. Alam, M., M. H. Azarian, M. Osterman, and M. Pecht, “Prognostics of Embedded Planar Capacitors under Temperature and Voltage Aging,” Proc. of the ASME 2010 Conf. on Smart Materials, Adaptive Structures and Intelligent Systems (SMASIS2010), Philadelphia, PA, Sept. 28–Oct. 1, 2010.
417. Patil, N., S. Menon, D. Das, and M. Pecht, “Evaluation of Robust Covariancec Estimation Techniques for Anomaly Detection of Insulated Gate Bipolar Transistors (IGBTs),” Proc. of the ASME 2010 Conf. on Smart Materials, Adaptive Structures and Intelligent Systems (SMASIS2010), Philadelphia, PA, Sept. 28–Oct. 1, 2010.
418. Niu, G., D. Lau, and M. Pecht, “Computer Manufacturing Management Integrating Lean Six Sigma and Prognostic Health Management,” International Journal of Performability Engineering, Vol. 6, No. 5, pp. 453–466, Sept. 2010.
419. Kumar, S., and M. Pecht, “Modeling Approaches for Prognostics and Health Management of Electronics,” International Journal of Performability Engineering, Vol. 6, No. 5, pp. 467–476, Sep. 2010.
420. Kwon, D., M. Azarian, and M. Pecht, “Prognostics of Interconnect Degradation using RF Impedance Monitoring and Sequential Probability Ratio Test,” International Journal of Performability Engineering, Vol. 6, No. 5, pp. 443–452, Sept. 2010.
421. Gu, J., N. Vichare, B. Ayyub, and M. Pecht, “Application of Grey Prediction Model for Failure Prognostics of Electronics,” International Journal of Performability Engineering, Vol. 6, No. 5, pp. 435–442, Sept. 2010.
422. Kumar, S., T. W. S. Chow, and M. Pecht, “Approach to Fault Identification for Electronic Products Using Mahalanobis Distance,” IEEE Transactions on Instrumentation and Measurement, Vol. 59, No. 8, pp. 2055–2064, Aug. 2010.
423. Wang, W., M. Osterman, D. Das, and M. Pecht, “Solder Joint Reliability of SnBi Finished TSOPs with Alloy 42 Lead-frame under Temperature Cycling,” Journal of ASTM International, Vol. 7, No. 8 (JAI102939), pp. 74–88, Aug. 2010.
424. Elerath, J., and M. Pecht, “IEEE 1413: An IEEE Standard for Reliability Predictions,” 2010 11th Intl Conference on Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), Mountain View, CA, Aug. 16–19, 2010.
425. Cheng, S., and M. Pecht, “A Fusion Prognostics Approach for Electronic Products,” Proc. of the ASME 2010 Int’l Design Engineering Technical Conf. & Computers and Information in Engineering Conf. (IDETC/CIE 2010), Montreal, Canada, Aug. 15–18, 2010.
426. Niu, G., B. S. Yang, and M. Pecht, “Development of an Optimized Condition-based Maintenance System by Data Fusion and Reliability-centered Maintenance,” Reliability Engineering and System Safety, Vol. 95, No. 7, pp. 786–796, July 2010.
427. Han, S., M. Osterman, and M. Pecht, “Electrical Shorting Propensity of Tin Whiskers”, IEEE Transactions on Electronics Packaging Manufacturing, Vol. 33, No. 3, Jul. 2010.
428. Woo, S., M. Pecht, and D. O’Neal, “Reliability Design and Case Study of a Refrigerator Parts Subjected to Repetitive Loads,” Reliability Engineering Session, July 6, 2010.
429. Hirohata, K., K. Hisano, M. Mukai, H. Aoki, C. Takubo, T. Kawakami, and M. Pecht, “Coupled Thermal-stress Analysis for FC-BGA Packaging Reliability Design,” IEEE Transactions on Components and Packaging Technologies, Vol. 33, No. 2, pp. 347–358, June 2010.
430. Sotiris, V., P. W. Tse, and M. Pecht, “Anomaly Detection through a Bayesian Support Vector Machine,” IEEE Transactions on Reliability, Vol. 59, No. 2, pp. 277–286, June 2010.
431. Huang, Y., R. Doraiwami, M. Osterman, and M. Pecht, “Energy Harvesting Using RF MEMS,” Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th, pp. 1353–1358, June 1–4, 2010.
432. Nie, L., M. Osterman, and M. Pecht, “Microstructural Analysis of Reworked Ball Grid Array Assemblies Under Thermomechanical Loading Conditions,” IEEE Transactions on Device and Materials Reliability, Vol. 10, No. 2, pp. 276–286, June 2010.
433. Cheng, S., M. Azarian, and M. Pecht, “Sensor Systems for Prognostics and Health Management,” Sensors, Vol. 10, pp. 5774–5797, June 2011.
434. He, X., M. Azarian, and M. Pecht, “A Study of the Effect of Solder Mask on Electrochemical Migration of Printed Circuit Board,” Proc. of IPC Apex Conf., Las Vegas, April 2010.
435. Alam, M., M. Azarian, M. Osterman, and M. Pecht, “Effect of Environmental Stress and Bias Conditions on Reliability of Embedded Planar Capacitors,” Proc. of IPC Apex Conf., Las Vegas, April 2010.
436. Gu, J., and M. Pecht, “Prognostics and Health Assessment Implementation for Electronic Products,” Journal of the IEST, Vol. 53, No. 1, pp. 44–58, April 2010.
437. Pecht, M., “A Prognostics and Health Management Roadmap for Information and Electronics-Rich Systems,” IEICE Fundamentals Review, Vol. 3, No. 4, pp. 25–32, April, 2010. Michael PECHT, "A Prognostics and Health Management for Information and Electronics-Rich Systems" , エレクトロニクス実装学会誌　Vol. 13, No. 7, pp. 484-492 (2010)
438. Wang, W., D. Banjevic, and M. Pecht, “A Multi-component and Multi-failure Mode Inspection Model based on the Delay Time Concept,” Reliability Engineering and System Safety, No. 95, pp. 912–920, April 2010.
439. Sood, B., R. Sanapala, D. Das, M. Pecht, C. Y. Huang, and M. Y. Tsai, “Comparison of Printed Circuit Board Property Variations in Response to Simulated Lead-free Soldering,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 33, No. 2, pp. 98–111, April 2010.
440. Pecht, M., and R. Jaai, “A Prognostics and Health Management Roadmap for Information and Electronics-rich System,” Microelectronics Reliability, Vol. 50, No. 3, pp. 317–323, March 2010.
441. Weininger, S., K. C. Kapur, and M. Pecht, “Exploring Medical Device Reliability and Its Relationship to Safety and Effectiveness,” IEEE Transactions on Components and Packaging Technologies, Vol. 33, No. 1, pp. 240–245, Mar. 2010.
442. Zhang, S., M. Osterman, A. Shrivastava, R. Kang, and M. Pecht, “The Influence of H2S Exposure on Immersion-Silver-Finished PCBs under Mixed-Flow Gas Testing,” IEEE Transactions on Device and Materials Reliability, Vol. 10, No. 1, pp. 571–581, March 2010; update of 2009 Int’l Conf. on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), Tsinghua University, Beijing, China, pp. 116–122, Aug. 10–13, 2009.
443. Challa, V., L. D. Lopez, M. Osterman, and M. Pecht, “Stress Relaxation Testing of Stamped Metal Land-Grid-Array Sockets,” IEEE Transactions on Device and Materials Reliability, Vol. 10, No. 1, pp. 55–61, March 2010.
444. Ma, L., B. Sood, and M. Pecht, “Effects of Moisture Content on Dielectric Constant and Dissipation Factor of Printed Circuit Board Materials,” ECS Transactions, Vol. 27, Iss. 1, pp. 227–236; China Semiconductor Technology Int’l Conf. 2010: Metrology, Reliability and Testing, Shanghai, China, March 18–19, 2010.
445. Fong, B., and M. Pecht, “Prognostics in Wireless Telecare Networks: A Perspective on Serving the Rural Chinese Population,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
446. Sun, B., S. Zeng, R. Kang, and M. Pecht, “Benefits Analysis of Prognostics in Systems,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
447. Niu, G., D. Anand, and M. Pecht, “Prognostics and Health Management for Energetic Materials Systems,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
448. Zhang, S., R. Kang, G. Niu, and M. Pecht, “Status of Research and Development on Prognostics and Health Management in China,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
449. Niu, G., D. Lau, and M. Pecht, “Improving Computer Manufacturing Management Through Lean Six Sigma and PHM,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
450. Wen, Z., H. Zuo, D. K. Lau, and M. Pecht, “Research on Electrostatic Monitoring Technology for Aero-engine Gas Path,” 2010 Prognostics & System Health Management Conf., Macau, China, pp. 1–5, Jan. 12–14, 2010.
451. Oh, H., M. Azarian, and M. Pecht, H. Clifford, R. Sohaney, and E. Rhem, “Physics-of-Failure Approach for Fan PHM in Electronics Applications,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
452. Niu, G., S. Singh, S. W. Holland, and M. Pecht, “Anomaly Detection of Notebook Computer Based on Weibull Decision Metrics,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
453. Dai, J., D. Das, and M. Pecht, “Prognostics-based Health Management for Free Air Cooling of Data Centers,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
454. Sun, J., H. Zuo, H. Yang, and M. Pecht, “Study of Ensemble Learning-based Fusion Prognostics,” 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12–14, 2010.
455. Kumar, S., E. Dolev, and M. Pecht, “Parameter Selection for Health Monitoring of Electronic Products,” Microelectronics Reliability, Vol. 50, pp. 161–168, 2010.
456. Woo, S. W., D. O’Neal, and M. Pecht, “Failure Analysis and Redesign of the Evaporator Tubing in a Kimchi Refrigerator,” Engineering Failure Analysis, Vol. 17, pp. 369–379, 2010.
457. Alam, M., M. Azarian, M. Osterman, and M. Pecht, “Effectiveness of Embedded Capacitors in Reducing the Number of Surface Mount Capacitors for Decoupling Applications,” Circuit World, Vol. 36, No. 1, pp. 22–30, 2010.
458. Woo, S. W., D. O’Neal, and M. Pecht, “Reliability Design of a Reciprocating Compressor Suction Reed Valve in a Common Refrigerator Subjected to Repetitive Pressure Loads,” Engineering Failure Analysis, Vol. 17, pp. 979–991, 2010.
459. Nie, L., M. Osterman, F. Song, J. Lo, S. W. Lee, and M. Pecht, “Solder Ball Attachment Assessment of Reballed Plastic Ball Grid Array Packages,” IEEE Transactions on Components and Packaging Technology, Vol. 32, No. 4, pp. 901–908, Dec. 2009.
460. Pecht, M., and L. Zuga, “China as Hegemon of the Global Electronics Industry: How It Got That Way and Why It Won’t Change,” Open Forum, IEEE Transactions on Components and Packaging Technology, Vol. 32, No. 4, pp. 935–939, Dec. 2009.
461. Yang, S., J. Wu, and M. Pecht, “Reliability Assessment of Land Grid Array Sockets Subjected to Mixed Flowing Gas Environment,” IEEE Transactions on Reliability, Vol. 58, No. 4, pp. 634–640, Dec. 2009.
462. Niu, G., D. Lau, and M. Pecht, “Lifetime Assessment of LED Lighting Based on Prognostics,” IEEE Electrical Design of Advanced Packaging and Systems Symposium, Hong Kong, Dec. 2–4, 2009.
463. George, E., D. Das, M. Osterman, and M. Pecht, “Physics of Failure Based Virtual Testing of Communication Hardware,” Proc. of ASME Int’l Mechanical Engineering Congress and Expo, Lake Buena Vista, FL, Nov. 13–19, 2009.
464. Oh, H., T. Shibutani, and M. Pecht, “Precursor Monitoring Approach for Reliability Assessment of Cooling Fans,” Journal of Intelligent Manufacturing, Vol. 23, No. 2, pp. 173–178, Nov. 2009.
465. Pecht, M., “Characterization of Lead-free Solder Interconnects Reliability Under Torsional Loads,” ASME Conf. IMECE, Nov. 2009.
466. Gu, J., D. Barker, and M. Pecht, “Health Monitoring and Prognostics of Electronics Subject to Vibration Load Conditions,” IEEE Sensors Journal, Vol. 9, No. 11, pp. 1479–1485, Nov. 2009.
467. Niu, G., M. Lu, D. Lau, and M. Pecht, “Prognostics-based Qualification for LED Lighting Systems,” 4th Int’l Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT 2009), Taipei, Taiwan, Oct. 21–23, 2009.
468. Wu, M. L., and M. Pecht “Semiconductor Component Qualification” Proceedings of the 4th International Microsystems, Packaging, Assembly and Circuits Technology (IMPACT) Conference, Taipei, Taiwan, Oct. 19–23, 2009.
469. Sanapala, R., B. Sood, D. Das, and M. Pecht, “Effect of Lead-free Soldering on Key Material Properties of FR-4 Printed Circuit Board Laminates,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 32, No. 4, pp. 272–280, Oct. 2009.
470. Weininger, S., and M. Pecht, “Exploring Medical Device Reliability and Its Relationship to Safety and Effectiveness,” IEEE Symposium on Product Compliance Engineering, Silver Spring, MD, Oct. 26–28, 2009.
471. Wang, W., A. Choubey, M. Azarian, and M. Pecht, “An Assessment of Immersion Silver Surface Finish for Lead-Free Electronics,” Journal of Electronic Materials, Vol. 38, No. 6, pp. 815–827, 2009.
472. Zhou, Y., and M. Pecht, “Investigation on Mechanism of Creep Corrosion of Immersion Silver Finished Printed Circuit Board by Clay Tests,” Proc. of 55th Annual IEEE Holm Conf., Vancouver, Canada, pp. 321–330, Sept. 14–16, 2009.
473. Sotiris, V., and M. Pecht, “Anomaly Prediction through Latent Variable Gaussian Process Models with SVM Mean Function Priors,” Proc. of Int’l Workshop on Structural Health Monitoring, Palo Alto, CA, Sept. 9–11, 2009.
474. Gu, J., N. Vichare, E. Tinsley, and M. Pecht, “Computer Usage Monitoring for Design and Reliability Tests,” IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 3, pp. 550–556, Sept. 2009.
475. Kumar, S., and M. Pecht, “Baseline Performance of Notebook Computers under Various Environmental and Usage Conditions for Prognostics,” IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 3, pp. 667–676, Sept. 2009.
476. Chauhan, P., M. Osterman, S. W. Lee, and M. Pecht, “Critical Review of the Engelmaier Model for Solder Joint Creep Fatigue Reliability,” IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 3, pp. 693–700, Sept. 2009.
477. Khuu, V., M. Osterman, A. Bar-Cohen, and M. Pecht, “Effects of Temperature Cycling and Elevated Temperature/Humidity on the Thermal Performance of Thermal Interface Materials,” IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 3, pp. 379–391, Sept. 2009.
478. Tsai, M. Y., H. Y. Chang, and M. Pecht, “Warpage Analysis of Flip-Chip PBGA Packages Subject to Thermal Loading,” IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 3, pp. 419–424, Sept. 2009.
479. Oh, H., T. Shibutani, and M. Pecht, “Identification of Failure Precursor Parameters for Cooling Fans,” ASME 2009 Int’l Design Engineering Technical Conference & Computers and Information in Engineering Conf. (IDETC/CIE 2009), San Diego, CA, Aug. 30–Sept. 2, 2009.
480. He, X., M. Azarian, and M. Pecht, “Comparative Assessment of Electrochemical Migration on PCBs with Lead-Free and Tin-Lead Solders,” SMT Online Magazine, (http:// www.ems007.com /pages/ zone.cgi?a= 52435&artpg= 2&topic=0) Aug. 18, 2009; also Proc. of APEX Expo, Las Vegas, NV, March 31–April 2, 2009.
481. Liu, Y., and M. Pecht, “Overview of China Medical Device Market and Governmental Regulatory Agency,” Materials and Processes for Medical Devices 2009, Minneapolis, MN, Aug. 10–12, 2009.
482. Cheng, S., L. Thomas, J. Cook, and M. Pecht, “A Radio Frequency Sensor System for Prognostics,” ASME/CIE 2009, San Diego, CA, Aug. 2009.
483. Sankavaram, C., B. Pattipati, A. Kodali, K. Pattipati, M. Azam, S. Kumar, and M. Pecht, “Model-based and Data-driven Prognosis of Automotive and Electronic Systems,” 5th Annual IEEE Conf. on Automation Science and Engineering, Bangalore, India, pp. 96–101, Aug. 22–25, 2009.
484. Cheng, S., and M. Pecht, “A Fusion Prognostics Method for Remaining Useful Life Prediction of Electronic Products,” 5th Annual IEEE Conf. on Automation Science and Engineering, Bangalore, India, pp. 102–107, Aug. 22-25, 2009.
485. Gu, J., D. Lau, and M. Pecht, “Health Assessment and Prognostics of Electronic Products - An Alternative Method of Product Life Cycle Cost Improvement,” IEEE Proc. of ICRMS, Chengdu, China, July 21–25, 2009.
486. Zhang, H., R. Kang, and M. Pecht, “Precursor Parameter Identification for Power Supply Prognostics and Health Management,” IEEE Proc. of ICRMS, Chengdu, China, July 21–25, 2009.
487. Zhou, Y., and M. Pecht, “Reliability Assessment of Immersion Silver Finished Circuit Board Assemblies Using Clay Test,” IEEE Proc. of ICRMS, Chengdu, China, July 21–25, 2009.
488. Zhang, S., R. Kang, A. Shrivastava, M. Osterman, and M. Pecht, “A Method of Reliability Assessment on Creep Corrosion for Immersion Silver Finished PCBs,” IEEE Proc. of ICRMS, Chengdu, China, July 21–25, 2009.
489. Niu, G., and M. Pecht, “A Framework of Cost-effective and Accurate Maintenance Combining CBM RCM and Data Fusion,” IEEE Proc. of ICRMS, Chengdu, China, July 21–25, 2009.
490. Lopez, L., and M. Pecht, “Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications,” IEEE Transactions on Reliability, Vol. 58, No. 2, pp. 264–270, June 2009.
491. Patil, N., J. Celaya, D. Das, K. Goebel, and M. Pecht, “Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics,” IEEE Transactions on Reliability, Vol. 58, No. 2, pp. 271–276, June 2009.
492. Qi, H., M. Osterman and M. Pecht, “A Rapid Life-Prediction Approach for PBGA Solder Joints Under Combined Thermal Cycling and Vibration Loading Conditions,” IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 2, pp. 283–292, June 2009.
493. Nie, L., J. Cai, M. Pecht, and R. Ciocci, “Environmental Regulations in Lead-free and Halogen-free Electronics,” Electronics & Packaging (in Chinese), Vol. 9, No. 6, pp. 42–47, June 2009.
494. Kwon, D., M. H. Azarian, and M. Pecht, “Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance,” IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 2, pp. 296–304, June 2009.
495. Pecht, M., “Impact of Rework on Reliability of Plastic Ball Grid Arrays Subjected to Mechanical Bend Test,” Proc. of Int’l Conf. on Soldering & Reliability (SMTA), Toronto, Canada, May 20–22, 2009.
496. George, E., D. Das, M. Osterman, and M. Pecht, “Reliability of SAC305 and Sn3.5Ag Solders during High Temperature Thermal Cycling,” Proc. of Int’l Conf. on Soldering & Reliability (SMTA), Toronto, Canada, May 20–22, 2009.
497. Kwon, D., M. H. Azarian, and M. Pecht, “Identification of Interconnect Failure Mechanisms Using RF Impedance Analysis,” Proc. of IEEE Signal Propagation on Interconnects, Strasbourg, France, May 2009.
498. Pecht, M., and J. Gu, “Physics-of-failure-based Prognostics for Electronic Products,” Transactions of the Institute of Measurement and Control, Vol. 31, No. 3/4, pp. 309–322, 2009.
499. Niu, G., D. Lau, and M. Pecht, “Prognostics and Health Management for Next Generation LED Lighting Systems,” Int’l J. of Condition Monitoring and Diagnostic Engineering Management, 2009.
500. Kwon, D., M. Azarian, and M. Pecht, “Detection of Solder Joint Failure Precursors on Tin-Lead and Lead-free Assemblies using RF Impedance Analysis,” IEEE 2009 Electronic Components and Technology Conference, San Diego, CA, pp. 663–667, May 26, 2009.
501. Shibutani, T., Q. Yu, and M. Pecht, “Tin Whisker Reliability in Microelectronics,” Micromaterials and Nanomaterials, No. 09, pp. 49–53, 2009.
502. Nie, L., M. Osterman, and M. Pecht, “Copper Pad Dissolution and Microstructure Analysis of Reworked Plastic Grid Array Packages in Lead-free and Mixed Assemblies,” Journal of Surface Mount Technology, Vol. 22, No. 2, pp. 13–20, 2009.
503. Woo, S. W., D. O’Neal, and M. Pecht, “Improving the Reliability of a Water Dispenser Lever in a Refrigerator Subjected to Repetitive Stresses,” Engineering Failure Analysis, Vol. 16, pp. 1597–1606, 2009.
504. Woo, S. W., D. O’Neal, and M. Pecht, “Design of a Hinge Kit System in a Kimchi Refrigerator Receiving Repetitive Stresses,” Engineering Failure Analysis, Vol. 16, pp. 1655–1665, 2009.
505. Gu J., and M. Pecht, “Health Assessment and Prognostics of Electronic Products: an Alternative to Traditional Reliability Prediction Methods,” Electronics Cooling, Vol. 15, No. 2, pp. 10–17, May 2009.
506. Woo, S. W., M. Pecht, and D. O’Neal, “Reliability Design and Case Study of a Refrigerator Compressor Subjected to Repetitive Loads,” Int’l J. of Refrigeration, Vol. 32, No. 3, pp. 478–486, May 2009.
507. Nie, L., M. Osterman, and M. Pecht, “Copper Pad Dissolution and Microstructure Analysis of Reworked Plastic Grid Array Assemblies,” S08-01, IPC APEX 2009, Las Vegas, NV , March 31–April 2, 2009.
508. Oh, H., T. Shibutani, and M. Pecht, “Precursor Monitoring Approach for Reliability Assessment of Cooling Fans,” Proc. of Int’l Conf. of Electronics Packaging, Kyoto, Japan, April 2009.
509. Lopez, L.D., V. Challa, and M. Pecht, “Assessing the Reliability of Elastomer Sockets in Temperature Environments,” IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 1, pp. 80–86, March 2009.
510. Shibutani, T., M. Osterman, and M. Pecht, “Standards for Tin Whisker Test Methods on Lead-Free Components,” IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 1, pp. 216–219, March 2009.
511. Kumar, S., E. Dolev, M. Pompetzki, and M. Pecht, “A Residual Estimation Based Approach for Isolating Faulty Parameters,” IEEE Aerospace Conference, Big Sky, MT, March 7–14, 2009.
512. Pecht, M. and J. Gu, “Prognostics-based Product Qualification,” IEEE Aerospace Conference, Big Sky, MT, March 7–14, 2009.
513. Woo, S.W., D. Ryu and M. Pecht, “Design Evaluation of a French Refrigerator Drawer System Subjected to Repeated Food Storage Loads,” Engineering Failure Analysis, Vol. 16, pp. 2224–2234, March 2009.
514. Mathew, S., M. Osterman, M. Pecht, and F. Dunlevey, “Evaluation of Pure Tin Plated Copper Alloy Substrates for Tin Whiskers,” Circuit World, Vol. 35, No. 1, pp. 3–8, 2009.
515. Elerath, J.G., and M. Pecht, “A Highly Accurate Method for Assessing Reliability of Redundant Arrays of Inexpensive Disks (RAID),” IEEE Transactions on Computers, Vol. 58, No. 3, pp. 289–299, March 2009.
516. Nie, L., M. Osterman, M. Pecht, F. Song, J. Lo, and S.W. Lee, “Solder Ball Attachment Assessment of Reballed Plastic Ball Grid Array Packages,” Equipment for Electronic Products Manufacturing (in Chinese), pp. 1–5, Feb. 2009.
517. Qi, H., M. Osterman, and M. Pecht, “Design of Experiments for Board-Level Solder Joint Reliability of PBGA Package under Various Manufacturing and Multiple Environmental Loading Conditions,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 32, No. 1, pp. 32–40, Jan. 2009.
518. Alam, M., M. Azarian, M. Osterman, and M. Pecht, “Reliability of Embedded Planar Capacitors under Temperature and Voltage Stress,” Capacitor and Resistor Symposium, Jacksonville, FL, 2009.
519. Kumar, S., V. Sotiris, and M. Pecht, “Health Assessment of Electronic Products using Mahalanobis Distance and Projection Pursuit Analysis,” Int’l Journal of Computer, Information, and Systems Sciences, and Engineering, Vol. 2, No.4, pp. 242–250, Fall 2008.
520. Shibutani, T., Q. Yu, M. Shiratori, and M. Pecht, “Pressure-induced Tin Whisker Formation,” Microelectronics Reliability, Vol. 48, pp. 1033–1039, 2008.
521. Woo, S.W., D. O’Neal, and M. Pecht, “Improving the Reliability of a Water Dispenser Lever in a Refrigerator Subjected to Repetitive Stresses,” Engineering Failure Analysis, Vol. 15, No. 8, Nov. 2008.
522. R. Sanapala, B. Sood, D. Das, M. Pecht, C. Y. Huang, and M. Y. Tsai, “Effect of Lead-free Soldering on Key Material Properties of FR-4 Printed Circuit Board Laminates,” Int’l Microsystems, Packaging, Assembly and Circuits Technology Conf. (EMAP), Taipei, Taiwan, Oct. 24, 2008.
523. Lopez, L., and M. Pecht, “Maxima-SPRT Methodology for Health Monitoring of Contact Resistance in IC Sockets,” 1st Int’l. Conf. on Prognostics and Health Management, Denver, CO, Oct. 6–9, 2008.
524. Michael, A. T., S. Kumar, S. Mathew, and M. Pecht, “Anomaly Detection in Electronic Products,” 2nd Electronics System-Integration Technology Conference, London, UK, Sept. 1–4, 2008.
525. Matkowski, P., K. Urbański, T. Fałat, J. Felba, Z. Żaluk, R. Zwierta, A. Dasgupta, and M. Pecht, “Application of FPGA Units in Combined Temperature Cycle and Vibration Reliability Tests of Lead-free Interconnections,” 2nd Electronics System Integration Technology Conference, London-Greenwich, UK, pp. 1375–1379, 2008.
526. Lantz, L., M. Pecht, and M. Wood, “The Measurement of Ion Diffusion in Epoxy Molding Compounds by Dynamic Secondary Ion Mass Spectroscopy,” IEEE Transactions on Components and Packaging Technologies, Vol. 31, No. 3, pp. 527–535, Sept. 2008.
527. Han, S., K. Kim, C. Yu, M. Osterman, and M. Pecht, “Observations of the Spontaneous Growth of Tin Whiskers in Various Reliability Conditions,” Proc. of 58th Electronic Components and Technology Conf. 2008, Orlando, FL, pp. 1484–1490, 2008.
528. Singh, R., and M. Pecht, “Commercial Impact of Silicon Carbide- Opportunities and Challenges in Realizing the Full Potential of SiC Power Devices,” IEEE Industrial Electronics Magazine, pp. 19–31, Sept. 2008.
529. Lopez, L. and M. Pecht, “Assessing the Operating Temperature and Relative Humidity Environment of IC Sockets in Enterprise Servers,” 1st Int’l. Conf. on Prognostics and Health Management, Denver, CO, Oct. 6–9, 2008.
530. Yang, D., Y. C. Chan, B. Y. Wu, and M. Pecht, “Electromigration and Thermomigration Behavior of Flip Chip Solder Joints in High Current Density Packages,” Journal of Materials Research, Vol. 23, No. 9, pp. 2333–2339, Sept. 2008.
531. Pecht, M., “Solder Ball Attachment Assessment of Reballed Plastic Ball Grid Array Packages,” IPC Midwest Expo, Schaumberg, IL, Sept. 24, 2008.
532. Woo, S., and M. Pecht, “Failure Analysis and Redesign of a Helix Upper Dispenser,” Engineering Failure Analysis, Vol. 15, No. 6, pp. 642–653, Sept. 2008.
533. Choubey, A., H. Yu, M. Osterman, M. Pecht, F. Yun, L. Yonghong, and X. Ming, “Intermetallics Characterization of Lead-free Solder Joints under Isothermal Aging,” Journal of Electronic Materials, Vol. 37, No. 8, pp. 1130–1138, Aug. 2008.
534. Patil, N., D. Das, K. Goebel, and M. Pecht, “Failure Precursors for Insulated Gate Bipolar Transistors (IGBTs),” Proc. of the 9th Int’l. Seminar on Power Semiconductors, Prague, August 26–29, 2008.
535. Qi, H., M. Osterman, and M. Pecht, “Modeling of Combined Temperature Cycling and Vibration Loading on PBGA Solder Joints Using an Incremental Damage Superposition Approach,” IEEE Transactions on Advanced Packaging, Vol. 31, No. 3, pp. 463–472, August 2008.
536. Wang, W., M. Azarian, and M. Pecht, “Qualification for Product Development,” Proc. of Int’l Conf. on Electronic Packaging Technology & High Density Packaging, Shanghai, China, pp. 1–12, July 2008.
537. Zhang, S., R. Kang, X. He, and M. Pecht, “China’s Efforts in Prognostics and Health Management,” Open Forum, IEEE Transactions on Components and Packaging Technologies, Vol. 31, No. 2, pp. 509–518, June 2008.
538. Qi, H., N. Vichare, M. Azarian, and M. Pecht, “Analysis of Solder Joint Failure Criteria and Measurement Techniques in the Qualification of Electronic Products,” IEEE Transactions on Components and Packaging Technologies, Vol. 31, No. 2, pp. 469–477, June 2008.
539. Qi, H., Q. Zhang, E. Tinsley, M. Osterman, and M. Pecht, “High Cycle Cyclic Torsion Fatigue of PBGA Pb-Free Solder Joints,” IEEE Transactions on Components and Packaging Technologies, Vol. 31, No. 2, pp. 309–314, June 2008.
540. Zhan, S., M. Azarian, and M. Pecht, “Reliability of Printed Circuit Boards Processed Using No-clean Flux Technology in Temperature-Humidity-Bias Conditions,” IEEE Transactions on Device and Materials Reliability, Vol. 8, No. 2, pp. 426–434, June 2008.
541. Pecht, M., “Health Monitoring, Diagnostics and Prognostics of Electronic Products,” Proc. of the 2008 Int’l Conference on Electronics Packaging, Tokyo, Japan, pp. 203–208, June 11, 2008.
542. Kumar, S., M. Torres, Y. Chan, and M. Pecht, “A Hybrid Prognostics Methodology for Electronic Products,” Proc. of IEEE WCCI, Hong Kong, June 1, 2008; also Int’l. Joint Conf. on Neural Networks (IJCNN), 2008.
543. Cheng, S., M. Torres, L. Thomas, and M. Pecht, “Autonomous Prognostic Monitoring Device,” Proc. of the 62nd Meeting of the Society for Machinery Failure Prevention Technology, Virginia Beach, VA, pp. 505–516, May 2008.
544. Kwon, D., M. Azarian, and M. Pecht, “Effect of Solder Joint Degradation on RF Impedance,” Proc. of 12th IEEE Workshop on Signal Propagation on Interconnect, Avignon, France, pp. 1–4, 2008.
545. Kwon, D., M. Azarian, and M. Pecht, “Detection of Solder Joint Degradation Using RF Impedance Analysis,” Proc. of IEEE Electronic Components and Technology Conference, Lake Buena Vista, FL, pp. 606–610, May 29, 2008.
546. Qi, H., S. Ganesan, and M. Pecht, “No-Fault-Found and Intermittent Failures in Electronic Products,” Microelectronics Reliability, Vol. 48, No. 5, pp. 663–674, May 2008.
547. Gu, J., Barker D., and M. Pecht, “Prognostics of Electronics under Vibration Using Acceleration Sensors,” Proc. for 62nd Meeting of the Society for Machinery Failure Prevention Technology (MFPT), Virginia Beach, VA, pp. 253–263, May 2008.
548. Zhou, Y., and M. Pecht, “Electronics,” Industry Overview, China Economic Review’s China Business Guide 2008, pp. 168–172, 2008.
549. Pecht, M., “Semiconductors,” Industry Overview, China Economic Review’s China Business Guide 2008, pp. 224–228, 2008.
550. Keimasi, M., M. Azarian, and M. Pecht, “Flex Cracking of Multilayer Ceramic Capacitors Assembled with Pb-Free and Tin-Lead Solders,” IEEE Transactions on Device and Materials Reliability, Vol. 8, No. 1, pp. 182–192, March 2008.
551. Kumar, S., V. Sotiris, and M. Pecht, “Mahalanobis Distance and Projection Pursuit Analysis for Health Assessment of Electronic Systems,” IEEE Aerospace Conference, Big Sky, Montana, March 2008.
552. Choubey, A., M. Osterman, and M. Pecht, “Microstructure and Intermetallic Formation in SnAgCu BGA Components Attached with SnPb Solder Under Isothermal Aging,” IEEE Transactions on Device and Materials Reliability, Vol. 8, No. 1, pp. 160–167, March 2008.
553. Wang, W., Y. C. Chen, and M. Pecht, “Anisotropic Conductive Adhesives for Flip-chip Interconnects,” Journal of Adhesion Science & Technology, Vol. 22, No. 8–9, pp. 871–892, 2008.
554. Kumar, S., and M. Pecht, “Data Analysis Approach for System Reliability, Diagnostics, and Prognostics,” Pan Pacific Microelectronics Symposium, Hawaii, Jan. 22–24, 2008.
555. Vichare, N., P. Rodgers, V. Eveloy, and M. Pecht, “Environment and Usage Monitoring of Electronic Products for Health Assessment and Product Design,” Quality Technology & Quantitative Management, Vol. 4, No. 2, pp. 235–250, 2007.
556. Deng Y., M. Pecht, J. Swift, and S. J. Wallace, “Carbon Fiber-Based Grid Array Interconnects,” IEEE Transactions on Components and Packaging Technologies, Vol. 30, No. 4, pp. 716–723, Dec. 2007.
557. Gu, J., D. Barker and M. Pecht, “Prognostics Implementation of Electronics under Vibration Loading,” Microelectronics Reliability, Vol. 47, No. 12, pp. 1849–1856, Dec. 2007.
558. Keimasi, M., M. Azarian, and M. Pecht, “Isothermal Aging Effects on Flex Cracking of Multilayer Ceramic Capacitors with Standard and Flexible Terminations,” Microelectronics Reliability, Vol. 47, No. 12, pp. 2215–2225, Dec. 2007.
559. Kostoff, R. N., M. Briggs, R. L. Rushenberg, C. Bowles, M. Pecht, D. Johnson, S. Bhattacharya, A. Icenhour, K. Nikodym, R. Barth, and S. Dodbele, “Comparison of the Structure and Infrastructure of Chinese and Indian Science and Technology,” Science Direct, Vol. 74, No. 9, pp. 1609–1630, Nov. 2007.
560. Kostoff, R. N., M. Briggs, R. L. Rushenberg, C. Bowles, A. Icenhour, K. Nikodym, R. Barth, and M. Pecht, “Chinese Science and Technology- Structure and Infrastructure,” Science Direct, Vol. 74, No. 9, pp. 1539–1573, Nov. 2007.
561. Kostoff, R. N., S. Bhattacharya, and M. Pecht, “Assessment of China’s and India’s Science and Technology Literature,” Technological Forecasting and Social Change, Science Direct, Vol. 74, No. 9, pp. 1519–1538, Nov. 2007.
562. Kumar, S., and M. Pecht, “Health Monitoring of Electronic Products Using Symbolic Time Series Analysis,” AAAI Fall Symp. on Artificial Intelligence for Prognostics, Arlington, VA, pp. 73–80, Nov. 2007.
563. Cheng, S., and M. Pecht, “Multivariate State Estimation Technique for Remaining Useful Life Prediction of Electronic Products,” AAAI Fall Symp. On Artificial Intelligence for Prognostics, Arlington, VA, pp. 73–80, Nov. 2007.
564. Matkowski, P., K. Urbanski, T. Falat, J. Felba, Z. Zaluk, A. Dasgupta, and M. Pecht, “Combined Temperature Cycle and Vibration Reliability Test of Lead-free Interconnections - Event Detection,” Proc. Int’l Congress on Microreliablity and Nanoreliablity, Berlin, Germany, Sept. 2007.
565. Gu, J., and M. Pecht, “New Methods to Predict Reliability of Electronics,” Proc. of ICRMS 2007, Beijing, China, pp. 453–464, August 2007.
566. Elerath, J., and M. Pecht, “Enhanced Reliability Modeling of RAID Storage Systems,” Dependable Storage Networks Symposium (DSN ’07), Edinburgh, Scotland, pp. 175–184, June 25–28, 2007.
567. Mathew, S., M. Osterman, T. Shibutani, Q. Yu, and M. Pecht, “Tin Whiskers; How to Manage and Mitigate the Risks,” Proc. of the Int’l Sym. on High Density Packaging and Microsystems Integration (HDP ’07), Shanghai, China, pp. 1–8, June 2007.
568. Qi, H., M. Osterman, and M. Pecht, “Plastic Ball Grid Array Solder Joint Reliability for Avionics Applications,” IEEE Transactions on Components and Packaging Technologies, Vol. 30, No. 2, pp. 242–247, June 2007.
569. Tiku, S., M. Azarian, and M. Pecht, “Using a Reliability Capability Maturity Model to Benchmark Electronics Companies,” Int’l. Journal of Quality & Reliability Management, Vol. 24, No. 5, pp. 547–563, 2007.
570. Qi, H., G. Plaza, S. Ganesan, M. Osterman, and M. Pecht, “Reliability Assessment on Insertion Mount Assembly under Vibration Conditions,” Proc. of 2007 Electronic Components and Technology Conference, Reno, NV, pp. 407–414, May, 2007.
571. Osterman, M., M. Pecht, and D. Das, “Impact of RoHS Legislations on National Security,” IMAPS Workshop on Military, Aerospace, Space, and Homeland Security: Packaging Issues and Applications (MASH 2007), Baltimore, MD, May 2007.
572. Tuchband, B., S. Cheng, and M. Pecht, “Technology Assessment of Sensor Systems for Prognostics and Health Monitoring,” IMAPS Workshop on Military, Aerospace, Space, and Homeland Security: Packaging Issues and Applications (MASH 2007), Baltimore, MD, May 2007.
573. Das, D., K. Chatterjee, M. Pecht, and J. Stradley, “A Case against Buying from Part Brokers,” IMAPS Workshop on Military, Aerospace, Space, and Homeland Security: Packaging Issues and Applications (MASH 2007), Baltimore, MD, May 2007.
574. Chatterjee, K., D. Das, M. Pecht, and M. Sosnowski, “Counterfeit Detection through Inspection,” IMAPS Workshop on Military, Aerospace, Space, and Homeland Security: Packaging Issues and Applications (MASH 2007), Baltimore, MD, May 2007.
575. Das, D., M. Pecht, C. Ricci, P. Suorsa, and D. Pinsky, “Demonstration of an Authentication Technique on an International Supply Chain,” IMAPS Workshop on Military, Aerospace, Space, and Homeland Security: Packaging Issues and Applications (MASH 2007), Baltimore, MD, May 2007.
576. Gu, J., N. Vichare, T. Tracy, and M. Pecht, “Prognostics Implementation Methods for Electronics,” 53rd Annual Reliability & Maintainability Symposium (RAMS), FL, pp. 101–106, Jan. 2007.
577. Nie, L., M. Pecht, and R. Ciocci, “Regulations and Market Trends in Lead-free and Halogen-free Electronics,” Circuit World, Vol. 33, No. 2, pp. 4–9, 2007.
578. Mathew, S., D. Das, M. Osterman, M. Pecht, J. Clayton, and R. Ferebee, “Virtual Remaining Life Assessment of Electronic Hardware Subjected to Shock and Random Vibration Life Cycle Loads,” Journal of the IEST, Vol. 50, No. 1, pp. 86–97, April 2007.
579. Sengupta, S., D. Das, S. Ganesan, W. Rollins, D. Pinsky, T. Lin, and M. Pecht, “Assessment of Thermomechanical Damage of Electronic Parts Due to Solder Dipping as a Post-Manufacturing Process,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 30, No. 2, pp. 128–137, April 2007.
580. Tuchband, B., and M. Pecht, “The Use of Prognostics in Military Electronic Systems,” Proc. of the 32nd GOMAC Tech Conference, Lake Buena Vista, FL, pp. 157–160, March 2007.
581. Fang, T., S. Mathew, M. Osterman, and M. Pecht, “Assessment of Risk Resulting from Unattached Tin Whisker Bridging,” Circuit World, Vol. 33, No. 1, pp. 5–8, 2007.
582. Yang, S., J. Wu, D. Tsai, and M. Pecht, “Contact Resistance Estimation for Time-Dependent Silicone Elastomer Matrix of Land Grid Array Socket,” IEEE Transactions on Components and Packaging Technologies, Vol. 30, No. 1, pp. 81–85, March 2007.
583. Eveloy, V., Y. Hwang, and M. Pecht, “The Effect of Electrostatic Discharge on Electrical Overstress Susceptibility in a Gallium Arsenide MESFET-Based Device,” IEEE Transactions on Device and Materials Reliability, Vol. 7, No. 1, pp. 200–208, March 2007.
584. Zhang, G., C. Kwan, R. Xu, N. Vichare, and M. Pecht, “An Enhanced Prognostic Model for Intermittent Failures in Digital Electronics,” 2007 IEEE Aerospace Conference, pp. 1–8, Big Sky, MT, March 2007.
585. Choubey, A., M. Osterman, M. Pecht, and D. Hillman, “Durability of Repaired and Aged Lead-free Electronic Assemblies,” IPC Printed Circuits Expo, APEX, and Designers Summit, Los Angeles, CA, Feb. 18–22, 2007.
586. Chatterjee, K., D. Das, M. Pecht, C. Ricci, and P. Suorsa, “Solving the Counterfeit Electronics Problem,” Proc. of the Pan Pacific Microelectronics Symp., pp. 294–300, Feb. 1, 2007.
587. Fukuda, Y., M. Osterman, and M. Pecht, “The Impact of Electrical Current, Mechanical Bending, and Thermal Annealing on Tin Whisker Growth,” Microelectronics Reliability, Vol. 47, No. 1, pp. 88–92, Jan. 2007.
588. Fukuda, Y., M. Osterman, and M. Pecht, “Length Distribution Analysis for Tin Whisker Growth,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 30, No. 1, pp. 36–40, Jan. 2007.
589. Sotiris, V., and M. Pecht, “Support Vector Prognostics Analysis of Electronic Products and Systems,” Association for the Advancement of Artificial Intelligence, pp. 120–127, 2007.
590. Song, F., S.W. Lee, M. Osterman, and M. Pecht, “Investigation of the Effect of PCB Base Materials and Pad Surface Finish on the Thermal Fatigue Life of Lead-free Solder Joints of PBGA and Passive Resistors,” 8th Int’l. Conf. on Electronic Materials and Packaging, Hong Kong, pp. 106–112, Dec. 11–14, 2006.
591. Mathew, S., M. Osterman, and M. Pecht, “Tin Whisker Bridging Across Electrical Conductors,” Proc. of 2nd Int’l. Eco-electronics Conf., Beijing, China, pp. 17–20, Dec. 7–8, 2006.
592. Zhao, P., M. Pecht, S. Kang, and S. Park, “Assessment of Ni/Pd/Au-Pd and Ni/Pd/Au-Ag Preplated Leadframe Packages Subject to Electrochemical Migration and Mixed Flowing Gas Tests,” IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 4, pp. 818–826, Dec. 2006.
593. Deng Y., M. Pecht, and K. Rogers, “Analysis of Phosphorus Flame Retardant Induced Leakage Currents in IC Packages Using SQUID Microscopy,” IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 4, pp. 804–808, Dec. 2006.
594. Mathew, S., D. Das, M. Osterman, M. Pecht, and R. Ferebee, “Prognostics Assessment of Aluminum Support Structure on a Printed Circuit Board,” Journal of Electronic Packaging, Vol. 128, pp. 339–345, Dec. 2006.
595. Zhan, S., M. Azarian, and M. Pecht, “Surface Insulation Resistance of Conformally Coated Printed Circuit Boards Processed with No-Clean Flux,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 29, No. 3, pp. 217–223, July 2006.
596. Fukuda Y., M. Osterman, and M. Pecht, “The Effect of Annealing on Tin Whisker Growth”, IEEE Transactions on Electronic Packaging Manufacturing, Vol. 29, No. 4, pp. 252–258, Oct. 2006.
597. Liu, Y., and M. Pecht, “Reduction of Skin Stretch Induced Motion Artifacts in Electrocardiogram Monitoring Using Adaptive Filtering,” 28th International Conference of the IEEE Engineering in Medicine and Biology Society, New York, Aug 30 to Sept 3, 2006, pp. 6045–6048.
598. Pecht, M., “Establishing a Relationship between Warranty and Reliability,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 29, No. 3, pp. 184–190, July 2006.
599. Rogers, K., and M. Pecht, “A Variant of Conductive Filament Formation Failures in PWBs with 3 and 4 mil Spacings,” Circuit World, Vol. 32, No. 3, pp. 11–18, 2006.
600. Wu, J., and M. Pecht, “Contact Resistance and Fretting Corrosion of Lead-Free Alloy Coated Electrical Contacts,” IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 2, pp. 402–410, June 2006.
601. Huang, Y., D. Bigio, and M. Pecht, “Investigation of the Size and Spatial Distribution of Fillers in Mold Compounds after Device Packaging,” IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 2, pp. 364–370, June 2006.
602. Pecht, M., and S. Tiku, “Bogus! Electronic Manufacturing and Consumers Confront a Rising Tide of Counterfeit Electronics,” IEEE Spectrum, Vol. 45, No. 5, pp. 37–46, May 2006.
603. Eveloy, V., Y. Liu, and M. Pecht, “Developments in Ambulatory Electrocardiography,” Biomedical Instrumentation & Technology, Vol. 40, No. 3, pp. 238–245, May/June 2006.
604. Fang T., S. Mathew, M. Osterman, and M. Pecht, “Assessing Tin Whisker Risk in Electronic Products”, SMT Magazine, PennWell, Vol. 20, No. 5, pp. 24–25, May 2006.
605. Vichare, N. M., P. Rodgers, and M. Pecht, “Methods for Binning and Density Estimation of Load Parameters for Prognostics and Health Management,” Int’l. Journal of Performability Engineering, Vol. 2, No. 2, pp. 149–161, April 2006.
606. Donahoe, D., M. Pecht, I. K. Lloyd, and S. Ganesan, “Moisture Induced Degradation of Multilayer Ceramic Capacitors,” Microelectronics Reliability, Vol. 46, pp. 400–408, April 2006.
607. Pecht, M., and D. Humphrey, “Uprating of Electronic Parts to Address Obsolescence,” Microelectronics International, Vol. 23, No. 2, pp. 32–36, 2006.
608. Ciocci, R., and M. Pecht, “Impact of Environmental Regulations on Green Electronics Manufacture,” Microelectronics International, Vol. 23, No. 2, pp. 45–50, 2006.
609. Choubey A., D. Menschow, S. Ganesan, and M. Pecht, “Effect of Aging on Pull Strength of SnPb, SnAgCu, and Mixed Solder Joints in Peripheral Surface Mount Components,” Journal of SMT, Vol. 19, No. 2, pp. 33–37, April–June 2006.
610. Fang T., M. Osterman, and M. Pecht, “Statistical Analysis of Tin Whisker Growth,” Microelectronics Reliability, Vol. 46, No. 5–6, pp. 846–849, May–June, 2006.
611. Vichare, N., and M. Pecht, “Prognostics and Health Management of Electronics,” IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 1, pp. 222–229, March 2006.
612. Ganesan S., and M. Pecht, “Open Trace Defects in FR4 Printed Circuit Boards,” Circuit World, Vol. 32, No. 1, pp. 3–7, 2006.
613. Pecht, M., and Y. Deng, “Electronic Device Encapsulation Using Red Phosphorus Flame Retardants,” Microelectronics Reliability, Vol. 46, No. 1, pp. 53–62, January, 2006; update of Deng, Y., and M. Pecht, “The Story Behind the Red Phosphorus Mold Compound Device Failures,” Proc. of 2005 Int’l. Sym. on Electronics Materials and Packaging (EMAP 2005), Tokyo, Japan, pp. 1–5, Dec. 11–14, 2005.
614. Zeng S.-K., M. G. Pecht, and J. Wu, “Status and Perspectives of Prognostics and Health Management Technologies,” Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica, Vol. 26, No. 5, pp. 626–632, 2005.
615. Eveloy, V., S. Ganesan, Y. Fukuda, J. Wu, and M. Pecht, “Are You Ready for Lead-Free Electronics?” IEEE Transactions on Components and Packaging Technologies, Vol. 28, No. 4, pp. 884–894, Sept. 2005.
616. Tiku, S., A. Veneruso, R. Etchells, and M. Pecht, “Risk Factors in Oil and Gas Well Electronics Compared to Other Electronic Industries,” Oil & Gas Science and Technology - Institut Français du Petrole, Rev. IFP, Vol. 60, No. 4, pp. 721–730, 2005.
617. Eveloy, V., S. Ganesan, Y. Fukuda, J. Wu, and M. Pecht, “WEEE, RoHS, and What You Must Do To Get Ready For Lead-free Electronics,” Proc. of 41st Int’l. Conf. on Microelectronics, Devices and Materials and the Workshop on Green Electronics, Slovenia, pp. 29–45, Sept. 15, 2005; update of Proc. of 2005 6th Int’l. Conf. on Electronics Packaging Technology, Shenzhen, China, pp. 27–44, Aug. 31, 2005.
618. Ganesan, S., G. Kim, J. Wu, M. Pecht, R. Lee, J. Lo, Y. Fu, Y. Li, M. Xu, and J. Felba, “Solder Joint Defects of PBGs after Lead-free Assembly,” 15th European Microelectronics and Packaging Conference & Exhibition, Brugge, pp. 63–68, 2005.
619. Urbanski K., T. Falat, J. Felba, S. Ganesan, and M. Pecht, “A Novel Test Data Acquisition System for Vibration Testing of Printed Circuit Board Assemblies,” 15th European Microelectronics and Packaging Conference & Exhibition, Brugge, pp. 178–183, 2005.
620. Ganesan, S., G. Kim, J. Wu, M. Pecht, and J. Felba, “Lead-free Assembly Defects in Plastic Ball Grid Array Package,” 5th Int’l. IEEE Conference on Polymers and Adhesives in Microelectronic and Photonics, Wroclaw, pp. 219–223, 2005.
621. Qi, H., S. Ganesan, J. Wu, M. Pecht, P. Matkowski, and J. Felba, “Effects of Printed Circuit Board Materials on Lead-free Interconnect Durability,” Proc. of Polytronic 2005, Wroclaw, Poland, pp. 140–144, October 23–26, 2005.
622. Pecht, M., A. Ramakrishnan, J. Fazio, and C. E. Nash, “The Role of U.S. National Highway Traffic Safety Administration in Automotive Electronics Reliability and Safety Assessment,” IEEE Transactions on Components and Packaging Technologies, Vol. 28, No. 3, pp. 571–580, Sept. 2005.
623. Liu, Y., V. Eveloy, and M. Pecht, “Non-invasive Electrocardiogram and Blood Pressure Monitors for Cardiovascular Disease,” Proc. of the 38th Int’l Symp. on Microelectronics, Philadelphia, PA, Sept. 25–29, 2005.
624. Tao, J., and M. Pecht, “Outsourcing to China,” Proc. of IMAPS Nordic Conf., Tonsberg, Norway, pp. 2–17, Sept. 11–14, 2005.
625. Huang, Y., S. Zhan, D. Bigio, and M. Pecht, “Distribution of a Minor Solid Constituent in a Transfer Molded e-Pad Leadframe Package,” IEEE Transactions on Components and Packaging Technologies, Vol. 28, No. 3, pp. 549–554, Sept. 2005.
626. Zhan, S., M. Azarian, and M. Pecht, “Reliability Issues of No-Clean Flux Technology with Lead-free Solder Alloy for High Density Printed Circuit Boards,” Proc. of 38th International Symp. on Microelectronics, Philadelphia, PA, pp. 367–375, Sept. 25–29, 2005.
627. Zhao, P., and M. Pecht, “Mixed Flowing Gas Studies of Creep Corrosion on Plastic Encapsulated Microcircuit Packages with Noble Metal Pre-Plated Leadframes,” IEEE Transactions on Device and Materials Reliability, Vol. 5, No. 2, pp. 268–276, June 2005.
628. Eveloy, V., Y. Fukuda, S. Ganesan, J. Wu, and M. Pecht, “Key Concerns in the Assembly of Lead-free Electronics,” Proc. of IMAPS Taiwan 2005 Int’l. Technical Symp., Taiwan, pp. 167–183, June 2005. 
629. Donahoe, D., and M. Pecht, “New Aging Mechanism in Multilayer Ceramic Capacitators,” Advanced Packaging, June 2005.
630. Lin, T. Y., M. Pecht, D. Das, J. Pan, and W. Zhu, “The Evaluation of Copper Migration During the Die Attach Curing and Second Wire Bonding Process,” IEEE Transactions on Components and Packaging Technologies, Vol. 28, No. 2, pp. 337–344, June 2005.
631. Liu, Y., P. E. Campbell, D. Das, and M. Pecht, “Chinese Intellectual Property and Contractual Challenges,” Proc. of 2005 Int’l. Conf. on Electronics Packaging (ICEP), Tokyo, Japan, pp. 241–246, April 13–15, 2005.
632. Rodgers, P., V. Eveloy, and M. Pecht, “Extending the Limits of Air-Cooling in Microelectronic Equipment,” Proc. of 6th Int’l. Conf. On Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, EuroSimE, pp. 695–702, April 2005.
633. Eveloy, V., Y. Liu, and M. Pecht, “Heart Sound Measurement and Analysis in Cardiovascular Disease Assessment,” Proc. of the SMTA 2005 Medical Electronics Symp., Minneapolis, MN, April 25–27, 2005.
634. Ganesan S., J. Wu, M. Pecht, R. Lee, J. Lo, Y. Fu, Y. Li, and M. Xu, “Assessment of Long-term Reliability in Lead-free Assemblies,” 2005 Int’l. Conf. on Asian Green Electronics, Pudong, Shanghai, China, pp. 140–155, March 17, 2005; update of S. Ganesan, J. Wu, M. Pecht, et al., “Long-term Reliability Assessment of Lead-free Soldered Electronics,” IPC and HKPCA 2004 Int’l. Printed Circuit & Electronics Assembly Fair, Dongguan, China, Dec. 8–10, 2004; update of S. Ganesan, J. Wu, M. Pecht, et al., “Long-term Reliability Assessment of Lead-free Soldered Electronics,” IPC, CEPEA and CEAC 2004 Int’l. Conf. on Lead Free Electronics, Shanghai, China, Nov. 2004.
635. Lin, T. Y., D. Das, M. Pecht, K. C. Teo, W. H. Zhu, X. Dong, and D. Guanghong, “The Impact of SMD Post Baking Process on the Yield of Printed Circuit Board Assemblies,” Proc. of 6th 2004 Electronics Packaging Technology Conf., pp. 224–230, 2004.
636. Vichare, N., P. Rodgers, V. Eveloy, and M. Pecht, “In Situ Temperature Measurement of a Notebook Computer - A Case Study in Health and Usage Monitoring of Electronics,” IEEE Transactions on Devices and Materials Reliability, Vol. 4, No. 4, pp. 658–663, Dec. 2004.
637. Eveloy, V., P. Rodgers and M. Pecht, “Reliability of Pressure-Sensitive Adhesive Tapes for Heat Sink Attachment in Air-Cooled Electronic Assemblies,” IEEE Transactions on Devices and Materials Reliability, Vol. 4, No. 4, pp. 650–657, Dec. 2004.
638. Pecht, M., Y. Fukuda, and S. Rajagopal, “The Impact of Lead-free Legislation Exemptions on the Electronics Industry,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 27, No. 4, pp. 221–232, Oct. 2004.
639. Murray S., C. Hillman, and M. Pecht, “Environmental Aging and De-adhesion of Polyimide Dielectric Films,” Journal of Electronic Packaging, Vol. 126, pp. 390–397, Sept. 2004.
640. Vichare, N., P. Rodgers, M. Azarian, and M. Pecht, “Application of Health Monitoring to Product Take-back,” Proc. of Electronics Goes Green (EGG) Conf., Berlin, Germany, pp. 945–951, Sept. 6–8, 2004.
641. Stellrecht, E., B. Han, and M. Pecht, “Characterization of Hygroscopic Swelling Behavior of Mold Compounds and Plastic Packages,” IEEE Transactions on Components and Packaging Technologies, Vol. 27, No. 3, pp. 499–506, Sept. 2004.
642. Huang, Y., D. Bigio, and M. Pecht, “Fill Pattern and Particle Distribution of Underfill Material,” IEEE Transactions on Components and Packaging Technologies, Vol. 27, No. 3, pp. 493–498, Sept. 2004.
643. Fukuda, Y., T. Fang, M. Pecht, and M. Osterman, “Effect of Heat Treatment on Tin Whisker Growth,” SMTA Int’l. Conf., pp. 717–723, Sept. 2004.
644. M. Lee, Y. Hwang, M. Pecht, J. Park, Y. Kim, and W. Liu, “Study of Intermetallic Growth on PWBs Soldered with Sn3.0Ag0.5Cu,” Electronic Components & Technology Conference, June 2004.
645. Qi, H., and M. Pecht, “PBGA Reliability Under Various Manufacturing and Multiple Environmental Loading Conditions,” Proc. of European Microelectronics and Packaging Symp., Prague, Czech Republic, pp. 403–412, June 16–18, 2004; extension of Qi, H., M. Pecht, C. Wilkinson, and M. Osterman, “Failure Analysis and Virtual Qualification of PGBA Under Multiple Environmental Loadings,” ECTC 2004, 54th Electronic Component and Technology Conf., Las Vegas, NV, June 1–4, 2004.
646. Qi, H., S. Ganesan, M. Osterman, and M. Pecht, “Accelerated Testing and Finite Element Analysis of PBGA under Multiple Environmental Loadings,” Proc. of 2004 Int’l. Conf. on the Business of Electronic Product Reliability and Liability, Shanghai, China, pp. 99–106, April 27–30, 2004.
647. Qi, H., M. Osterman, M. Lee, K. Lee, O. Seyong, and T. Schmidt, “Simulation Model Development for Solder Joint Reliability for High Performance FBGA Assemblies,” IEEE 20th Annual Semiconductor Thermal Measurement and Management, pp. 300–307, March 9–11, 2004.
648. Bumiller, E., M. Pecht, and C. Hillman, “Electrochemical Migration on HASL Plated FR-4 Printed Circuit Boards,” Journal of Surface Mount Technology, Vol. 17, No. 2, pp. 37–41, April–June 2004; Proc. of 2004 SMTA Pan Pacific Microelectronics Symp., Oahu, HI, pp. 201–205, Feb. 11, 2004.
649. Lee, M., and M. Pecht, “Thermal Assessment of Glass-Metal Composition Plasma Display Panels Using Design of Experiments,” IEEE Trans. on Components and Packaging Technologies, Vol. 27, No. 1, pp. 210–216, March 2004.
650. Xie, J., M. Sun, M. Pecht, and D. Barbe, “Why Gold Flash Can Be Detrimental to Long-term Reliability,” Journal of Electronic Packaging, Vol. 126, No. 1, pp. 37–40, March 2004.
651. Ciocci, R., and M. Pecht, “Questions Concerning the Migration to Lead-free Solder,” Circuit World, Vol. 30, No. 2, pp. 34–40, 2004.
652. Casey P., and M. Pecht, “Assessing Lead-free Intellectual Property,” Circuit World, Vol. 30, No. 2, pp. 46–51, 2004.
653. Xie, J., and M. Pecht, “Applications of In-situ Health Monitoring and Prognostic Sensors,” Pan Pacific Microelectronics Symp., Oahu, HI, pp. 381–386, Feb. 12, 2004.
654. Ramakrishnan, A., and M. Pecht, “Load Characterization During Transportation,” Microelectronics Reliability, Vol. 44, No. 2, pp. 333–338, Feb. 2004.
655. Tiku, S., and M. Pecht, “Auditing the Reliability Capability of Electronics Manufacturers,” Proc. of the 8th Int’l. Workshop, Tokyo Institute of Technology, Jan. 15, 2004; update of Tiku, S., and M. Pecht, “Reliability Capability Assessment Methodology,” Proc. of the Int’l. Technical Sym. on Packaging, Assembling and Testing & Exhibition, 2003 IMAPS Brazil, Campinas, Sao Paulo, Brazil, pp. 101–105, Aug. 6–8, 2003; update of: Tiku, S., and M. Pecht, “Auditing the Reliability Capability of Electronics Manufacturers,” Proc. of IPACK ’03, Maui, HI, IPACK 2003-35359, July 6–11, 2003; update of Tiku, S., and M. Pecht, “Auditing the Reliability Capability of Electronics Manufactures,” Proc. of Int’l. IEEE Conf. on the Business of Electronic Product Reliability and Liability, Hong Kong, pp. 19–24, Jan. 13–17, 2003.
656. Pecht, M, “Impact of Lead-free Legislation on Electronic Industry,” Proc. of 2004 Int’l. IEEE Conf. on Asian Green Electronics, Shenzhen, China, Jan. 7, 2004.
657. Pecht, M. “Connector Reliability Using Lead-free Finishes,” Proc. of 2004 Int’l. IEEE Conf. on Asian Green Electronics, Shenzhen, China, Jan. 7, 2004.
658. Xie, J., and M. Pecht, “Reliability Prediction Modeling of Semiconductor Light Emitting Device,” IEEE Transactions on Device and Materials Reliability, Vol. 3, No. 4, pp. 218–222, Dec. 2003.
659. Casey, P., S. Ganesan, M. Pecht, and D. K. Anand, “Methods for Predicting the Remaining Life of Electronic Assemblies with Carbon Nanotubes and an Optical Transduction Technique,” Proc. of IMECE ’03, 2003 ASME Int’l. Mechanical Engineering Congress, Washington, DC, pp. 1–9 (EPP), Nov. 15–21, 2003; update of Casey, P., D. K. Anand, and M. Pecht, “Carbon Nanotubes and an Optical Method for Life Consumption Monitoring of Electronic Assemblies,” Proc. of 8th Annual Pan Pacific Microelectronics Symp., Maui, HI, pp. 225–234, Feb. 18-20, 2003.
660. Fukuda, Y., P. Casey, and M. Pecht, “Evaluation of Selected Japanese Lead-free Consumer Electronics,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 26, No. 4, pp. 305–312, October 2003.
661. Lee, M., M. Pecht, J. Tyson, and T. Schmidt, “3-D Measurement System for Use in Microelectronics, A Cost-Effective, Fast Method Measures Warpage in Electronic Devices,” Advanced Packaging, pp. 33–34, Nov. 2003.
662. Donahoe, D. N., and M. Pecht, “Are U.S. Jobs Moving to China?” IEEE Transactions on Components and Packaging Technologies, Vol. 26, No. 3, pp. 682–686, Sept. 2003.
663. Murray, S., C. Hillman, and M. Pecht, “Environmental Aging and De-adhesion of Siloxane-Polyimide-Epoxy Adhesive,” IEEE Transactions On Components and Packaging Technologies, Vol. 26, No. 3, pp. 524–531, Sept. 2003.
664. Fukuda, Y., M. Pecht, K. Fukuda, and S. Fukuda, “Lead-Free Soldering in the Japanese Electronics Industry,” IEEE Transactions on Components and Packaging Technologies, Vol. 26, No. 3, pp. 616–624, Sept. 2003.
665. Ramakrishnan, A., and M. Pecht, “A Life Consumption Monitoring Methodology for Electronic Systems,” IEEE Transactions on Components and Packaging Technologies, Vol. 26, No. 3, pp. 625–634, Sept. 2003.
666. Stellrecht, E., Han, B., and M. Pecht, “Measurement of Hygroscopic Swelling in Mold Compounds and Its Effect on PEM Reliability,” ASME Proc. of InterPack ‘03, Maui, HI, 2003-35252, July 6–11, 2003 (Best Paper Award, Honorable Mention): Technical expansion of: Han, B., M. Pecht, and E. Stellrecht, “Hygroscopic Swelling of Encapsulated Microcircuits - Part I” Advanced Packaging, pp. 31–33, June 2003; and Han, B., M. Pecht, and E. Stellrecht, “Hygroscopic Swelling of Encapsulated Microcircuits - Part II” Advanced Packaging, pp. 29–30, July 2003.
667. Zhao, P., and M. Pecht, “Field Failure due to Creep Corrosion on Components with Palladium Pre-Plated Leadframes,” Microelectronics Reliability, Vol. 43, No. 5, pp. 775–783, May 2003.
668. Donahoe, D., C. Hillman, and M. Pecht, “Failures in Base Metal Electrode (BME) Capacitors,” 23rd Capacitor and Resistor Technology Symp., Scottsdale, AZ, pp. 129–133, March 31–April 3, 2003.
669. Hillman, C., B. Castillo, and M. Pecht, “Diffusion and Absorption of Corrosive Gases in Electronic Encapsulants,” Microelectronics Reliability, Vol. 43, pp. 635–643, April 2003.
670. Hwang, Y. C., M. Lee, and M. Pecht, “Failure Analysis of Electrostatic Discharge and Electrical Overstress Failures of GaAs MMIC,” IMAPS Advanced Technology Conf. on 3-D Packaging, Baltimore, MD, pp. 1–5, March 11–13, 2003.
671. Lantz, L., and M. Pecht, “Ion Transport in Encapsulants Used in Microcircuit Packaging,” IEEE Transactions On Components and Packaging Technologies, Vol. 26, No. 1, pp. 199–205, March 2003.
672. Ardebili, H., E. H. Wong, and M. Pecht, “Hygroscopic Swelling and Sorption Characteristics of Epoxy Molding Compounds Used in Electronic Packaging,” IEEE Transactions On Components and Packaging Technologies, Vol. 26, No. 1, pp. 206–214, March 2003.
673. Baylakoglu, I., C. Hillman, and M. Pecht, “Characterization of Some Commercial Thermally Cured Potting Materials,” Proc. of Int’l. IEEE Conf. on the Business of Electronic Product Reliability and Liability, Hong Kong, pp. 279–287, Jan. 13–17, 2003.
674. Fang, T., M. Osterman, and M. Pecht, “A Tin Whisker Risk Assessment Algorithm”, 38th International Symposium on Microelectronics, Reliability I, Issues in Packaging, pp. 61–65, Phil., PA, Se. 25–29, 2005.
675. Thomas D., K. Ayers, and M. Pecht, “The ‘Trouble Not Identified’ Phenomenon in Automotive Electronics,” Microelectronics Reliability, Vol. 42, pp. 641–651, 2002.
676. Lee, M., and M. Pecht, “Thermal Characteristics of Glass-Metal Composition Plasma Display Panels,” IEEE Transactions on Advanced Packaging, Vol. 25, No. 4, pp. 488–494, 2002.
677. Cunningham, J., R. Valentin, M. Osterman, A. Dasgupta, M. Pecht, and D. Tsogos (USMC), “Virtual Life Assessment of Electronic Hardware Used in the Advanced Amphibious Assault Vehicle (AAAV),” Winter Simulation Conf., San Diego, CA, Dec. 8–11, 2002.
678. Wu J., and M. Pecht, “Fretting Corrosion Studies For Lead-Free Alloy Plated Contacts,” Proc. of the 4th Electronics Packaging Technology Conf., Singapore, pp. 20-24, Dec. 10–12, 2002.
679. Casey, P., and M. Pecht, “The Technical, Social and Legal Outlook for Lead-Free Solders,” IEEE Int’l. Symp. on Electronic Material and Packaging, pp. 483–492, Kaohsiung, Taiwan, Dec. 2002.
680. Lee, M., M. Pecht, X. Huang, and R. Lee, “Stress Relaxation in Plastic Molding Compounds,” IEEE Int’l. Symp. on Electronic Material and Packaging, pp. 1–6, Kaohsiung, Taiwan, Dec. 2002.
681. Casey, P., and M. Pecht, “Challenges for Adopting Pb-Free Interconnects for ‘Green’ Electronics,” IPC/JEDEC Int’l. Conf. on Lead-Free Electronic Components and Assemblies, pp. 21–32, Taipei, Taiwan, Dec. 10–12, 2002.
682. Wilkinson, C., M. Pecht, J. Wasson, and L. Condra, “The Avionics Hardware Development Process,” Proc. of the World Aviation Congress, Phoenix, AZ, Nov 2002.
683. Shetty, V., D. Das, M. Pecht, D. Hiemstra, and S. Martin,“Remaining Life Assessment of Electronics of Space Shuttle Remote Manipulator System,” Proc. of the 22nd Space Simulation Conf., Ellicott City, MD, Oct. 21–23, 2002.
684. Pecht, M., D. Das, and A. Ramarkrishnan, “The IEEE Standards on Reliability Program and Reliability Prediction Methods for Electronic Equipment,” Microelectronics Reliability, Vol. 42, pp. 1259–1266, 2002; also presented at 13th ESREF Conf., Rimini, Italy, October 7–11, 2002.
685. Lin, L., J. Xie, O. Ramahi, M. Pecht, and B. Donham, “Airborne Operation of Portable Electronic Devices,” IEEE Antenna’s and Propagation Magazine, Vol. 44, No. 4, pp. 30–39, Aug. 2002.
686. Pecht, M., D. Das, and R. Biagini, “Using Electronic Parts Outside the Manufacturer’s Specified Temperature Range,” Proc. of the 3rd Int’l. Conf. on Quality and Reliability: Defining Quality & Reliability in the Digital Era, Melbourne, Australia, pp. 182–192, Aug. 28–30, 2002.
687. Lantz, L., S. Hwang, and M. Pecht, “Characterization of Plastic Encapsulant Materials as a Baseline for Quality Assessment and Reliability Testing,” Microelectronics Reliability, Vol. 42, pp. 1163–1170, 2002.
688. Pendse, N., D. Thomas, D. Das, and M. Pecht, “Uprating of a Single Inline Memory Module,” IEEE Transactions on Components and Packaging Technologies, Vol. 25, No. 2, pp. 266–269, June 2002.
689. Murray S., M. Boru, M. Pecht, and D. Erhart, “Tracking Semiconductor Part Changes Through the Part Supply Chain,” IEEE Transactions on Components and Packaging Technologies, Vol. 25, No. 2, pp. 230–238, June 2002.
690. Mishra, S., M. Pecht, T. Smith, I. McNee, and R. Harris, “Remaining Life Prediction of Electronic Products Using Life Consumption Monitoring Approach,” Proc. of European Microelectronics Packaging and Interconnection Symp., Cracow, Poland, pp. 136–142, June 16–18, 2002.
691. Ciocci, R., J. Wu, and M. Pecht, “Impact of Environmental Regulations on Electronics Manufacture, Use and Disposal,” Proc. of European Microelectronics Packaging and Interconnection Symp., Cracow, Poland, pp. 73–80, June 16–18, 2002.
692. Mishra, S., Pecht, M. and D. Goodman, “In-situ Sensors for Product Reliability Monitoring,” IEEE/SPIE Proc. of Design, Test, Integration and Packaging of MEMS/MOEMS, Cannes, France, pp. 10–19, May 2002.
693. Sun, M., M. Pecht and D. Barbe, “Lifetime RC Time Delay of On-Chip Copper Interconnect,” IEEE Transactions on Semiconductor Manufacturing, Vol. 15, No. 2, pp. 253–259, May 2002.
694. Ardebili, H., C. Hillman, M. Natishan, P. McCluskey, M. Pecht, and D. Peterson,“A Comparison of the Theory and Moisture Diffusion in Plastic Encapsulated Microelectronics with Moisture Sensor Chip and Weight-gain Measurements,” IEEE Transactions on Components and Packaging Technologies, Vol. 25, No. 1, pp. 132–139, March 2002.
695. Wu, J., M. Pecht, and R. Mroczkowski,“Electrical Characterization of Lead-free Solder Separable Contact Interfaces,” Journal of Surface Mount Technology, Vol. 15, No. 2, pp. 25–29, June 2002; update of paper delivered at Pan Pacific Microelectronics Symp., Maui, HI, pp. 125–130, Feb. 5–7, 2002.
696. Pecht, M., and R. Biagini, “The Business, Product Liability and Technical Issues Associated with Using Electronic Parts Outside the Manufacturer’s Specified Temperature Range,” Pan Pacific Microelectronics Symp., Maui, HI, pp. 391–398, Feb. 5–7, 2002.
697. Condra, L., D. Das, N. Pendse, and M. Pecht, “Junction Temperature Considerations in Evaluating Electronic Parts for Use Outside Manufacturers-Specified Temperature Ranges,” IEEE Transactions on Components and Packaging Technologies, Vol. 24, No. 4, pp. 721–728, Dec. 2001.
698. Das D., N. Pendse, C. Wilkinson, and M. Pecht, “Parameter Recharacterization: a Method of Thermal Uprating,” IEEE Transactions on Components and Packaging Technologies, Vol. 24, No. 4, pp. 729–737, Dec. 2001.
699. Ramakrishnan, B., P. Sandborn, and M. Pecht, “Process Capability Indices and Product Reliability,” Microelectronics Reliability, Vol. 41, No. 12, pp. 2067–2070, Dec. 2001.
700. Lee, C., and M. Pecht, “Capturing the Benefits of Disruptive Innovation in E-Business Supply Chain Management,” 2001 Int. Conf. on Supply Chain Management and Information Systems, Hong Kong, pp. 47–55, Dec. 2001.
701. Pecht, M., “Electronics Reliability Engineering in the 21st Century,” 3rd Int’l. Symp. on Electronic Materials and Packaging 2001, Jeju Island, Korea, pp. 1–7, Nov. 2001; update of “Reliability Engineering in the 21st Century - A Focus on Predicting the Reliability of Electronic Products and Systems,” Proc. of 5th Int’l. Conf. on Reliability, Maintainability and Safety, Dalian, China, Vol. 1, pp. 1–19, Aug. 28–31, 2001.
702. Syrus, T., M. Pecht, and R. Uppalapati, “Manufacturer Assessment Procedure and Criteria for Parts Selection and Management,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 24, No. 4, pp. 351–358, Oct. 2001.
703. Syrus, T., M. Pecht, and D. Humphrey, “Part Assessment Guidelines and Criteria for Parts Selection and Management,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 24, No. 4, pp. 339–350, Oct. 2001.
704. Liu, W., and M. Pecht, “Fundamental Reliability Issues Associated with a Commercial Particle-in-Elastomer Interconnection System,” IEEE Transactions on Components and Packaging Technologies, Vol. 24, No. 3, pp. 520–525, Sept 2001.
705. Liu, W., and M. Pecht, “IC Component Sockets: An Overview,” Connector Specifier, pp. 24–26, Aug. 2001.
706. Pecht, M., K. Rogers, and C. Hillman, “Hollow Fibers Can Accelerate Conductive Filament Formation,” ASM Int’l. Practical Failure Analysis, Vol. 1, No. 4, pp. 57–60, Aug. 2001.
707. Veneruso, A. F., A. G. Kosmala, R. Bhavsar, Bernard, and M. Pecht, “Engineered Reliability for Intelligent Well Systems,” OTC 13031, 2001 Offshore Technology Conf., Houston, TX, pp. 1–10, May 2001.
708. Liu, W., R. Marten, and M. Pecht, “IC Component Sockets: Applications and Challenges,” Int’l. Journal of Microcircuits and Electronic Packaging, Vol. 24, No. 1, pp. 61–67, First Quarter, 2001.
709. Xie, J., and M. Pecht, “Palladium-Plated Packages: Creep Corrosion and Its Impact on Reliability,” Advanced Packaging, pp. 39–42, Feb. 2001.
710. Pecht, M., M. Dube, M. Natishan, and I. Knowles, “An Evaluation of Built-In Test,” IEEE Transactions on Aerospace and Electronic Systems, Vol. 37, No. 1, pp. 266–272, Jan. 2001.
711. Xie, J., M. Pecht, D. DeDonato, and A. Hassanzadeh, “An Investigation of the Mechanical Behavior of Conductive Elastomer Interconnects,” Microelectronics Reliability, Vol. 41, No. 2, pp. 281–286, 2001.
712. Huang, Z., P. Sandborn, M. Pecht, and R. Solomon, “Lifecycle Forecasting of ASICs,” Future Circuits Int’l., Technology Publishing Ltd., London, UK, No. 7, pp. 101–107, 2001.
713. Solomon, R., P. Sandborn, and M. Pecht, “Electronic Part Life Cycle Concepts and Obsolescence Forecasting,” IEEE Transactions on Components and Packaging Technologies, Vol. 23, No. 4, pp. 707–717, Dec. 2000.
714. Pecht, M., and A. Ramakrishnan, “Development and Activities of the IEEE Reliability Standards Group,” Journal of the Reliability Engineering Association of Japan, Vol. 22, No. 8, pp. 699–706, Nov. 2000.
715. Xie, J., M. Pecht, and D. Barbe, “Contact Variation and Shielding Performance of Electromagnetic Shielding Gaskets,” IICIT 33rd Connector and Interconnection Symp., Orlando, FL, pp. 61–70, Oct. 23–25, 2000.
716. Das D., N. Pendsé, M. Pecht, L. Condra, and C. Wilkinson, “Deciphering the Deluge of Data: Understanding Electronic Part Data Sheets for Parts Selection and Management,” IEEE Circuits & Devices, Vol. 16, No. 5, pp. 26–34, Sept 2000.
717. Humphrey, D., L. Condra, N. Pendsé, D. Das, C. Wilkinson, and M. Pecht, “An Avionics Guide to Uprating of Electronic Parts,” IEEE Transactions on Components and Packaging Technologies, Vol. 23, No. 3, pp. 595–599, Sept. 2000.
718. Pecht, M., W. Liu, and D. Hodges, “A Comparison with Taiwan,” Semiconductor Int’l., Vol. 23, No. 10, pp. 135–136, Sept. 2000; “Semiconductor Companies in China,” Semiconductor Int’l., Vol. 23, No. 10, pp. 148–154, Sept. 2000; “Newer Fabs in China,” Semiconductor Int’l., Vol. 23, No. 10, pp. 156–162, Sept. 2000; “Trends in China’s Semiconductor Industry,” Semiconductor Int’l., Vol. 23, No. 10, pp. 134–144, Sept. 2000; update of Lee, C. S., M. Pecht, and Y. S. Chen, “Chinese Electronics Industry in the Year 2000,” IMAPS Taiwan Technical Symp. 2000, Taiwan, pp. 1–15, April 26, 2000; update of Lee, C., M. Pecht, X. Zong, J. Jiang, and Y. Wang, “Developments in China’s Electronics Industry,” Proc. of the Semicon West, San Jose, CA, pp. 24–36, July 15, 1999; update of Lee, C., M. Pecht, X. Zong, J. Jiang, and Y. Wang, “Recent Developments in China’s Electronic Industry,” Proc. of the Third Int’l. Sym. on Electronic Packaging Technology, Tsinghua Univ.  Press, Beijing, China, pp. 24–36, Aug 17-21, 1998.
719. Martens, R., and M. Pecht, “An Investigation of the Electrical Contact Resistance of Corroded Pore Sites on Gold Plated Surfaces,” IEEE Transactions on Advanced Packaging, Vol. 23, No. 3, pp. 561–567, Aug. 2000.
720. Katz, A., M. Pecht, and E. Suhir, “New Development in Accelerated Testing of Microelectronics,” Proc. of the IMAPS Int’l. Sym. on Microelectronics and Packaging, Tel Aviv, Israel, pp. 31–42, June 15, 2000.
721. Martens, R., and M. Pecht, “Effects and Interactions of Design Parameters for Gold Plated Electric Contacts,” Journal of Material Science: Materials in Electronics, Vol. 11, pp. 209–218. May 2000.
722. Pecht, M., and D. Das, “The Electronic Part Life Cycle,” IEEE Transactions on Components and Packaging Technologies, Vol. 23, No. 1, pp. 190–193, Mar. 2000.
723. Xie, J., M. Pecht, S. Das, J. Neubel, and B. Zand, “Corrosion of a Zinc-Coated Steel Enclosure at the Contact Interface of Gasket Joint,” IEEE Transactions on Components, Packaging & Manufacturing Technology, Vol. 23, No.  1, pp. 136–142, Mar.  2000.
724. Xie, J., C. Hillman, P. Sandborn, M., Pecht, A. Hassanzadeh, and D. DeDonato, “Assessing the Operating Reliability of Land Grid Array Elastomer Sockets,” IEEE Transactions on Components, Packaging & Manufacturing Technology, Vol. 23, No. 1, pp. 171–176, Mar. 2000; extension of Xie, J., M. Pecht, D. DeDonato, and A. Hassanzadeh, “An Investigation on the Mechanical Behavior of Elastomer Interconnects,” 32nd Int’l. Symp. on Electromagnetic Compatibility,  32nd Int’l. Symp. on Microelectronics, Chicago, IL, pp. 58–63, Oct. 1999.
725. Pecht, M., D. Das, and L. Yang, “Risk Assessment, Mitigation and Management - The Key Focus of Competitive Electronic Products Development in the 21st Century,” Proc. of the SEMICOM Korea Technical Symp. 2000, Seoul, Korea, pp. 217–224, Feb. 16, 2000.
726. Xie, J., M. Pecht, D. Barbe, S. Das, J. Neubel, and B. Zand, “Effects of Corrosion on the Transfer Impedance of Zinc Coated Steel Enclosures,” IEEE Transactions on Electromagnetic Compatibility, Vol. 42, No. 1, pp. 71–76, Feb. 2000; extension of Das, S., J. Neubel, B. Zand, D. Hockanson, J. Xie, and M. Pecht, “The Effect of Corrosion on Shielding Effectiveness of a Zinc-Coated Steel Enclosure,” IEEE Int’l. Symp. on Electromagnetic Compatibility, Denver, CO, pp. 1041–1046, Aug. 1998.
727. Sun, M., M. Pecht, and R. Martens, “Kinetic Model for Noble Plated Electrical Contact Behavior,” Scripta Materialia, Vol. 42, pp. 1–8, Jan. 2000.
728. Zhang, K., and M. Pecht, “Effectiveness of Conformal Coatings on a PBGA Subjected to Unbiased High Humidity, High Temperature Test,” Microelectronics Int’l., Vol. 17, No. 3, pp. 16–20, 2000.
729. Schwach, C. A., A. Mathur, R. Solomon, P. Sandborn, and M. Pecht, “Equipment Supplier Intervention Techniques,” Future EMS Int’l., No. 3, pp. 97–100, 2000.
730. Pendse, N. and M. Pecht, “Electrical Performance Comparison of the Military and Commercial Versions of a TI Octal Buffer,” Future Circuits Int’l., Vol. 6, pp. 63–67, Technology Publishing Ltd., London, UK, 2000.
731. Xie, J., M. Pecht, A. Dasgupta, J. Swift, and S. Wallace, “A Statistical Mechanical Model of Electrical Carbon Fiber Contacts,” ASME Journal of Electronic Packaging, Vol. 121, No. 4, pp. 286–290, Dec. 1999.
732. Zhang, Y., D. Das, A. Katz, M. Pecht, and O. Hallberg, “Trends in Component Reliability and Testing,” Semiconductor Int’l., pp. 101–106, Sept. 1999.
733. Condra, L., M. Pecht, and N. Pendse, “Terminology For Use of Electronic Parts Outside Manufacturer-specified Temperature Ranges,” IEEE Transactions on Components and Packaging Technology, Vol. 22, No. 3, pp. 355–356, Sept. 1999.
734. M. Pecht, “Moisture Sensitivity Characterization of Build-up Ball Grid Array Substrates,” IEEE Transactions on Advanced Packaging, Vol. 22, pp. 515–523, Aug. 1999.
735. Biagini, R., M. Rowland, M. Jackson, and M. Pecht, “Tipping the Scales in Your Favor When Uprating- How to Avoid the Legal Risks of Part Use Outside the Manufacturer’s Specified Temperature Range,” IEEE Circuits and Devices, Vol. 15, No. 4, pp. 15–23, July 1999.
736. Ranade, Y., M. Pecht, and T. Moore, “New Findings in the Occurrence of False-Healing in Plastic Encapsulated Microcircuits Using Scanning Acoustic Microscopy,” IEEE Transactions on Components and Packaging Technology, Vol. 22, pp. 266–269, June 1999.
737. Dishongh, T., M. Dube, M. Pecht, and J. Wyler, “Failure Analysis of Liquid Crystal Displays Due to Indium Tin Oxide Breakdown,” ASME Journal of Electronic Packaging, Vol. 121, No. 2, pp. 126–127, June 1999.
738. Hillman, C., Rogers, K., Dasgupta, A., Pecht, M., Dusek, R. and B. Lorence, “Solder Failure Mechanisms in Single-Sided Insertion Mount Printed Wiring Boards,” Circuit World, Vol. 25, No. 3, pp. 28–38, April 1999.
739. Rogers, K., P. Van Den Driessche, C. Hillman, and M. Pecht, “Do You Know that Your Laminates May Contain Hollow Fibers,” Printed Circuit Fabrication, Vol. 22, No. 4, pp. 34–38, April 1999.
740. Rogers, K., C. Hillman, M. Pecht, and S. Nachbor, “Conductive Filament Formation Failure in a Printed Circuit Board,” Circuit World, Vol. 25, No. 3, pp. 6–8, April 1999.
741. Pecht, M., H. Ardebili, A. Shukla, J. Hagge, and D. Jennings, “Moisture Ingress Into Organic Laminates,” IEEE Transactions on Components and Packaging Technology, Vol. 22, No. 1, pp. 104–110, March 1999.
742. Sun, M., M. Pecht, M. Natishan, and R. Martens, “Lifetime Resistance Model of Bare Metal Electrical Contacts,” IEEE Transactions on Advanced Packaging, Vol. 22, No. 1, pp. 60–67, Feb. 1999.
743. Pecht, M., Hillman, C., Rogers, K. and D. Jennings, “Conductive Filament Formation: A Potential Reliability Issue in Laminated Printed Circuit Cards with Hollow Fibers,” IEEE Transactions of Electronics Packaging Manufacturing, Vol. 22, No. 1, pp. 80-84, Jan. 1999. 
744. Jackson, M., Mathur, A., Pecht, M. and R. Kendall, “Part Manufacturer Assessment Process,” Quality and Reliability Engineering Int’l., Vol. 15, pp. 457–468, 1999.
745. Jackson, M., P. Sandborn, M. Pecht, C. Hemens-Davis, and P. Audette, “A Risk Informed Methodology for Parts Selection and Management,” Quality and Reliability Engineering Int’l., Vol. 15, pp. 261–271, 1999.
746. Kimseng, K., M. Hoit, N. Tiwari, and M. Pecht, “Physics-of-Failure Assessment of a Cruise Control Module,” Microelectronics Reliability, Vol. 39, pp. 1423–1444, 1999.
747. Sun, M., M. Pecht, and M.  Natishan, “A Comparative Assessment of Gold Plating Thickness Required for Stationary Electrical Contacts,” Microelectronics Journal, Vol. 30, No. 8, pp. 811–817, 1999. 
748. Xie, J., M. Pecht, J. Swift, and S. Wallace, “An Investigation of the Contact Behavior of Electric Distributed Filament Contacts,” IEEE Transactions on Components Packaging & Manufacturing Technology A, Vol. 21, pp. 604–609, Dec. 1998.
749. Pecht, M., “Virtual Product Development,” IEEE Transactions on CPMT, Part A 21 (4), p. 610, Dec. 1998.
750. Zhang, Y., M.  Pecht, and L. Lantz, “A Case Study of IC Storage Failures in Taipei Trains,” Microelectronics Reliability, Vol. 38, No. 12, pp. 1811–1816, Dec. 1998.
751. Dube, M., T. Dishongh, K. Beatty, and M. Pecht, “In Situ Temperature Measurements of PQFPs during Infrared Reflow,” Circuit World, Vol. 24, No. 4, pp. 29–32, Aug 1998.
752. McCluskey, P., E. Hakim, J. Fink, A. Fowler, and M. Pecht, “Reliability Assessment of Electronic Components Exposed to Long-Term Non-Operating Conditions,” IEEE Transactions On Components, Packaging, and Manufacturing Technology, Vol. CPMTA-21, No. 2, pp. 352–359, June 1998.
753. Sinnadurai, N., A. Shukla, and M. Pecht, “A Critique of the Reliability-Analysis Center Failure-Rate-Model for Plastic Encapsulated Microcircuits,” IEEE Transactions on Reliability, Vol. 47, No. 2, pp. 110–113, June 1998.
754. Williams, R., J. Banner, I. Knowles, M. Dube, M. Natishan, and M. Pecht, “An Investigation of ‘Cannot Duplicate’ Failures,” Quality and Reliability Intl, pp. 331–337, May/June, 1998.
755. Pecht, M., “Electronic Packaging: Cross Discipline Is the Only Discipline,” IEEE Transactions on CPMT, Part A 21 (1),  pp. 192–194, March 1998.
756. Pecht, M., Boullie, J., Hakim, E., Jain, A., Jackson, M., Knowles, I., Shroeder, R., Strange, A. and J. Wyler, “Realism of FAA Reliability-Safety Requirements and Alternatives,” IEEE Aerospace and Electronic Systems, Vol. 13, No. 2, pp. 16-20, Feb. 1998. 
757. Pecht, M., Boullie, J., Hakim, E., Jain, A., Jackson, M., Knowles, I., Schroeder, R., Strange, A. and J. Wyler, “The Realism of FAA Reliability-Safety Requirements and Alternatives,” IEEE Aerospace and Electronic Systems Magazine, Vol. 13, No. 2, pp. 16–20, February 1998.
758. Osterman, M., Dasgupta, A., Pecht, M., and M. Torres, “Cost-Effective Systems Development Through Accelerated Risk Assessment,” JPL Advanced Packaging Workshop, Pasadena, CA, Jan 13, 1998.
759. Pecht, M., Bernstein, J., Searls, D. and M. Peckerar, “Korea’s Focus on Market Dominance,” Semiconductor Int’l., pp. 118–122, Jan. 1998.
760. Dasgupta, A., Pecht, M. and B. Mathieu, “Design of Experiment Methods for Computational Parametric Studies in Electronic Packaging,” Finite Elements in Analysis and Design, Vol. 31, pp. 125–146, 1998.
761. Lantz, L., and M. Pecht, “Characterization of Plastic Encapsulant Materials as a Baseline for Reliability Testing,” Workshop on Mechanical Reliability of Polymeric Materials and Plastic Packages of IC Devices, Vol. 25, pp. 237–249, 1998.
762. Mahajan, R and M. Pecht, “Reliability Assessment of a Plastic Encapsulated RF Switching Device,” Microelectronics Reliability, Vol. 38, pp. 1607–1610, 1998. 
763. Pecht, M., Rogers, K. and A. Fowler, “Characterization of a Non-Woven Randomly Dispersed Short Fiber Laminate,” Circuit World, Vol. 24, No. 3, pp. 34–37, 1998.
764. Sharma, P., Upadhyayula, K., Lantz, L. and M. Pecht, “Impact of Preconditioning, Voltage Bias and Temperature on Reliability of Plastic Encapsulated Microcircuits,” Microelectronics Reliability, Vol. 38, No. 4, pp. 581–584, 1998.
765. Pecht, M., and C. Lee, “Flat Panel Displays - What is Going On In East Asia Outside Japan,” Circuit World, Vol. 24 No. 1, pp. 20–27, Nov. 1, 1997.
766. M. Pecht, “The Role of Electronics in Singapore’s Economy,” SMT Int’l. Asia-Pacific, Vol. 1, No.1, pp. 18–22, Oct. 1997.
767. Sun, M., Javadpour, S., Martens, R. and M. Pecht, “Kinetic Modeling of Corrosion Film on Unloaded Precious Metal Plated Contacts,” Proc. of 30th Connector & Interconnection Sym., Anaheim, CA, Sept.  22–24, 1997.
768. Condra, L., Anissipour A., Mayfield, D. and M. Pecht, “Electronic Components Obsolescence,” IEEE Transactions on Components and Packaging and Manufacturing Technology-Part A, Vol. 20, No. 3, pp. 367, Sept. 1997.
769. Pecht, M., Shukla, A., Kelkar, N. and J. Pecht, “Criteria for the Assessment of Reliability Models,” IEEE Transactions on Components, Packaging, and Manufacturing Technology B, Vol. 20, No. 3, pp. 229–234, Aug. 1997.
770. Pecht, M. and A. Govind, “In-Situ Measurements of Surface Mount IC Package Deformations During Reflow Soldering,” IEEE Transactions on Components, Packaging, and Manufacturing Technology, Vol. 20 pp. 207–212, July 1997.
771. Pecht, M., Fink, J., Hakim, E. and J. Wyler, “An Assessment of the Qualified Manufacturer List (QML),” IEEE AES System Magazine, Vol. 12, No. 7, pp. 39–43, July 1997.
772. Hakim, E., Fink, J., Tam, S., McCluskey, P. and M. Pecht, “Plastic-encapsulated Microcircuits (PEMs): Long-term Dormancy Studies,” Circuit World, Vol. 23, No. 4, pp. 26–29, June 1997.
773. Pecht, M., Ranade, Y. and J. Pecht, “Effect of Delamination on Moisture Accelerated Failures in Plastic Encapsulated Microcircuits,” Circuit World, Vol. 23, No. 4, pp. 11–15, June 1997.
774. Lee, C. and M. Pecht, “Recent Developments in Taiwan’s Electronics Industry,” Circuit World, Vol. 23, No. 3, pp. 16-19, 27, April 1997; update of M.  Pecht and C.S. Lee, “Prospects for Taiwan’s Electronic Components Industry,” Solid State Technology, pp. 11–14, Nov. 1996.
775. Pecht, M., Tucker, W., and S. Wennberg, “Electronics Production in Malaysia,” Solid State Technology, pp. 21–24, Feb. 1997.
776. McCluskey, P. and M. Pecht, “Pushing the Limit, The Rise of High Temperature Electronics,” Advanced Packaging, pp. 36–39, Jan/Feb 1997.
777. Shukla, A., Pecht, M., Jordan, J., Rogers, K. and D. Jennings, “Hollow Fibers in PCB, MCM-L and PBGA Laminates May Induce Reliability Degradation,” Circuit World, pp. 5–6, 10, Vol. 23 No. 2, Jan. 1997; update of A. Shukla, Dishongh, T., Pecht, M. and D. Jennings, “Hollow Fibers in Woven Laminates,” Printed Circuit Fabrication, Vol. 20 No. 1, pp. 30–32, Jan. 1997.
778. McCluskey, P., Munamarty, R. and M. Pecht, “Popcorning in PBGA Packages During IR Reflow Soldering,” Microelectronic Int’l., No. 42, pp. 20–23, Jan. 1997. Update of “Popcorning in PBGA Packages During IR Reflow Soldering,” Proc. of the 1996 Electronics Packaging Technical Conf., McCluskey, P., Munamarty, R. and M.  Pecht, Austin, TX, pp. 271–281, Sept. 29–Oct. 1, 1996; Update of “Popcorning in PBGA Packages During IR Reflow Soldering,” Proc. of IAMIS’95, San Diego, CA, Jan. 27, 1995.
779. McCluskey, P., Pecht, M. and S. Azarm, “Reducing Time-to-Market Using Virtual Qualification,” Proc. of the Institute of Environmental Sciences, pp. 148–152, 1997.
780. Kelkar, N., Dasgupta, A., Pecht, M., Knowles, I., Hawley, M. and D. Jennings, “Smart Electronic Systems for Condition-based Health Management,” Quality and Reliability Engineering Int’l., Vol. 13, No. 1, pp. 3–8, 1997; update of “Condition Monitoring and Diagnostic Engineering Management,” Proc. of COMADEM ‘96, Sheffield Academic Press, UK, pp. 591–601, July 1996.
781. M. Pecht, “Decreasing the Time-to-Market Throughout Virtual Risk Assessment and Risk Mitigation,” ASME Advances in Electronic Packaging, Vol. 1, pp. 1–6, 1997.
782. Jordan J., Pecht, M. and J. Fink, “How Burn-in Can Reduce Quality and Reliability,” Int’l. Journal of Microcircuits and Electronic Packaging, Vol. 20, No. 1, pp. 35–40, 1997; update from J. Jordan and M. Pecht, Proc. of Institute of Environmental Sciences, pp. 16-19, 1996.
783. McCluskey, P., Pecht, M. and M. Osterman, “Software for Reliability Assessment of Electronic Components, Circuit Cards and Equipment,” Proc. of the Second Int’l. Symp. on Electronic Packaging Technology, Shanghai, China, pp. 472–483, Dec. 9–12, 1996.
784. M. Pecht, “Plastic Encapsulated Microcircuits,” Engineering, Vol. 237, No. 8, pp. 22–23, Sept. 1996.
785. Martens, R. and M. Pecht, “The Effects of Wipe on Corroded Nickel Contacts,” 42nd IEEE Holm Conf. on Electrical Contacts Joint with the 18th Int’l. Conf. on Electric Contacts, Chicago, IL, Sept. 19, 1996.
786. Das, D., and M. Pecht, “The Role of Heat Transfer Analysis in Avionics Equipment Development,” ASME Proc. of the 32nd National Heat Transfer Conf., Vol. 7, HTD-Vol. 329, pp. 197–209, Aug. 1996.
787. Gannamani, R. and M. Pecht, “An Experimental Study of Popcorning in Plastic Encapsulated Microcircuits,” IEEE Transactions on Components, Packaging and Manufacturing Technologies A, Vol. 19, No. 2, pp. 194–201, June 1996.
788. Munamarty, R., McCluskey, P., Pecht, M. and L. Yip, “Popcorning in Fully Populated and Perimeter Plastic Ball Grid Array Packages,” Soldering & Surface Mount Technology, No. 22, pp. 46–50, Feb. 1996.
789. M. Pecht, “Why the Traditional Reliability Prediction Models Do Not Work - Is There an Alternative?” Electronics Cooling, Vol. 2, No. 1, pp. 10–12, Jan. 1996.
790. Pecht, M. and P. Lall, “A Life-cycle Approach to Design and Manufacturing Simulation of Multichip Modules,” Int’l. Journal of Modeling and Simulation, Vol. 16, No. 4, pp. 173–183, 1996.
791. M. Pecht, “Issues Affecting Early Affordable Access to Leading Electronics Technologies by the US Military and Government,” Circuit World, Vol. 22, No. 2, pp. 7–15, 1996.
792. Kelkar, N., Fowler, A., Pecht, M. and M. Cooper, “Phenomenological Reliability Modeling of Plastic Encapsulated Microcircuits,” The Int’l. Journal of Microcircuits and Electronic Packaging, Vol. 9, No. 1, pp. 3–13, First Quarter 1996. 
793. Pecht, M. and A. Dasgupta, “Physics-of-Failure: an Approach to Reliable Product Development,” 1995 Int’l. Integrated Reliability Workshop Final Report, Lake Tahoe, CA, pp. 1–4, Oct. 22–25, 1995.
794. Pecht, M. and A. Dasgupta, “Physics-of-Failure: An Approach to Reliable Product Development,” Journal of the Institute of Environmental Sciences, pp. 30–34, Sept./Oct. 1995; update of M. Pecht, “Physics-of-failure: An Approach to Reliable Product Development,” Proc. of Institute of Environmental Sciences, Chicago, IL, pp. 111-117, Aug. 1995; update of “Physics-of-Failure Approach to Design and Reliability Assessment of Microelectronic Packages,” Proc. of the First Int’l. Sym. on Microelectronic Package and PCB Technology, Beijing, China, pp. 175-180, Sept. 19–23, 1994.
795. Pecht, M. and M. Li, “Environmental Scanning Electron Microscopic Investigation of Failure Mechanisms in Electronic Packages,” Journal of Electronic Packaging Transactions of ASME, Vol. 117, No. 3, pp. 225–229, Sept. 1995; update of “Environmental Scanning Electron Microscopic Investigation on Interfacial Debonding in Electronic Packages,” Proc. of the ASME Int’l. Electronics Packaging Conf., Binghamton, NY, Sept. 29–Oct. 2, 1993; update of Li, M. and M. Pecht, “Environmental Scanning Electron Microscopic Investigation on Interfacial Defects in Electronic Packages,” Proc. of the 6th Int’l. Sym. on Nondestructive Characterization of Materials, Oahu, HI, June 1993.
796. Pecht, M. and P. Lall, “Does the Cooling of Electronics Increase Reliability?” Communications in RMS, Vol. 2, No. 2, pp. 24–30, July 1995.
797. Ogunjimi, A., MacGregor, S., Pecht, M. and J. Evans, “The Effect of Manufacturing and Design Process Variabilities on the Fatigue Life of the High Density Interconnect Vias,” Journal of Electronics Manufacturing, Vol. 5, No. 2, pp. 111–119, June 1995.
798. Wu, S. X., C.-P. Yeh, Wyatt, K., and M. Pecht, “Craze and Instability of Polyimide Thin Films and Its Effects on High Density Interconnects,” IEEE 1995 Proc.. 45th Electronic Components and Technology Conf., Las Vegas, NV, p. 1293, 922-4. May 21–24, 1995.
799. Stadterman, T., Cushing, M., Hum, B., Malhotra, A. and M. Pecht, “The Transition from Statistical-Field Failure Based Models to Physics-of-Failure Based Models for Reliability Assessment of Electronic Packages,” Proc. of the INTERpack’95, Lahaina, Maui, HI, pp. 619–625, March 26–30, 1995.
800. Rudra, B., Li, M., Pecht, M. and D. Jennings, “Electrochemical Migration in Multichip Modules,” Circuit World, Vol. 22, No. 1, pp. 67-70, 1995; update of Li, M., Pecht, M. and L. Wang, “The Physics of Conductive Filament Formation in MCM-L Substrates,” Proc. of the INTERpack’95, Lahaina, Maui, HI, pp. 517–527, March 26–30, 1995.
801. Prabhu, A., Barker, D., Pecht, M., Evans, J., Grieg, W., Bernard, E. and E. Smith, “A Thermo-Mechanical Fatigue Analysis of High Density Interconnect Vias,” Proc. of the INTERpack’95, Lahaina, Maui, HI, pp. 187–216, March 26–30, 1995.
802. Lall, P., Pecht, M. and E. Hakim, “Characterization of Functional Relationship Between Temperature and Microelectronic Reliability,” Microelectronics and Reliability, Elsevier Science Ltd., Vol. 35, No. 3, pp. 377–402, March 1995; update of “The Influence of Temperature on Integrated Circuit Failure Mechanisms,” Quality and Reliability Int’l., Vol. 8, pp. 167–175, Aug. 1992; “Modeling the Influence of Absolute Temperature on Microelectronic Device Reliability,” M. Pecht, P. Lall, Internepcon/Semiconductor Thailand ‘91, Bangkok, Thailand.  Dec. 2–4, 1991; “Microelectronic Reliability/Temperature Independence, Part I,” Hakim, E., Pecht, M. and P. Lall, 5th Int’l. Conf. Quality in Electronic Components, pp. 49-54, Bordeaux-France, Oct. 7–10, 1991; “The Influence of Temperature on Integrated Circuit Failure Mechanisms; Part II,” Pecht, M., Lall, P. and E. Hakim, 5th Int’l. Conf. Quality in Electronic Components, pp. 85–92, Bordeaux-France, Oct. 7–10, 1991; “The Influences of Temperature on Microelectronic Failure Mechanisms,” Pecht, M., and P. Lall, 1991 Advanced Microelectronics Technology Qualification, Reliability, and Logistics Workshop, Seattle, WA, Aug. 13–15, 1991; also Pecht, M., Lall, P. and S.  Whelan, “Temperature Dependencies of Microelectronic Devices,” Quality and Reliability Engineering Int’l., Vol. 6, No. 4, pp. 275–284, Oct. 1990; update of Proc. 1990 Advanced Microelectronic Technology, Quality, Reliability and Logistics Workshop, pp. 135–148, San Diego, CA, Aug. 28-30, 1990.
803. Pecht, M., Wu, X., Paik, K., and S. Bhandarkar, “To Cut or Not to Cut: A Thermomechanical Stress Analysis of Polyamide Thin-film on Ceramic Structures,” IEEE Transactions on Components, Packaging and Manufacturing Technology B, Vol. CPMTB-18, pp. 150–153, Feb. 1995.
804. Kelly, M., Kukowski, J., Boulton, W., Meieran, E., Pecht, M., Pepples, J. and R. Tummala, “JTEC Panel Report on Electronic Manufacturing and Packaging in Japan,” Int’l. Technology Research Institute, Baltimore, MD, Feb.  1995 (ISBN 1-883712-37-8); update of “JTEC Panel Report on Electronic Manufacturing and Packaging in Japan,” 6th Int’l. Electronics Manufacturing Technology Symp., La Jolla, CA, pp. 96-102, Sept. 12–14, 1994.
805. Pusarla, C., Dasgupta, A., Pecht, M. and A. Christou, “A Physics-of-failure Design Philosophy Applied to Flip-chip Bonds,” Microelectronics Int’l., No. 36, pp. 6–12, Jan. 1995.
806. Mowrer, F. and M. Pecht, “Exploratory Research on Nonthermal Damage to Electronics from Fires and Fire-Suppression Agents,” Proc. 1995 Annual Reliability and Maintainability Symp., pp. 1–6, Jan. 1995.
807. Pecht, M., Nash, F. and J. Lory, “Understanding and Solving the Real Reliability Assurance Problems,” Proc. 1995 Annual Reliability and Maintainability Symp., pp. 159–161, Jan.1995.
808. Harris, D.B. and M.  Pecht, “A Reliability Study of Fuzz Button Interconnects,” Circuit World, Vol. 21, No. 2, pp. 12–18, 1995.
809. Li, M., Xin, W., Pecht, M., Kyung, P. and E. Bernard, “Relative Humidity Cycle Testing on GE-HDI,” Int’l. Journal of Microelectronic Packaging, Materials and Technologies, Vol. 1, No. 1, pp. 13–34, 1995.
810. Lall, P., Pecht, M. and D. Barker, “Development of An Alternative Wire Bond Test Technique,” IEEE Transactions on Components, Packaging, and Manufacturing Technology A, Vol. CPMTA-17, pp. 610-615, Dec. 1994; update of Proc. ASME Winter Annual Meeting, Chicago, IL, Nov. 94; update of Proc. 1994 Institute of Environmental Services Annual Technical Meeting, Vol. 2, pp. 22–27, May 1994; update of 13th IEEE Int’l. Electronics Manufacturing Technology Symp., pp. 283–287, 1992.
811. M. Pecht, “Success Factors in the Malaysian, Taiwanese and Japanese Electronics Industry,” Eye on Asia, Nov. 1994.
812. Pecht, M. and X. Wu, “Characterization of Polyimides Used in High Density Interconnects,” IEEE Transactions on Components, Packaging and Manufacturing Technology B, Vol. CPMTB-17, pp. 632–639, Nov. 1994; update of 7th Int’l. SAMPE Electronics Conf., pp. 432–445, June 20–23, 1994.
813. Lall, P., Pecht, M. and M. Cushing, “A Physics-of-Failure Approach to Addressing Device Reliability in Accelerated Testing,” 5th European Symp. on Reliability of Electron Devices Failure Physics and Analysis, Glasgow, Scotland, Oct.  4–7, 1994.
814. Hakim, E., Agarwal, R. and M. Pecht, “The Demise of Plastic Encapsulated Microcircuit Myths,” 5th European Sym. on Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, Scotland, Oct. 6, 1994; update of Proc. of NATO Advisory Group for Aerospace Research and Development, Avionic Panel on Advanced Packaging Concepts for Digital Avionics, San Diego, CA, June 8, 1994.
815. Ranganthan, M. and M. Pecht, “Development of an Automated Contact Resistance Probe,” 27th Annual Connector and Interconnection Symp. and Trade Show, IICIT, Inc., Boston, MA, pp. 369–375, Sept. 19–24, 1994.
816. Wong, W., and M. Pecht, “Introducing a Theory for the General Solution of Steiner’s Problem in Manhattan Space,” Proc. of the First Int’l. Symp. on Microelectronic Package and PCB Technology, Beijing, China, pp. 114–115, Sept. 19–23, 1994.
817. Bauernschub, R., Lall, P. and M. Pecht, “A Physics-of-Failure Approach to Addressing Defect Related Reliability,” 6th Int’l. Electronics Manufacturing Technology Symp., La Jolla, CA, pp. 38–49, Sept. 12–14, 1994.
818. Pecht, M., Dasgupta, A., Ogunjimi, A. and J. Evans, “Computational Methods to Address Reliability of Electronic Packaging, Computational Mechanics for Electronic Devices/Components,” Proc. of the Int’l. Symp. on Highly Advanced Computing ‘94, Chiba, Japan, pp. 145–176, Aug. 4–5, 1994.
819. Rudra, B., Pecht, M. and D. Jennings, “Assessing Time-to-Failure Due to Conductive Filament Formation in Multi-Layer Organic Laminates,” IEEE Transactions on Components, Packaging and Manufacturing Techniques B, Vol. CPMTB-17, pp. 269-276, Aug. 1994; Extension of Pecht, M., Wu, B. and D. Jennings, “Conductive Filament Formation in Printed Wiring Boards,” 13th IEEE Int’l. Electronics Manufacturing Technology Symp., pp. 74–79, 1992.
820. Pecht, M. and F. Nash, “Predicting the Reliability of Electronic Equipment,” Proc. of the IEEE, Vol. 82, No. 7, pp. 992–1004, July 1994.
821. Li, M., Gohari, K. and M. Pecht, “Effect of Temperature and Humidity Cycling on FR-4, Bis-Maleimide Triazine, and Cyanate Ester Printed Wiring Boards,” 7th Int’l. SAMPE Electronics Conf., pp. 446–457, June 20–23, 1994.
822. Bhagath, S. and M. Pecht, “Probing Connector Reliability,” Connector Specifier, pp. 32–34, June 1994.
823. Hu, J., Barker, D., Ghoshtagore, R. and M. Pecht, “Investigation of Thermomechanical Properties of Low Temperature Cofired Ceramic,” Transactions of the ASME, Vol. 116, No. 2, pp. 148–153, June 1994.
824. Condra, L., Kromholtz, G., Pecht, M., and E. Hakim, “Using Plastic-Encapsulated Microcircuits in High Reliability Applications,” Proc. 1994 Annual Reliability and Maintainability Symp., pp. 481–488, Jan. 1994.
825. Sandborn, P. and D. Herrell, Electronic Module Technology, Physical Architecture and Packaging of Microelectronic Systems, R. Hannemann, A. Kraus and M. Pecht editors, John Wiley, New York, NY, pp. 189–249, 1994.
826. Condra, L., O’Rear, S., Freedman, T., Flancia, L., Pecht, M. and D. Barker, “Comparison of Plastic and Hermetic Microcircuits under Temperature-Humidity Bias,” Proc. Annual Reliability and Maintainability Symp., 1994.
827. Bhagath, S. and M. Pecht, “Modeling the Effects of Mixed Flowing Gas Corrosion and Stress Relaxation on Contact Interface Resistance,” ASME Journal of Electronic Packaging, Vol. 115, No. 4, pp. 404–409, Dec. 1993.
828. Weil, L., Pecht, M. and E. Hakim, “Reliability Evaluation of Plastic Encapsulated Parts,” IEEE Transactions on Reliability, Vol. 42, No. 4, pp. 536–540, Dec. 1993.
829. Pecht, M., Agarwal, R. and D. Quearry, “Plastic Packaged Microcircuits: Quality, Reliability, and Cost Issues,” IEEE Transactions on Reliability, Vol. 42, No. 4, pp. 513–517, Dec. 1993.
830. Condra, L., Wenzel, G. and M. Pecht, “Reliability Evaluation of Simple Logic Microcircuits in Surface Mount Plastic Packages,” Proc. of the ASME Winter Annual Meeting, New Orleans, LA, Nov. 1993.
831. Condra, L., Wenzel, G. and M. Pecht, “Reliability Evaluation of Simple Logic Microcircuits in Surface Mount Plastic Packages,” EEP-Vol. 6, Electronic Packaging Reliability, pp. 85–100, Nov. 1993.
832. Lall, P., Pecht, M. and E. Hakim, “Derating Guidelines for Temperature-Tolerant Design of Microelectronics,” 6th Int’l. Conf. Quality in Electronic Components Failure Prevention, Detection and Analysis; 4th European Symp. on Reliability of Electron Devices, Failure Physics and Analysis, Bordeaux, France, Oct. 4–7, 1993.
833. Pecht, M. and P. Lall, “An Integrated Physics-of-Failure Approach to Reliability Assessment,” Proc. of the ASME Int’l. Electronics Packaging Conf., Binghamton, NY, Sept. 29–Oct. 2, 1993.
834. Li, M. and M.  Pecht, “Dynamic Investigation of Thermal and Sorptive Effects on Electronic Packages,” Proc. of the ASME Int’l. Electronics Packaging Conf., Sept. 1993.
835. Lall, P., Pecht, M. and E. Hakim, “Computer-Aided Reliability Simulation, Design and Assessment of MCMs: A Physics of Failure Approach,” 1993 Advanced Microelectronics Technology Qualification, Reliability, and Logistics Workshop, Denver, CO, Aug. 24–26, 1993.
836. Lall, P. and M. Pecht, “Physics of Failure Based Computer Tools for Design of Microelectronic Packages,” 3rd Int’l. Microelectronics and Systems ’93 Conf., Kuala Lumpur, Malaysia, Aug. 10–13, 1993.
837. Pecht, M., Cushing, M. and E. Hakim, “Design Approach to Reliable Microelectronic Packages,” Proc. 9th European Hybrid Microelectronics Conf., pp. 484-492, Nice, France, June 2–4, 1993.
838. Lall, P., Pecht, M. and E. Hakim, “Thermal Derating Guidelines for Temperature-tolerant Design of Micro Electronic Devices,” ESREF (Bordeaux, France), 1993.
839. Hu, J., Pecht, M. and A. Dasgupta, “Design of Reliable Die Attach,” Int’l. Journal Microcircuits and Electronic Packaging, Vol. 16, No. 1, pp. 1–21, 1st Qtr, 1993.
840. Pecht, M., She, J. and D. Barbe, “Evaluating Terminal Pair System Reliability,” IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, Vol. E76-A, No. 4, pp. 555–564, 1993.
841. M. Pecht, “Design for Qualification,” Proc. 1993 Annual Reliability and Maintainability Symo., pp. 1–4, Jan.  1993.
842. Pecht, M., Barker, D. and A. Dasgupta, “An Approach to the Development of Package Design Guidelines,” ISHM, pp. 28-45, Nov./Dec. 1992, also Pecht, M., Barker, D. and A. Dasgupta, “An Approach to the Development of Package Design Guidelines,” ISHM, Vol. 16, No. 3, pp. 217-240, 3rd Qtr 1993; extension of M. Pecht, “Advances in the Design and Assessment of Reliable Electronics Using Concurrent Engineering,” Proc. 47th Mechanical Failure Prevention Group, pp. 51–55, 1993.
843. Pecht, M. and E.  Hakim, “The Future of Military Standards - A Focus on Electronics,” IEEE Aerospace and Electronic Systems, Vol. 17, No. 7, pp. 16–19, 1993; update of Proc. IEEE NAECON’92, Vol. 2, pp. 795–799, 1992.
844. Pecht, M., Malhotra, A., Wolfowitz, D., Oren, M. and M. Cushing, “Transition of MIL-STD-785 from a Military to a Physics-of-failure based Com-military Document,” 9th Int’l. Conf. of the Israel Society for Quality Assurance, Jerusalem, Israel, Nov. 16–19, 1992.
845. Condra, L., O’Rear, S., Freedman, T., Flancia, L., Pecht, M. and D. Barker, “Comparison of Plastic and Hermetic Microcircuits Under Temperature Cycling and Temperature-Humidity-Bias,” IEEE Transactions on Components, Hybrids and Manufacturing Technology, Vol. CHMT-15, pp. 640–650, Oct. 1992.
846. Condra, L., Johnson, G., Pecht, M. and A. Christou, “Estimating the Vibration Fatigue Life of Quad Leaded Surface Mount Components,” IEEE Transactions on Components, Hybrids, and Manufacturing Technology, Vol. 15, No. 4, Aug. 1992.
847. Condra, L., Johnson, G., Pecht, M. and A. Christou, “Evaluation of Manufacturing Variables in the Reliability of Surface Mount Capacitors,” IEEE Transactions on Components, Hybrids and Manufacturing Technology, Vol. CHMT-15, pp. 542–552, Aug. 1992.
848. Fan, M., Christou, A. and M. Pecht, “Two-Dimensional Thermal Modeling of Power Monolithic Microwave Integrated Circuits,” IEEE Transactions on Electron Device, Vol. 39, No. 5, pp. 1075–1079, May 1992.  Systems Magazine, pp. 16-19, July 1992.
849. Bonadies, G. and M. Pecht, “A Computer Integrated Product Development Environment,” The Fabricator Magazine, April 1993; update of Society for Computer-Aided Engineering (SCAE) Magazine, July 1992; update of CE & CALCE ‘92, pp. 151–164, June 1–4, 1992.
850. Pecht, M. and P. Lall, “A Physics of Failure Approach to Burn-In,” ASME/JSME Joint Conf. on Electronic Packaging, Vol. 2, pp. 917–923, April 1992.
851. Arora, A., Pecht, M. and A. Dasgupta, “Design Guidelines for Leads of Microelectronic Packaging,” Proc. SMTCON, pp. 89-100, April 1992.
852. Shan, X., Agarwal, R.  Pecht, M. and J. Evans, “Effect of Humidity Cycling on Reliability of Overlaid High Density Interconnects,” 1992 IEEE Multi-chip Module Conf., pp. 106–109, March 1992.
853. She, J. and M. Pecht, “Reliability of k-out-of-n Standby System With Dormant Failures,” IEEE Transactions on Reliability, Vol. 41, No. 1, pp. 72–75, March 1992.
854. Pecht, M. and D. Weiss, “Education in Reliable Electronic Packaging,” Proc. 1992 Annual Reliability and Maintainability Symp., pp. 144–149, Jan 1992.
855. Agarwal, R., Pecht, M., Shan, X. and J. Evans, “Potential Failure Mechanism in Overlaid High Density Interconnects,” ISHM-IEPS Proc. 92, Int’l. Conf. Multichip Modules, pp. 361–367, 1992.
856. Bhandarkar, S., Dasgupta, A., Barker, D., Pecht, M. and W.  Engelmaier, “Influence of Selected Design Variables on Thermomechanical Stress Distributions in Plated-Through-Hole Structures,” ASME Journal of Electronic Packaging, Vol. 114, No. 1, pp. 8–13, 1992.
857. Shan, X., Pecht, M. and A. Christou, “Corrosion Modeling in Microelectronic Devices,” Int’l. Journal of Microcircuits and Electronic Packaging, Vol. 1, pp. 1–10, 1992.
858. Wolfovitz, D., Barker, D. and M. Pecht, “Role and Measurement of Trimming Shock on Component Leads,” 13th IEEE Int’l. Electronics Manufacturing Technology Symp., pp. 64–67, 1992.
859. Barker, D., Sharif, I., Dasgupta, A. and M. Pecht, “Effect of SMC Lead Dimensional Variabilities on Lead Compliance and Solder Joint Fatigue Life,” ASME Journal of Electronic Packaging, Vol. 114, pp. 177–184, 1992; update of Mechanics of Surface Mount Assemblies Sym., ASME/WAM, Atlanta, GA, Dec. 1–6, 1991.
860. Pourbabai, B. and M. Pecht, “Management of Design Activities in a Concurrent Engineering Environment,” Int’l. Journal of Production Research, Vol. 32, No. 4, pp. 821–832, 1994; update of CALS & CE ‘91, pp. 171–190, June 10–14, 1991.
861. Dasgupta, A., Oyan, C., Barker, D. and M. Pecht, “Solder Creep-Fatigue Analysis by an Energy-Partitioning Approach,” ASME Journal of Electronic Packaging, Vol. 114, pp. 152–160, 1992; Presented at Mechanics of Surface Mount Assemblies Sym., ASME/WAM, Atlanta, GA, Dec. 1–6, 1991.
862. Pecht, M., Watts, J. and S. Balakrishnan, “Placement Design for Producibility,” Journal of Electronics Manufacturing, Vol. 1, No. 2, pp. 61–76, 1992; update of Watts, J. and M. Pecht, “Placement for Producibility and Assembly: Information Requirements,” 9th IEEE Int’l. Manufacturing Technology Symp., pp. 340–349, Oct. 1–3, 1990.
863. Barker, D., Dasgupta, A. and M. Pecht, “PWB Solder Joint Life Calculations Under Thermal and Vibrational Loading,” Journal of the Institute Environmental Sciences, Vol. 35, No. 1, pp. 17–25, 1992; update of Proc. 1991 Annual Reliability and Maintainability Symp., pp. 451–459, Jan. 1991; extension of Hakim, J., Pecht, M. and D. Barker, “Design and Analyses of Electronic Assemblies Using CALCE Software Version 3.0,” Proc. 1991 Institute of Environment Science, pp. 36–40, May 6–10, 1991.
864. Dasgupta, A., Bhandarkar, S., Pecht, M. and D. Barker, “Effective Properties of Fiber Composites with Multiple Interphases,” Composites, Albany, NY, pp. 1044–1053, Oct.  6–9, 1991.
865. Pecht, M. and H. Haslach, “A Viscoelastic Constitutive Model for Constant Rate Loading at Different Relative Humidities,” Mechanics of Materials, Vol. 11, pp. 337–345, 1991; extension of Haslach, H., Pecht, M. and X. Wu, “Variable Humidity and Load Interaction in Tensile Creep of Paper,” 1991 Int’l. Paper Physics Conf., Kailua-Kona, Hawaii, Sept. 22–27, 1991; update of Haslach, H., Pecht, M. and X.  Wu, “A Viscoelastic Model for Variable Humidity Loading in Creep,” Proc. ASME Winter Annual Meeting, AMD - Vol. 112, MD - Vol. 23, pp. 1–7, 1990.
866. Dasgupta, A. and M. Pecht, “Material Failure Mechanisms and Damage Models,” IEEE Transactions on Reliability, Vol. 40, No. 5, pp. 531–536, Dec 1991.
867. Agarwal, A., Dasgupta, A., Pecht, M. and D. Barker, “Prediction of PWB/PCB Thermal Conductivity,” Int’l. Journal Hybrid Microelectronics, Vol. 14, No. 3, pp. 83–95, Sept. 1991.
868. Hu. J., Pecht, M. and A. Dasgupta, “A Probabilistic Approach for Prediction of Thermal Fatigue Life of Wire Bonding in Microelectronics,” ASME Journal of Electronic Packaging, Vol. 113, No. 3, pp. 275–285, Sept. 1991.
869. Condra, L. and M. Pecht, “Commercial Microcircuit Options in Military Avionics Systems Demand Reliability,” Defense Electronics, pp. 43–47, Aug. 1991.
870. Christou, A., Dasgupta, A., Pecht, M. and D. Barker, “Design Optimization of High Temperature Electronic Packaging,” Transactions of the High Temperature Electronics Conf., Albuquerque, NM, pp. 10–15, June 16–20, 1991.
871. Oyan, C., Dasgupta, A., Pecht, M. and D. Barker, “Role of Strain-Partitioning Analysis in Solder Life Prediction,” Int’l. Journal Hybrid Microelectronics, Vol. 14, No. 2, pp. 37–47, June 1991.
872. Barker, D., Pecht, M., Dasgupta, A. and S. Bhandarkar, “Transient Thermal Stress Analysis of Plated Through Holes Subjected to Wave Soldering,” ASME Journal of Electronic Packaging, Vol. 113, No. 2, pp. 149–155, June 1991; update of Proc. ASME Winter Annual Meeting, 90-WA/EEP-4, Oct. 25–29, 1990.
873. Sharif, I., Barker, D., Dasgupta, A. and M. Pecht, “Fatigue Analysis of a Planarpak Surface Mount Component,” ASME Journal of Electronic Packaging, Vol. 113, No. 2, pp. 194–199, June 1991; update of Proc. ASME Winter Annual Meeting, 90-WA / EEP-4, Oct. 25–29, 1990.
874. Biegel, P. and M. Pecht, “Design Trade-Offs,” Journal Concurrent Engineering, Vol. 1, No. 3, pp. 29–40, May/June 1991.
875. Lamb, C., Braunberg, G. and M. Pecht, “True Temperature Measurement of Complex Devices Using Infrared Thermography,” Printed Circuit Design, Vol. 8, No. 3, pp. 20–24, March 1991.
876. Pecht, M., Barker, D., Christou, A. and A. Dasgupta, “Reliability and Maintainability Issues in Electronics Design,” NEPCON-WEST ‘91, Vol. 2, pp. 943-948, Feb. 24–26, 1991.
877. Leonard, C. and M. Pecht, “Improved Techniques For Cost Effective Electronics,” Proc. 1991 Annual Reliability and Maintainability Symp., pp. 174–182, Jan. 1991; update of *“How Failure Prediction Methodology Affects Electronic Equipment Design,” Quality and Reliability Engineering Int’l., Vol. 6, No. 4, pp. 243–250, Oct. 1990; presented at Power Conversion and Intelligent Motion Conf., Long Beach, CA, Oct. 16–19, 1989, update of “Failure Prediction Methodology Calculations Can Mislead: Use Them Wisely, Not Blindly,” Proc. 89 IEEE NAECON Conf., Vol. 3, pp. 1887–1892, May 22-24, 1989.
878. Hu, J. and M. Pecht, “Temperature Dependence of the Mechanical Properties of GaAs Wafers,” ASME Journal of Electronic Packaging, Vol. 113, No. 4, pp. 331–336, 1991; extension of Hu, J., Pecht, M. and D. Barker, “Experimental Evaluation of Mechanical Behavior of GaAs Wafer Material,” Proc. of the 1991 Spring Meeting of the Material Research Society.
879. Pecht, M., She, J., Hu, J. and K. Richter, “Minimizing Life Cycle Costs,” Journal of Concurrent Engineering, Vol. 1, No. 4, pp. 11–24, 1991; update “Concurrent Design for Scheduled Maintenance,” K. Richter, M. Pecht, Proc. 6th Annual RAMCAD Conf., pp. 152–166, April 26, 1990.
880. Wu, X., Hu, J. and M. Pecht, “Fuzzy Regression Analysis For Fatigue Crack Growth,” Proc. ISUMA ‘90 Symp. on Uncertainty Modeling and Analysis, pp. 437–440, Dec. 3-5, 1990.
881. Pecht, M., Dasgupta, A., Barker, D. and C. Leonard, “The Reliability Physics Approach to Failure Prediction Modeling,” Quality and Reliability Engineering Int’l., Vol. 6, No. 4, pp. 267–274, Oct. 1990; update of “Reliability Prediction Methodologies,” Proc. Int’l. Sym. Reliability and Maintainability-1990-Tokyo, pp. 25-30, 1990*; update of “Practical Approaches to Microelectronic Package Reliability Prediction Modeling,” Lall, P., Barker, D., Dasgupta, A., Pecht, M., and S. Whelan, Proc. Int’l. Society Hybrid Microelectronics, pp. 126–130, Baltimore, MD, Oct. 17–19 1989; update of “Reliability Prediction Methodologies, Pecht,” M., Barker, D., Dasgupta, A., and C. Leonard, Proc. Concurrent Engineering of Mechanical Systems, Vol. 1, pp. 295–302, Oct. 1989.
882. Tan, C., and M. Pecht, “A Zonal Decomposition Methodology for Detailed Temperature Field Evaluation,” ASME Journal of Electronic Packaging, Vol. 112, No. 3, pp. 260–266, Sept. 1990.
883. Osterman, M. and M. Pecht, “Placement for Reliability and Routability of Convectively Cooled PWBs,” IEEE Transactions on CAD Integrated Circuits and Systems, Vol. 9, No. 7, pp. 734–743, July 1990; update of “Component Placement on PWB’s for Routability and Reliability,” Proc. Mechanical Failure Prevention Conf., National Bureau of Standards, Sept. 15–17, 1987.
884. Dasgupta, A., Bhandarkar, S., Barker D. and M. Pecht, “Thermoelastic Properties of Woven-Fabric Composites Using Homogenization Techniques,” Proc. 5th American Society for Composites, June 11–14, 1990.
885. M. Pecht, “A Model for Moisture Induced Corrosion Failures in Microelectronic Packages,” IEEE Transactions on Components, Hybrids and Manufacturing Technology, Vol. CHMT-13, pp. 383–389, June 1990.
886. Pecht, M., and W. Ko, “A Corrosion Rate Equation for Microelectronic Die Metallization,” Int’l. Journal for Hybrid Microelectronics, Vol. 13, No. 2, pp. 41–52, June 1990.
887. Tsujioka, N., M. Pecht, and D. Jennings, “Generative Mechanisms and Preventive Methods for Micro-Defects in PCB,” Proc. of the Printed Circuit World Convention, Aylesbury, UK, pp. 3–12, 1990 (Hazell Books, 1990, B2).
888. Vodzak, J., Barker, D., Dasgupta, A. and M. Pecht, “Combined Vibrational and Thermal Solder Joint Fatigue - A Generalized Strain Versus Life Approach,” ASME Journal of Electronic Packaging, Vol. 112, No. 2, pp. 129–134, June 1990; presented at the ASME Winter Annual Meeting, 89-WA/EEP-35, San Francisco Dec. 1989.
889. Dasgupta, A., D. Barker and M.  Pecht, “Reliability Prediction of Electronic Packages,” Journal of Institute of Environmental Sciences, Vol. 33, No. 3, pp. 36–45, May/June 1990 (won best journal paper of the year); update of Proc. 36th Reliability and Maintainability Symp., pp. 323–330, Jan. 23–25, 1990.
890. Whelan, S., M. Pecht, and A. Dasgupta, “Operational Temperature Cycle Values for Application Environment Categories,” Int’l. Journal Hybrid Microelectronics, Vol. 13 No. 1, pp. 6–11, March 1990.
891. Deshmukh, G. and M. Pecht, “A Modified Powell’s Method for Six-Degrees-of-Freedom Platform Kinematics,” Journal of Computers and Structures, Vol. 34, No. 3, pp. 485–492, March 1990.
892. Hevner, A., Basu, A., Pecht, M., and B. Pourbabai, “A Methodology for Concurrent Product Development with a Focus on Electronic Products,” Proc. of the Second National Sym. on Concurrent Engineering, Morgantown, West Virginia, Feb. 7–9, 1990.
893. Pecht, M., Lall, P. and S. Whelan, “Temperature Dependence of Micro Electronic Device Failures,” Quality and Reliability Engineering Intl, Vol. 6, pp. 275–284, 1990.
894. Pecht, M., Dasgupta D., and P. Lall, “A Failure Prediction Model for Wire Bonds,” Proc. Int’l. Society Hybrid Microelectronics, pp. 607–613, Baltimore, MD, Oct. 17–19, 1989.
895. Genberg, S. and M. Pecht, “Acceleration Sensors for Solid State Electronic Safety and Arming Devices,” Int’l. Journal Hybrid Microelectronics, Vol. 12, No. 3, pp. 126–138, Sept. 1989.
896. Wong, Y. and M. Pecht, “Approximating the Steiner Tree in the Placement Process,” ASME Journal of Electronic Packaging, Vol. 111, No. 3, pp. 228–235, Sept. 1989.
897. M. Pecht, “On A Life Cycle Engineering Approach to Concurrent Design,” 28th Annual Technical Symp. of the ACM, NIST, pp. 35–41, Aug. 24, 1989.
898. Tan, C., Pecht, M. and Z. Dun, “Pressure Gradient Method for Solving Incompressible NavierStokes Equations with Curvilinear Coordinator System,” Mathematical Computational Modeling, Vol. 14, pp. 732–736, 1990, update of 7th Int’l. Conf. on Math and Computer Modeling, Chicago, Aug. 2–5, 1989.
899. Haslach H. and M. Pecht, “Thermodynamic Modeling LoadSorption Relations in Cellulosic Materials,” ASME Mechanics of Cellulosic and Polymeric Materials, AMD-Vol. 99, MDVol. 13, pp. 15–22, July 1989; extension of Haslach, H., Khan, S., Mohammed, S. and M. Pecht, “Behavior of Virginia Fiber Paper as Influenced by Relative Humidity,” ASME Symp. on Mechanics of Cellulosic and Polymeric Materials, AMDVol. 99, MD-Vol. 13, pp. 162–172, July 9–12, 1989.
900. Pecht, M. and M. Osterman, “The Effect of a Varying Moisture Content on the Creep of Hydrophilic Polymers,” ASME AMDVol. 82, Book No. H00375, pp. 84–89, June 1989.
901. Dancer, D. and M. Pecht, “Component-Placement Optimization for Convectively Cooled Electronics,” IEEE Transactions on Reliability, Vol. 38, No. 2, pp. 199–205, June 1989.
902. Osterman, M. and M. Pecht, “Component Placement for Reliability on Conductively Cooled Printed Wiring Boards,” ASME Journal of Electronic Packaging, Vol. 111, No. 2, pp. 149–156, June 1989.
903. Gore, J., DiMarzo, M., Resch, C. and M. Pecht, “Verification of Thermal Analysis of PWBs for RAMCAD,” Proc. 1989 Annual Reliability and Maintainability Symp., pp. 474–478, Jan. 23–26, 1989.
904. M. Pecht, “On a Life Cycle Engineering Approach to Concurrent Design,” 28th Annual Technical Symp. of the ACM, NIST, pp. 35–41, 1989.
905. Pecht, M. and R. Cogan, “Intelligent Derating for Reliability,” Printed Circuit Design, Vol. 6, No., pp. 48–55, 1989; presented at Third IEEE Int’l. Symp. Intelligent Control, Aug. 24–26, 1988.
906. Pecht, M. and W. Kang, “A Critique of MILHDBK 217E Reliability Prediction Methods,” IEEE Transactions on Reliability, Vol. 37, No. 5, pp. 453–457, Dec. 1988.
907. Pecht, M., Azarm, S. and S. Praharaj, “Optimized Redundancy Allocation for Electronic Equipment,” Journal of Engineering Optimization, Vol. 14, pp. 101–114, Dec. 1988; update of “A Methodology for Component Allocation on a PWB Workspace,” Proc. of 34th  Annual Institute Environmental Sciences Conf., May 1988.
908. Pecht, M., Barker, D., Lynch, J. and A. Leone, “An Expert System for Electronics Design and Analysis,” Proc. of 1988 ASME Computers in Mechanical Engineering Conf., San Francisco, Aug. 1–4, 1988. Update of Naft, J. and M. Pecht, “A RAMCAD/ULCE Workstation Shell Structure,” 1987 Annual Reliability and Maintainability Sym., pp. 91–96, Jan. 27–29, 1987; extension of Pecht, M., Naft, J. and M. Palmer, “Workstation Requirements For Printed Wiring Board Design,” IEEE Workstation Technology and Systems Conf., Vol. 1, pp. 63–68, 1986.
909. Pecht, M., and C. Resch, “Temperature Measurement of Conductively Cooled Printed Wiring Boards Using Infrared Techniques,” Proc. of 19th Annual Modeling and Simulation Conf., May 5–6, 1988.
910. Braunberg, G., Naft, J., Madison, L. and M. Pecht, “Computer Aided Life Cycle Engineering,” Proc. of 1988 Annual Reliability and Maintainability Sym., pp. 26–30, Jan. 26–28, 1988.
911. Osterman, M. and M. Pecht, “Placement of Integrated Circuits for Reliability on Conductively Cooled Printed Wiring Boards,” ASME Winter Annual Meeting, pp. 1–9, Dec. 13–18, 1987.
912. M. Pecht, “What Research is Underway to Advance R & M Automation for Electronics,” IEEE Transactions on Reliability, Vol. R36, No. 5, pp. 516–520, Dec. 1987.
913. M. Pecht, “CALCE/RAMCAD for Electronics,” IEEE Transactions on Reliability, Vol. R-36, No. 5, pp. 501–505, Dec. 1987; extension of Clark, G., Pecht, M. and B.T. Sawyer, “An Expert System For Electronics Design,” Proc. IEEE 3rd Annual Expert Systems in Government Conf., Oct. 19–23, 1987; update of Pecht, M., Sawyer, B. and J. Naft, “A Mechanical Engineering Perspective on PWB Design for Reliability,” Proc. Mechanical Failure Prevention Conf., National Bureau of Standards, Sept. 15–17, 1987; extension of  M. Pecht, “Computeraided Design for PCB Reliability,” Proc. Institute of Environmental Sciences 33rd Annual Conf., pp. 141–146, May 4–8, 1987; extension of Pecht, M. and B. Sawyer, “PCB Design for Thermal Reliability,” Printed Circuit Design Journal, Vol. 4, No. 5, pp. 12, 1987*; update of “Thermal Reliability Management in PCB Design,” Pecht, M. Palmer, M. and J. Naft. Proc. 1987 Annual Reliability and Maintainability Sym., p. 312, Jan. 27–29, 1987; update of Pecht, M., Palmer, M. and J. Horan, “Computeraided Heat Sink Design for Printed Wiring Boards,” IEEE Int’l. Conf. on Computer Aided Design, ICCAD-85, Vol. 1, pp. 253–256, 1985.
914. Pan, Y., Radermacher, R. and M. Pecht, “CAD for Thermodynamic Cycles,” ASME Computers in Mechanical Engineering Journal, Vol. 6, No. 2, pp. 38–45, 1987.
915. Azarm, S. and M. Pecht, “Knowledge Gathering for Heuristic Programming in Design Optimization,” Journal of Engineering Optimization, Vol. 11, pp. 317–326, 1987.
916. Azarm, S. and M. Pecht, “A Coupled AlgorithmicHeuristic Approach for Design Optimization,” IEEE Transactions on Systems, Man and Cybernetics, Vol. 17, No. 2, pp. 289–293, 1987.
917. Pecht, M., Palmer, M., Schenke, W. and R. Porter, “An Investigation Into PWB Component Tradeoffs,” IEEE Transactions on Reliability, Vol. R36, No. 5, pp. 524–527, 1987.
918. Minis, I., Pandelidis, I. and M. Pecht, “Simulation of the Chatter Phenomenon in Metal Cutting,” IASTED: Computer Aided Design and Applications, Vancouver, Canada, pp. 100-103, June 5–7, 1986.
919. Pecht, M., Price, T. and I. Pandelidis, “The Design of a Generic Gimbel,” IASTED: Computer Aided Design and Applications, Vancouver, Canada, pp. 110–113, June 5–7, 1986.
920. Pecht, M. and M. Osterman, “Design and Simulation of a Tactile Sensing System,” Proc. IEEE Modeling and Simulation Conf., Vol. 17, No. 2, pp. 727–729, April 22–25, 1986.
921. Azarm, S. and M. Pecht, “Approach for Building a Rulebased System for Design Optimization,” Computer Aided Optimal Design, Vol. 3, pp. 363–383, 1986; extension of Azarm, S. and M. Pecht, “Application of a Rulebased System in Nonlinear Programming,” Joint National Meetings of the Institute of Management Science and Operation Research Society of America, CA, April 1416, 1986; extension of Horan, J., Palmer, M., Pecht, M. and Y. Wong, “Intelligent Design of Printed Wiring Boards,” Association for Computing Machinery, Vol. 1, pp. 123–128, 1985; extension of Azarm, S. and M. Pecht, “Towards Intelligent Design Optimization,” IEEE Artificial Intelligence in Engineering Conf., Oct. 21–23, 1985.
922. Pandelidis, I., Pecht, M. and I. Minis, “Active Compliance of a Robot Manipulator,” IASTED Robotics and Automation, Vol. 1, pp. 127–129, 1986.
923. Palmer, M., Pecht, M. and J. Horan, “Adapting the Spreadsheet to Engineering Problems,” ASME Computers in Mechanical Engineering Journal, Vol. 4, No. 2, pp. 49–56, 1985; update of “Towards an Engineering Spreadsheet,” ASME Computers in Mechanical Engineering, Vol. 3, pp. 143-150, 1985.
924. M. Pecht, “Creep of RegainRheologically Simple Hydrophilic Polymers,” Journal of Strain Analysis, Vol. 20, No. 3, pp. 179–181, 1985.
925. Pecht, M. and M. Johnson, Jr., “The Strain Response of Paper Under Various Constant Regain States,” TAPPI Journal (Paper Physics), Vol. 68, No. 1, pp. 90–93, 1985.
926. M. Pecht, “Aging of Thermoplastics,” Mechanics Research Communications, Vol. 12, No. 1, pp. 11–18, 1985.
927. Pecht, M., Johnson, Jr., M. and R. Rowlands, “Constitutive Equations for the Creep of Paper,” TAPPI Journal (Paper Physics), Vol. 67, No. 5, pp. 106–109, 1984; extension of Pecht, M., and M. Johnson, “The Mechanical Response of Cellulosic Paper Sheets Under Various Constant Regain States,” Southeastern Conf. on Theoretical and Applied Mechanics, SECTAM XII, Vol. 1, pp. 548–553, 1984.

Monographs, Reports, and Extension Publications

1. Morillo, C., S. Menon, A. Pearl, P. Chauhan, M. Osterman, M. Pecht, and J. Hay, “In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead-Free SAC 105 Solder,” Agilent Technologies, Application Note, Mar. 2013.
2. Pecht, M., R. Kaczmarek, X. Song, D. Hazelwood, R. Kavetsky, and D. Anand, “Rare Earth Materials: Insights and Concerns,” Circuitnet, white paper, Oct 2012.
3. Kostoff RN, Briggs, MB Rushenberg, RL, Bowles, CA, Pecht, M., “The Structure and Infrastructure of Chinese Science and Technology,” DTIC Technical Report ADA443315, Defense Technical Information Center, Ft. Belvoir, VA, 2006.
4. Editorials in IEEE Transactions on Components and Packaging Technologies: “Open Forum: Editorial,” 4 per year, [1996 - 2010].
5. “Electronics Manufacturing in Hong Kong and China,” Boulton W., Pecht M., Hodges D., E. Vardaman, Int’l Technology Research Institute, Baltimore, MD, Sept. 2000.
6. IEC-Q-AWG Guide Development: Guide for Component Management Plans, Guide for Using Semiconductor Devices Outside Manufacturers’ Specified Temperature Ranges, Guide for Reliability Assessment of Electronic Equipment, 2000.
7. Benchmarking Nortel’s Processes, PACE’s Qualification Methodology Group, Sept. 1998.
8. Boulton, W.R., Pecht, M., Tucker, W. and S. Wennberg, Singaporean and Malaysian Electronics Industries, Chapter 4, WTEC Panel Report on Electronic Manufacturing in the Pacific Rim, Loyola College, MD, pp. 49-64, May 1997.
9. Xerox Project: Distributed Filament Contacts, Xie, J., Pecht, M., Swift, J. and S. Wallace, Nov. 1996-May 1997.
10. The Aries Project for Rule-Based-Design Knowledge Acquisition, Institute for Defense Analyses, May 1995.
11. Special Technology Area Review on Electronics Packaging, Report of Dept. of Defense, Advisory Group on Electron Devices, contributor, July 1993.
12. “First Principles of Concurrent Engineering: A Competitive Strategy for Product Development,” National Security Industrial Association, 1 of 12 contributors, May 12, 1992.
13. “Assessment and Qualification of Advanced Packaging and Interconnects,” NASA, April 1992.
14. “Design and Assessment Issues for Modern Cost Effective Military Electronics,” Pecht, M., Shan, X., Lall, P. and R. Agarwal, David Taylor Laboratories, Nov 1991.
15. “Reliability Analysis/Assessment of Advanced Technologies,” Rome Air Development Center, Air Force Systems Command, RADCTR9072, May 1990.
16. Computer Aided Life Cycle Engineering at the University of Maryland, Pecht, M. and D. Barker, in The CALS Report, edited by William Beazley, Pasha Publications, Rosslyn, VA, 1989; update of R&M in the Context of Interdisciplinary Research, Pecht, M., Dasgupta, A. and D. Barker, Proc. Concurrent Engineering of Mechanical Systems, Vol. 1, pp. 353368, Oct. 1989; update of CALCE Research Opportunities at the University of Maryland, Pecht, M., Barker, D. and D. Weiss, Proc. 1989 IEEE Int. Electronic Manufacturing Sym., pp. 182185, San Francisco, Sept. 2527, 1989*; update of Computer Aided Life Cycle Engineering at the University of Maryland, Pecht, M. and D. Barker, Proc. 5th Annual RAM/CAD Technical Interchange Meeting, San Diego, CA, pp.198212, April 1112 1989*; update of CALCE Center at the University of Maryland Helps Electronics Design Industries, Pecht, M. and D. Barker, CALS Report, Vol. 2 (8), pp. 1617, Aug. 1989.
17.  “Decision Support Requirements in a Unified Life Cycle Engineering (ULCE) Environment,” Vol II: Conceptual Approaches to Optimization, Vol III: Applications of Decision Support to Design, IDA Paper P2064, May 1988.
18. Free Convection Analysis for PCB’s, Pezza, A., Pecht, M. and M. Palmer, Westinghouse Defense Electronics Center, DSC13673, Aug. 1986.
19. “The Effects of Component Placement on the Thermal Reliability of Conductively Cooled Printed Circuit Boards,” Pecht, M. and M. Palmer, Westinghouse Defense Electronics Center, DSC13670, Apr. 1986.
20. CAE Program for Printed Wiring Board Thermal and Reliability Analysis, Pecht, M. and M. Palmer, Westinghouse Defense Electronics Center, DSC13650, Feb. 1986.
21. Sawyer, T. and M. Pecht, A Material Selection Program, BYTE: The Small Systems Journal, Vol. 11 (7), . 235-248, 1986; A Desktop Aid For Materials Selection, M. Pecht, Machine Design, pp. 164, Apr. 1987; update of MSP: A Material Selection Program, Pecht, M., Sawyer, T., Dieter, G. and Y. Pan, Proc. ASEE Computer Aided Engineering, Vol. 2, pp. 635-638, June 1985.
22.  “A Thermal Analysis Interface to RacalRedac,” Pecht, M., Palmer, M. and J. Horan, Westinghouse Defense Electronics Center, DSC-13467, Feb. 1985.
23. “Mechanical Response of Thermoplastics to Environmental Aging,” II, Ramis, A., Sutton, R., Tenny, M. and M. Pecht, “Mechanical Response of Thermoplastics to Environmental Aging,” I, Berringer, B., Cranston, J., LaValle, T., McGrath, P. and M. Pecht, “Experimental Creep Studies of the Effects of Aging on Thermoplastic AF1006,” Gordon, L., Mary, B., Tyber, M., Wentzel, A. and M. Pecht, “A Study of the Effects of Environmental Conditioning of Isoplast 101 and Thermocomp GF1006,” Bitting, R., Colle, P., Everhart, D., Naragfhi, M., Neshati, A., Simpson, K. and M. Pecht, NSWC Report, (Sections of NSWC TR 8516) Naval Surface Weapons Center, White Oak, MD, Dec. 1983.